公开(公告)号：EP0701686B1

公开(公告)日：1998-11-18

申请号：EP94906879.5

申请日：1994-02-16

Applicant: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.

Inventor： BÖBEL, Friedrich ,  BAUER, Norbert

IPC: G01J5/00 ,  G01B11/06

CPC classification number: G01J5/0003 ,  G01B11/0633 ,  G01J5/0007 ,  G01J5/0834 ,  G01J2001/4242 ,  G01J2005/0048 ,  G01J2005/0074

公开(公告)号：EP0335224B1

公开(公告)日：1995-08-09

申请号：EP89104999.1

申请日：1989-03-21

Applicant: NIPPON STEEL CORPORATION

Inventor： Tanaka, Fumio ,  DeWitt, David P.

IPC: G01J5/60

CPC classification number: G01J5/06 ,  G01J5/004 ,  G01J5/0044 ,  G01J5/02 ,  G01J5/026 ,  G01J5/0275 ,  G01J5/029 ,  G01J5/061 ,  G01J5/08 ,  G01J5/0825 ,  G01J5/0834 ,  G01J5/0846 ,  G01J5/602 ,  G01J2005/0051 ,  G01J2005/0074

公开(公告)号：EP0543326A3

公开(公告)日：1993-11-24

申请号：EP92119607.7

申请日：1992-11-17

Applicant: KAWASAKI STEEL CORPORATION

Inventor： Marui, Tomohiro ,  Arai, Kazuo

IPC: G01N21/47 ,  G01J5/60 ,  G01B11/30

CPC classification number: G01J5/60 ,  G01J2005/0074

Abstract: Radiated light with a specified wavelength from a material (21, P, 201) is detected and a first parameter corresponding to the emissivity ratio is obtained from the detection signal. Since the emissivity takes on different values according to the condition of the surface of the material, the first parameter changes depending on the surface condition of the material. There is a correlation between a physical value indicating a condition of the material surface and the first parameter. The correlation remains equivalent even if a second parameter corresponding to the physical value is used instead of the physical value itself (for example, an optical physical value such as reflectivity and absorptivity, the thickness of a film formed on the material surface, the surface roughness, and the degree of galvannealing). As an example of the parameter corresponding to the physical value, there is the logarithmic ratio between emissivities (ln ε a /ln ε b ) corresponding to the temperature in the vicinity of the surface. Therefore, a second parameter can be obtained on the basis of the correlation and a physical value can be obtained. When the emissivity or logarithmic emissivity ratio is used as the second parameter, the temperature in the vicinity of the material surface can be obtained from the second parameter and the detection signal.

公开(公告)号：US20190234800A1

公开(公告)日：2019-08-01

申请号：US16380042

申请日：2019-04-10

Applicant: International Business Machines Corporation

Inventor： Ali Afzali-Ardakani ,  Abram L. Falk ,  Damon B. Farmer ,  Shu-Jen Han ,  George S. Tulevski

IPC: G01J5/00 ,  G01J5/20 ,  G01J5/02

CPC classification number: G01J5/0018 ,  G01J5/023 ,  G01J5/046 ,  G01J5/0862 ,  G01J5/20 ,  G01J5/602 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01J2005/0077

Abstract: A computer-implemented method of forming a thermal-based electronic image of an object that includes receiving electromagnetic radiation emitted by the object at an optically sensitive layer including a superpixel having a plurality of pixels. Each pixel of the plurality of pixels includes a plasmonic absorber having a characteristic resonance wavelength and that generates a radiance measurement of the electromagnetic radiation at its characteristic resonance wavelength. The method further provides for determining, at a processor, an emissivity and temperature for the electromagnetic radiation received at the superpixel using the radiance measurements obtained at the pixels of the superpixel. In addition, the method provides for forming an image of the object from the determined emissivity and temperature.

公开(公告)号：US20180253953A1

公开(公告)日：2018-09-06

申请号：US15912966

申请日：2018-03-06

Applicant: Tyco Safety Products Canada Ltd.

Inventor： Andrei Bucsa ,  Gregory W. Hill ,  Rob Vandervecht

IPC: G08B17/12 ,  F24C7/08 ,  F24C3/12 ,  H05B6/06

CPC classification number: G08B17/12 ,  F23D2208/10 ,  F23N5/242 ,  F24C3/12 ,  F24C7/08 ,  F24C15/2021 ,  G01J5/025 ,  G01J5/026 ,  G01J5/0275 ,  G01J5/089 ,  G01J5/0896 ,  G01J2005/0048 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01J2005/0077 ,  G01J2005/0081 ,  G08B21/12 ,  G08B21/14 ,  G08B25/10 ,  H05B1/0266 ,  H05B6/062 ,  H05B2213/07

Abstract: A Safety Cooking Device includes a thermal sensor that detects infrared radiation (IR) to generate thermal images of a cooktop over time, and a controller. The controller uses the thermal images to determine whether the cooktop is unattended. Both wired and wireless embodiments of the cooking safety device are disclosed. In one implementation, the cooking safety device is in communication with and reports to a security panel of a security system.

公开(公告)号：US09494466B2

公开(公告)日：2016-11-15

申请号：US14169651

申请日：2014-01-31

Applicant: KABUSHIKI KAISHA TOSHIBA

Inventor： Toshiyuki Uchii ,  Tadashi Mori

IPC: G01J5/00 ,  G01J5/60 ,  G01J5/08 ,  G01K11/12 ,  G01J5/06

CPC classification number: G01J5/0014 ,  G01J5/06 ,  G01J5/0821 ,  G01J5/0896 ,  G01J5/602 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01K11/12

Abstract: A temperature measurement device is provided with: light collection means; extraction means; optical intensity calculation means; and temperature measurement means. The light collection means collects the emission spectrum of a measurement subject. The extraction means extracts light having the wavelength of the atomic spectral lines and light having a wavelength in a wavelength region where there are no atomic spectral lines, from the emission spectrum collected by the aforementioned light collection means. The optical intensity calculation means calculates the optical intensities of the light extracted by the aforementioned extraction means. The temperature measurement means calculates the temperature of the aforementioned measurement subject, based on the intensities of the beams calculated by the aforementioned optical intensity calculation means.

Abstract translation: 温度测量装置具有：光收集装置; 提取手段; 光强计算手段; 和温度测量装置。 光采集装置收集测量对象的发射光谱。 提取装置从由上述光收集装置收集的发射光谱中提取具有原子光谱线的波长的光和具有不存在原子光谱线的波长区域中的波长的光。 光强度计算装置计算由上述提取装置提取的光的光强度。 温度测量装置基于由上述光强度计算装置计算的光束的强度来计算上述测量对象的温度。

公开(公告)号：US20140321497A1

公开(公告)日：2014-10-30

申请号：US14256539

申请日：2014-04-18

Applicant: JTEKT CORPORATION

Inventor： Naoki MATSUMOTO ,  Kouya YOSHIDA ,  Jun MATSUMOTO

IPC: G01N25/72 ,  G01K15/00

CPC classification number: G01N25/72 ,  B23K26/032 ,  B23K31/125 ,  G01J2005/0074 ,  G01K15/005 ,  G01N21/63 ,  G01N21/71 ,  G01R31/048 ,  G01R31/308 ,  H01L2224/48472 ,  H01L2224/73257 ,  H01L2224/859

Abstract: There are provided an optical non-destructive inspection apparatus and an optical non-destructive inspection method. The apparatus includes a focusing-collimating unit, a heating laser beam source, a heating laser beam guide unit, an infrared detector, an emitted-infrared guide unit, first and second correcting laser beam source, first and second correcting laser beam guide units, first and second correcting laser detectors, first and second reflected laser beam guide units, and a control unit. The control unit controls the heating laser beam source and the first and second correcting laser beam sources, measures a temperature rise characteristic that is a temperature rise state of a measurement spot based on a heating time, on the basis of a detection signal from the infrared detector and detection signals from the first and second correcting laser detectors, and determines a state of a measurement object based on the measured temperature rise characteristic.

公开(公告)号：US20110235918A1

公开(公告)日：2011-09-29

申请号：US13073147

申请日：2011-03-28

Applicant: Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

Inventor： Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

IPC: G06K9/46 ,  G01J5/00 ,  H01L31/00 ,  G01K7/00

CPC classification number: G01J5/522 ,  G01J5/02 ,  G01J5/025 ,  G01J5/0265 ,  G01J5/08 ,  G01J5/0859 ,  G01J5/089 ,  G01J2005/0074 ,  G01J2005/0077

Abstract: In a temperature measuring device (1) an IR-radiation detector (2) and a reference element (3) are provided, connected to a surface (6) of an object (7) in a heat-conducting fashion, with a first area (4) with high emissivity and a second area (5) with high reflectivity formed at the reference element (3), and the IR-radiation detector (2) is equipped for a separate detection of IR-radiation (9, 10, 11) from the first and second areas (4, 5) and a surface area (12) of the object (7). A computer (13) in the IR-radiation detector (2) is equipped to deduct a temperature measurement for the object (7), corrected for emissions and reflections from the detected IR-radiations (9, 10, 11).

Abstract translation: 在温度测量装置（1）中，设置有IR辐射检测器（2）和参考元件（3），其以导热方式连接到物体（7）的表面（6），第一区域 （4）具有高发射率和在参考元件（3）处形成的具有高反射率的第二区域（5），并且IR辐射检测器（2）被配备用于单独检测IR辐射（9,10,11 ）从物体（7）的第一和第二区域（4,5）和表面区域（12）移动。 IR辐射检测器（2）中的计算机（13）被配备为从检测到的IR辐射（9,10,11）中校正​​发射和反射的物体（7）的温度测量值。

公开(公告)号：US07632012B2

公开(公告)日：2009-12-15

申请号：US11217884

申请日：2005-09-01

Applicant: Michael Twerdochlib

Inventor： Michael Twerdochlib

IPC: G01J5/02

CPC classification number: G01J5/0003 ,  G01J5/524 ,  G01J5/602 ,  G01J2005/0074

Abstract: A method for measuring the differential emissivity between two sites on the surface of a body and the temperature of the two sites. The method includes a plurality of measurements of the infrared radiation arising from each of the two sites under a number of different conditions. Some of the measurements include irradiation by external infrared radiation at a known wavelength and intensity. The infrared radiation arising from each of the sites may include emitted radiation, reflected ambient radiation, and reflected external radiation. Additionally, the temperature determined using the method described can be used to calibrate infrared imaging devices used to inspect the entire body.

Abstract translation: 一种用于测量身体表面两个位置与两个部位的温度之间的差异发射率的方法。 该方法包括在多个不同条件下从两个位置中的每一个产生的红外辐射的多个测量。 一些测量包括以已知波长和强度的外部红外辐射照射。 从每个地点产生的红外辐射可能包括发射的辐射，反射的环境辐射和反射的外部辐射。 另外，使用所述方法确定的温度可用于校准用于检查整个身体的红外成像装置。

公开(公告)号：US5442727A

公开(公告)日：1995-08-15

申请号：US227844

申请日：1994-04-14

Applicant: Anthony T. Fiory

Inventor： Anthony T. Fiory

IPC: G01J5/10 ,  G01J5/00 ,  H05B3/62

CPC classification number: G01J5/0003 ,  G01J5/0007 ,  G01J5/08 ,  G01J5/0818 ,  G01J5/0878 ,  G01J2005/0048 ,  G01J2005/0074

Abstract: In a process for heating, e.g., a semiconductor wafer within a processing chamber, the wafer is exposed to a flux of electromagnetic radiation from lamps energized by alternating electric current. The surface temperature of the wafer is measured, and responsively, the radiation flux is controlled. The temperature measurement procedure includes collecting radiation propagating away from the wafer in a first light-pipe probe, collecting radiation propagating toward the wafer in a second light-pipe probe, and detecting radiation collected in the respective probes. This procedure further involves determining, in the signal received from each probe, a magnitude of a time-varying component resulting from time-variations of the energizing current, and combining at least these magnitudes according to a mathematical expression from which the temperature can be inferred. At least some of the radiation collected by the second probe is collected after reflection from a diffusely reflecting surface. The second probe effectively samples this radiation from an area of the diffusely reflecting surface that subtends a solid angle .OMEGA..sub.2 at the wafer surface. The first probe effectively samples radiation from an area of the wafer that subtends a solid angle .OMEGA..sub.1 at the first probe. The radiation sampling is carried out such that .OMEGA..sub.2 is at least about .OMEGA..sub.1.

Abstract translation: 在加热过程中，例如处理室内的半导体晶片，晶片暴露于由交流电流激励的灯的电磁辐射通量。 测量晶片的表面温度，并且响应地控制辐射通量。 温度测量程序包括收集在第一光管探针中离开晶片传播的辐射，收集在第二光管探针中向晶片传播的辐射，以及检测在各个探针中收集的辐射。 该过程进一步包括在从每个探测器接收到的信号中确定由激励电流的时间变化导致的时变分量的幅度，并且根据可从其推断温度的数学表达式至少组合这些幅度 。 在从漫反射表面反射之后收集由第二探针收集的至少一些辐射。 第二探针有效地从漫反射表面的与晶片表面的立体角OMEGA 2相对的区域采样该辐射。 第一探针有效地从在第一探针处对准固体角度的OMEGA 1的晶片区域的辐射。 进行辐射采样使得OMEGA 2至少约为OMEGA 1。