Abstract:
PROBLEM TO BE SOLVED: To provide an optical characteristic measurement instrument suitable for measurement of a surface light source or the like.SOLUTION: The optical characteristic measurement instrument includes a hemispherical part having a reflecting surface on an inner wall thereof and a plane part which is arranged so as to close an opening of the hemispherical part and has a reflecting surface on the inner wall side of the hemispherical part. The plane part includes a first window for arranging a light source in a range including a substantive curvature center of the hemispherical part. At least one of the hemispherical part and the plane part includes a plurality of second windows which are arranged with prescribed regularity to extract light from the inside of the hemispherical part.
Abstract:
A system for calibrating a sensor in a vehicle, such as a space capsule or another space borne apparatus, uses an expandable integrating sphere. A sensor in the vehicle measures the energy from an electromagnetic energy source within the integrating sphere through a calibration window. The expandable fluid impermeable integrating sphere expands when filled with a fluid, such that when filled with the fluid, its interior is viewable through the calibration window. The system includes a source of fluid to fill the integrating sphere and a fluid regulator coupled to the vehicle to determine when to supply the fluid to the integrating sphere to maintain an appropriate gas pressure level with the integrating sphere.
Abstract:
PURPOSE: An integrating-sphere photometer and measuring method of the same are provided to effectively correct errors due to a self-screening effect and self-absorption when measuring the total luminous flux of a surface light source even if a general standard lamp is used. CONSTITUTION: An integrating-sphere photometer comprises an integrating sphere(70), a photometer(10), a main light shielding film(20), a target light source(30), a secondary light source, and a secondary light shielding film(60). The integrating sphere comprises a left hemisphere(70a) and a right hemisphere(70b). The photometer is arranged on the central surface of the right hemisphere. The main light shielding film is arranged before the photometer at an interval. The target light source is arranged on the central area of the integrating sphere and radiates light at least to the radiating area of the left hemisphere. The secondary light source is arranged near the interface of the left and right hemispheres and radiates light to the radiating area.
Abstract:
An integrating photometer for measuring a total flux of a light is provided to measure whole flux from the surface light source. An integrating photometer is composed of a hemispheric part(1), a disc form mirror(3), a light receiving part, and a correction light source. The hemispherical portion has a light diffusion reflection layer while having a rotary shaft connected with a base part. The mirror passes through the center of curvature of the hemispherical portion and is installed to block an opening part. In mirror, the light source window and illumination window which are passage between the inside and the outside is formed.
Abstract:
The invention relates to a lighting device by means of which a surface can be particularly uniformly illuminated, in particular for scientific or quality control purposes. In particular, the invention relates to a lighting device for homogeneously illuminating an object, which device comprises a homogenisation device (10) and is suitable for connection to a light source, said homogenisation device (10) having an inlet opening (12), an inlet chamber (16) arranged behind the inlet opening (12), an intermediate chamber (18), an outlet chamber (20), and an outlet opening (22) arranged behind the outlet chamber (20), wherein the inlet chamber (16), the intermediate chamber (18) and the outlet chamber (20) each have an outer surface (26) and an inner surface (24), wherein the inlet chamber (16) extends along a first main axis (H1) and the outlet chamber (20) extends along a second main axis (H2), and a light source arranged in the region of the inlet opening (12) can send light through the inlet chamber (16), the intermediate chamber (18), the outlet chamber (20) and the outlet opening (22) onto an object to be illuminated, characterised in that a beam of light cannot travel in a straight line from a point of the inlet opening (12) to a point of the outlet opening (22), and that at least the respective inner surfaces (24) of the inlet chamber (16), the intermediate chamber (18) and the outlet chamber (20) are diffusely reflective in at least one respective first region, such that a beam of light reflected on one of these inner surfaces (24), said beam illuminating a first reference surface (R1) with a first irradiance when incident, when emergent illuminates a second reference surface (R2) of the same size with a second irradiance that is lower than the first irradiance by at least a factor of 3, when both reference surfaces (R1, R2) are positioned at a distance of 10 mm from the reflection point (P).
Abstract:
The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications.
Abstract:
Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.