DEVICE AND METHOD FOR INSPECTING PLASMA DISPLAY PANEL REAR PLATE

    公开(公告)号:JP2001250480A

    公开(公告)日:2001-09-14

    申请号:JP2000060680

    申请日:2000-03-06

    Abstract: PROBLEM TO BE SOLVED: To provide an inspection device and its method for the fluor formed on a rear plate of a plasma display panel minimizing excessive inspections and/or overlooked inspections and being able to properly specify the cause of a defect. SOLUTION: The inspection device for the rear plate of a plasma display panel is intended to inspect the RGB (red/green/blue) fluors formed on the rear plate of a plasma display panel and comprises photographing means for review equipped with ultraviolet ray radiation means and those for automatic inspection. The inspection method for the rear part of the plasma display panel specifies that the defect detected by the photographing means for automatic inspection using the above inspection apparatus is visually decided as to whether it is good or bad using the photographing means for review.

    INSPECTING DEVICE FOR PLASMA DISPLAY PANEL, MANUFACTURE OF PLASMA DISPLAY PANEL REAR PLATE, AND PLASMA DISPLAY PANEL

    公开(公告)号:JP2001015030A

    公开(公告)日:2001-01-19

    申请号:JP18596999

    申请日:1999-06-30

    Abstract: PROBLEM TO BE SOLVED: To provide a device for accurately detecting color irregularity by radiating ultraviolet to an RGB phosphor layer, arranging an image pickup means so that an angle between the image pickup direction and a rear plate is in a specific range, detecting light emission from the RGB phosphor layer, outputting a video signal, comparing the video signal with a predetermined reference value, and determining the quality of a coated state of the RGB phosphor layer. SOLUTION: An angle between the image pickup direction and a rear plate 1 is preferably in a range of 5-45 degrees. Image pickup devices 6a-6c decompose a certain range on a plasma display panel rear plate 1 into picture elements, luminance for each picture element is measured, converted to a video signal, and transmitted to an image processing device 8. Light receiving elements are one-dimensionally arranged and stored in the image pickup devices 6a-6c, and one-dimensionally output video along a stripe direction of an RGB phosphor. As the image pickup devices 6a-6c, color line sensor cameras are used. The pickup devices 6a and 6b inspect color irregularity and detect light emission from a side surface of the phosphor layer.

    INSPECTION DEVICE AND MANUFACTURING METHOD FOR PLASMA DISPLAY PANEL

    公开(公告)号:JP2000304651A

    公开(公告)日:2000-11-02

    申请号:JP11782999

    申请日:1999-04-26

    Abstract: PROBLEM TO BE SOLVED: To reduce the generation of ozone by detecting the emission of a fluorescent substance for every coating position with a photo detector that is arranged one- dimensionally and comparing an image signal to be outputted with a specific reference value. SOLUTION: When a carrying device 3 carries a rear-surface plate 1 to an image pickup position, it gives a rear-surface plate approach signal to a control device 10. The control device 10 gives an image read start signal to an image-processing device 8, and the image-processing device 8 starts reading an image signal that is outputted from an image pickup device 6. An RGB signal amplification device 9 amplifies each RGB signal with a magnification being determined for each type for an image signal being inputted from the image pickup device 6 and outputs the signal to be image- processing device 8. The image-processing device 8 stores an image signal and detects a defect that is generated in the rear-surface plate 1 by image processing, thus installing an ultraviolet ray application means close to the rear-surface plate, reducing the intensity of ultraviolet rays, and maintaining a specific inspection performance. Also, the need for an ozone treatment facility is eliminated to reduce the cost.

    METHOD FOR MEASURING FILM THICKNESS

    公开(公告)号:JPH0771923A

    公开(公告)日:1995-03-17

    申请号:JP19707894

    申请日:1994-08-22

    Abstract: PURPOSE:To precisely measure the thickness of a thin film even when a subject to be measured has a locally fine unevenness in thickness. CONSTITUTION:Parallel white lights are made incident on a subject 6 to be measured at a fixed incident angle, the reflected light or transmitted light is guided to a spectroscope 14 to detect the wavelength or wave number giving the peak of bright part or dark part by spectral intensity, a normal part is extracted on the basis of the wavelength or the regularity of wave number or peak value, and the film thickness of the subject 6 is measured on the basis of the wavelength or wave number belonging to the normal part.

    METHOD AND DEVICE FOR CLIP CHAIN MONITORING OF TENTER

    公开(公告)号:JPH06211396A

    公开(公告)日:1994-08-02

    申请号:JP370193

    申请日:1993-01-13

    Abstract: PURPOSE:To improve efficiency of full production by detecting abnormality of a conveyed sheet, fixing a clip of causing generating the abnormality from a data stored after the time of generating the abnormality, so that a break of a film can be prevented and maintained to enable a time to shorten for repairing the clip. CONSTITUTION:In a computer 42, when started measurement in periodic measurement, a signal of a left side top clip sensor 20 is supervised while fetched through art AD converter 41, and the top clip is detected by the top clip sensor 20 to write a counter value of a counter 44 in a volatile memory 45. Also the right side is similarly performed. After fetching a data of one round of right/left clip chains 17, 17, the data is again transmitted and stored in a nonvolatile memory 46. By this stored data, a phase shift of the right/left clip chains 17, 17, length of a period and extension/contraction of individual clip interval can be known. Further, a signal also from break sensors 27, 28 is input.

    METHOD AND DEVICE FOR DETECTING PERIODIC DEFECT

    公开(公告)号:JPH10132536A

    公开(公告)日:1998-05-22

    申请号:JP19056697

    申请日:1997-07-01

    Abstract: PROBLEM TO BE SOLVED: To precisely judge a period even if a dispersion of defect position or detection miss is caused by a specified algorithm for performing a calculation by use of the data of the scanning directional MD position and lateral TD position of a detected defect and providing a basic period to determine the multiple. SOLUTION: In a main computer 41, a detected defect is sorted in TD position, and its defect number is stored in a two-dimensional buffer. The continued parts of TD are taken out and grouped to determine a typical TD position. The difference in MD position of adjacent defects of one group is calculated, and the same differential values are collected to one. Those having differential values having a small integral multiple are collected as basic period, and those of a large value are collected as integral multiple period. Low basic periods such as half period in MD space, if present, are collected. It is judged whether the individual defect is the defect corresponding to the basic period or not, and the number within the period defect is calculated. Further, when defect groups are present in a plurality of TD positions, they are successively taken out by one group, and this operation is repeated. The judgment result by the above procedure is outputted to a book.

    MANUFACTURING METHOD AND MANUFACTURING DEVICE FOR WEB

    公开(公告)号:JPH0812144A

    公开(公告)日:1996-01-16

    申请号:JP14462294

    申请日:1994-06-27

    Abstract: PURPOSE:To prevent generation of undesired forward feedback in control, and enable smooth control with high accuracy and high follow-up performance by manufacturing a web while controlling a tenter clip position according to an absolute position of the web edge and tenter clips when the tenter clip position is controlled. CONSTITUTION:In a device to manufacture a film while gripping the edge of a film 11 by tenter clips 1 (1a, 1b,...), a pair of left and right cell page guiders 15 (15a and 15b) are arranged so as to be rotatable and so that an interval of a tenter inlet part 8a can be adjusted. Edge relative position sensors 17a and 17b are arranged in a position just before the film 11 is gripped by the tenter clips 1, and edge absolute position sensors 18a and 18b are arranged in a more upstream position than an edge gripping point of the tenter clips 1, respectively. A web width directional position of the tenter clips 1 at the edge gripping point is controlled so that an edge gripping quantity by operation becomes equal to a preset gripping quantity.

    OPTICAL INTERFERENCE FILM THICKNESS MEASURING APPARATUS

    公开(公告)号:JPH049704A

    公开(公告)日:1992-01-14

    申请号:JP11375390

    申请日:1990-04-27

    Abstract: PURPOSE:To improve the positional resolving power and to measure the film thickness with high accuracy by arranging an end face and the other end face of a photoconductive member in tight contact with a projecting surface of an image intensifier and a plane of incidence of a photoelectric converting element, respectively. CONSTITUTION:A light projecting from a white light source 1 passes through an entrance window 8 opened at a light condenser 7 to an object 6 to be measured via a polarizing plate 5 or the like. The condenser 7 and entrance window 8 work as a shielding body and an aperture, respectively. The condenser 7 is comprised of a supporting body 9 and an optical fiber 10. A light image passing through an image intensifier 16 and a photoconductive member 17 via a spectroscope 14 etc. at the other end face of the fiber 10 is input to a photodetecting element 18 and detected as the intensity of the light for every wavelength. A data processor 19 takes the intensity of the light for every wavelength, thereby obtaining the wavelength of a bright part or a dark part resulting from the interference phenomenon and operating the film thickness of the object 6 from a predetermined formula. If one end face of the member 17 and the other end face thereof are held in tight contact with a projecting surface of the intensifier 16 and a plane of incidence of the element 18 respectively, the intensity ratio of the spectroscopic bright and dark parts can be made larger.

    INSPECTING DEVICE AND MANUFACTURING METHOD FOR PLASMA DISPLAY PANEL REAR PLATE

    公开(公告)号:JP2001250108A

    公开(公告)日:2001-09-14

    申请号:JP2000060681

    申请日:2000-03-06

    Abstract: PROBLEM TO BE SOLVED: To provide an inspecting device and a manufacturing method for a plasma display panel rear plate which can perform image processing by selecting and switching some of plural video signals, reduce the number of expensive image processors and the memory capacity in the image processors, lower the device cost, facilitate replacing operation in maintenance by decreasing the wiring quantity of a movable part, and perform inspection with high precision. SOLUTION: This is a device which inspects a fluorescent body on the plasma display panel rear plate and has an ultraviolet-ray irradiating means which irradiates the fluorescent body with ultraviolet rays, one or more color image pickup means which have photodetecting elements linearly arrayed, a video signal switching means which selects a specific video signal out of video signals outputted from the image pickup means, and a processing means which calculates the video signal outputted from the video signal switching means by the pixels; and the processing means compares the video signal with a specific reference value and inspects the plasma display panel rear plate according to the difference from the reference value.

    DEVICE AND METHOD OF EXAMINING PLASMA DISPLAY PANEL BACK PLATE, AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:JP2001216900A

    公开(公告)日:2001-08-10

    申请号:JP2000026274

    申请日:2000-02-03

    Abstract: PROBLEM TO BE SOLVED: To provide a device and a method of inspecting a plasma display panel back plate, and method of manufacturing the same capable of inhibiting the impairing of the accuracy on examination by the temperature rise of an ultraviolet-ray irradiating means, and reducing the inspection cost. SOLUTION: The device and method for inspecting the mounting condition of a RGB phosphor formed on a plasma display panel back plate, and the manufacturing method using the device, comprises an ultraviolet-ray irradiating means for irradiating the ultraviolet rays to a predetermined coating position of the RGB phosphor, an ultraviolet ray intensity measuring means for measuring the intensity of the ultraviolet rays irradiated by the ultraviolet ray irradiating means, and an image pick-up means for detecting the light generation from the coating position of the RGB phosphor and outputting an image pick-up signal, and further comprises a means for correcting the image pick-up signal, obtained from the image pick-up means on the basis of a result of the measurement of the intensity of the ultraviolet rays by the ultraviolet ray intensity measuring means.

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