公开(公告)号：US20170142351A1

公开(公告)日：2017-05-18

申请号：US15356297

申请日：2016-11-18

Applicant: Honeywell International Inc.

Inventor： Barrett E. Cole ,  Bernard S. Fritz

IPC: H04N5/33 ,  G02B5/20

CPC classification number: G02B5/208 ,  G01J3/36 ,  G01J5/0018 ,  G01J2005/607 ,  G02B5/201 ,  G02B9/60 ,  G02B13/14 ,  H04N5/332

Abstract: Dual band filters and detectors are described herein. A detector can include a filter for filtering light from a scene to be imaged, the filter having at least one window that only allows light to pass there through that is within a medium wavelength infrared wavelength range and at least one window that allows light to pass there through that is not within a medium wavelength infrared wavelength range and an imager array that receives the filtered light that passes through the filter.

公开(公告)号：US20170023411A1

公开(公告)日：2017-01-26

申请号：US15124475

申请日：2015-02-25

Applicant: MITSUBISHI MATERIALS CORPORATION ,  UBE INDUSTRIES, LTD. ,  SUMITOMO OSAKA CEMENT CO., LTD. ,  TAIHEIYO CEMENT CORPORATION

Inventor： Hirokazu SHIMA ,  Yoshiaki TAKATA

IPC: G01J5/00 ,  F27B7/20 ,  F27B7/42 ,  G01J5/60

CPC classification number: G01J5/0003 ,  F27B7/20 ,  F27B7/42 ,  F27D2019/0012 ,  F27D2019/0015 ,  G01J5/0044 ,  G01J5/061 ,  G01J5/0846 ,  G01J5/60 ,  G01J2005/0048 ,  G01J2005/607

Abstract: A first radiance meter that is provided so as to face an object in an atmosphere in which there is dust and measures the radiance of the object and a second radiance meter that is provided so as not to oppose the object and measures the radiance of the dust between the object and the first radiance meter are used to measure the temperature of the object on the basis of the object radiance that has been measured by the first radiance meter and the radiance of the dust between the object and the first radiance meter that has been measured by the second radiance meter.

Abstract translation: 第一辐射度计，其设置成面对有灰尘的气氛中的物体并测量物体的辐射度;以及第二辐射计，其设置为不与物体相对并且测量灰尘的辐射度 物体和第一辐射度计之间的物体用于根据由第一辐射度计测量的物体辐射和物体与第一辐射度计之间的灰尘的辐射度来测量物体的温度 由第二辐射计测量。

公开(公告)号：US09322716B2

公开(公告)日：2016-04-26

申请号：US14576191

申请日：2014-12-18

Applicant: Panasonic Intellectual Property Corporation of America

Inventor： Koichi Kusukame ,  Tatsuo Itoh ,  Kazuki Funase

IPC: G01J5/20 ,  G01J5/60 ,  G01N21/35 ,  G01N21/3554

CPC classification number: G01J5/60 ,  G01J2005/607 ,  G01N21/35 ,  G01N21/3554

Abstract: A component measuring apparatus includes a plurality of light sources having different Wavelengths. The component measuring apparatus also includes an irradiation unit that applies lights emitted from the plural light sources to a measurement object, and a light receiving unit that receives at least one of light having transmitted through the measurement object and light having been scattered from the measurement object. The component measuring apparatus further includes a measuring unit that measures intensity of the light received by the light receiving unit per wavelength.

Abstract translation: 元件测量装置包括具有不同波长的多个光源。 部件测量装置还包括将从多个光源发射的光施加到测量对象的照射单元，以及光接收单元，其接收透射通过测量对象的光和从测量对象散射的光中的至少一个 。 部件测量装置还包括测量单元，其测量由每个波长的光接收单元接收的光的强度。

公开(公告)号：US20150268099A1

公开(公告)日：2015-09-24

申请号：US14665983

申请日：2015-03-23

Applicant: James Eldon Craig ,  Thomas Ross Wakeman

Inventor： James Eldon Craig ,  Thomas Ross Wakeman

IPC: G01J5/08

CPC classification number: B23K26/034 ,  B23K2103/08 ,  B29C64/135 ,  B29C64/386 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  G01J5/0003 ,  G01J5/004 ,  G01J5/602 ,  G01J2005/106 ,  G01J2005/607

Abstract: An additive manufacturing temperature controller/temperature sensor uses one or more spectrophotometric sensors to monitor temperature of successive layers and preferably localized sections of successive layers of a melt pool, and transients thereof, of an object being generated for the purpose of dynamic control of the additive manufacturing device and/or quality control of the generated object manufactured with the additive manufacturing device. Generally, the additive manufacturing temperature controller/sensor apparatus monitors temperature of a section of the object during manufacture as a function of wavelength, time, position, and/or angle to determine melt extent in terms of radius and/or depth.

Abstract translation: 添加剂制造温度控制器/温度传感器使用一个或多个分光光度传感器来监测为了动态控制添加剂而产生的物体的连续层的温度，优选是熔池的连续层的局部部分及其瞬变， 使用添加剂制造装置制造的生成物体的制造装置和/或质量控制。 通常，添加剂制造温度控制器/传感器装置根据波长，时间，位置和/或角度来监测制造过程中物体的一部分的温度，以根据半径和/或深度确定熔体范围。

公开(公告)号：US20140314121A1

公开(公告)日：2014-10-23

申请号：US14249865

申请日：2014-04-10

Applicant: JTEKT CORPORATION

Inventor： Naoki MATSUMOTO ,  Kouya YOSHIDA ,  Jun MATSUMOTO

IPC: G01J5/10 ,  G01J5/00 ,  G01J5/02

CPC classification number: G01J5/10 ,  G01J5/0003 ,  G01J5/0096 ,  G01J5/026 ,  G01J5/0806 ,  G01J5/60 ,  G01J2005/607 ,  G01N21/63 ,  G01N21/71 ,  G01N25/72 ,  H01L2224/48472 ,  H01L2224/73257 ,  H01L2224/859

Abstract: There are provided an optical non-destructive inspection apparatus that can inspect a measurement object such as a wire bonding portion. The apparatus includes a focusing-collimating unit, a heating laser beam source, a heating laser beam guide unit, a first infrared detector, a second infrared detector, an emitted-infrared selective guide unit, and a control unit. The control unit controls the heating laser beam source, measures a temperature rise characteristic that is a temperature rise state of a measurement spot based on a heating time, on the basis of a ratio between a detected value from the first infrared detector and a detected value from the second infrared detector, determines a state of a measurement object based on the temperature rise characteristic, and changes at least one of wavelengths of infrared light beams guided to the first infrared detector and the second infrared detector based on a measured temperature during measurement.

Abstract translation: 提供了可以检查诸如引线接合部分之类的测量对象的光学无损检测装置。 该装置包括聚焦准直单元，加热激光束源，加热激光束引导单元，第一红外检测器，第二红外检测器，发射红外选择引导单元和控制单元。 控制单元控制加热激光束源，基于来自第一红外线检测器的检测值与检测值之间的比率，基于加热时间测量作为测量点的温度升高状态的温度上升特性 从第二红外线检测器基于温升特性确定测量对象的状态，并且基于测量期间测量的温度来改变被引导到第一红外检测器和第二红外检测器的红外光束的至少一个波长。

公开(公告)号：US20120105646A1

公开(公告)日：2012-05-03

申请号：US13291411

申请日：2011-11-08

Applicant: Dov OSTER ,  Michael SINGER ,  Alina KOIFMAN ,  Tuvy MARKOVITZ

Inventor： Dov OSTER ,  Michael SINGER ,  Alina KOIFMAN ,  Tuvy MARKOVITZ

IPC: H04N5/33 ,  H04N5/225

CPC classification number: G01J5/06 ,  G01J5/061 ,  G01J5/08 ,  G01J5/0806 ,  G01J2005/0077 ,  G01J2005/065 ,  G01J2005/607

Abstract: An infrared (IR) imaging system is presented. The system includes a cooling chamber associated with a cooler generating a certain temperature condition inside the chamber. The cooling chamber has an optical window, and includes thereinside an IR detection unit including one or more detectors thermally coupled to the cooler and at least two cold shields thermally coupled to the cooler and carrying at least two imaging optical assemblies. The at least two imaging optical assemblies are enclosed by the cold shields in between the detection unit and the optical window and thereby define at least two different optical channels for imaging light from the optical window onto the one or more detectors of the detection unit.

Abstract translation: 介绍了红外（IR）成像系统。 该系统包括与冷却器相关联的冷却室，其在室内产生一定温度条件。 冷却室具有光学窗口，并且包括IR检测单元，其包括热耦合到冷却器的一个或多个检测器和与冷却器热耦合并携带至少两个成像光学组件的至少两个冷屏蔽件。 所述至少两个成像光学组件被所述检测单元和所述光学窗口之间的冷屏蔽包围，从而限定至少两个不同的光学通道，用于将来自所述光学窗口的光成像到所述检测单元的所述一个或多个检测器。

公开(公告)号：US4845647A

公开(公告)日：1989-07-04

申请号：US694423

申请日：1985-01-24

Applicant: Ray R. Dils ,  Alan K. Winslow

Inventor： Ray R. Dils ,  Alan K. Winslow

IPC: G01J5/10 ,  G01J1/44 ,  G01J5/00 ,  G01J5/06 ,  G01J5/08 ,  G01J5/52 ,  G01J5/60

CPC classification number: G01J5/08 ,  G01J5/0821 ,  G01J5/602 ,  G01J2001/4406 ,  G01J2001/446 ,  G01J2005/0048 ,  G01J2005/068 ,  G01J2005/607 ,  G01J5/52

Abstract: A system for measuring temperature within a region to be tested includes a sensor means responsive to the temperature within the region for transmitting light energy along an optically-transmissive path and detector and amplifier means responsive to the light energy for producing an output signal which represents the intensity of the light energy. A signal processor electronically calculates a display signal from the output signal which represents the temperature within the test region. The signal processor performs this calcuation by solving Planck's equation, and a successive bisection technique is utilized to achieve extremely fine resolution of the temperature.

Abstract translation: 用于测量要测试的区域内的温度的系统包括响应于该区域内的温度以沿着光学透射路径传输光能的传感器装置，响应于光能的检测器和放大器装置产生表示 光能的强度。 信号处理器电子地计算来自表示测试区域内的温度的输出信号的显示信号。 信号处理器通过求解普朗克方程来执行该计算，并采用连续的二分法来实现极高的温度分辨率。

公开(公告)号：US4746798A

公开(公告)日：1988-05-24

申请号：US897671

申请日：1986-08-18

Applicant: Max Amon ,  Jefferson E. Odhner

Inventor： Max Amon ,  Jefferson E. Odhner

IPC: G01J3/12 ,  G01J3/36 ,  G01J5/06 ,  G01J5/60 ,  G02B27/10 ,  G01J1/00

CPC classification number: G02B27/143 ,  G01J3/0243 ,  G01J3/12 ,  G02B27/1006 ,  G02B27/148 ,  G01J2003/1213 ,  G01J2005/607 ,  G01J3/36 ,  G01J5/061

Abstract: A wavelength discriminator designed to collect broadband, multiple wavelength input energy, to isolate specific narrow bands of interest, and to image such narrow bands of interest upon closely spaced, separate detectors. This discriminator comprises optical devices (22, 18) for directing incoming radiant energy of a certain quality and involving a wide range of wavelengths through first (26a) and second (26b) wavelength selective reflectors separated by a medium that transmits the wavelengths of interest. The wavelength selective reflectors in accordance with this invention are in a non-parallel configuration and disposed in a double pass geometrical arrangement wherein energy of a certain wavelength reflected from the second wavelength selective reflector (26b) passes back through the first wavelength selective reflector (26a), with the energy from the first and second wavelength reflectors thereafter being directed onto respective detectors (32aand 32b). An embodiment involving a third wavelength selective reflector (26c) grouped with the first and second reflectors may be utilized, wherein energy of a different wavelength reflected from the third wavelength selective reflector passes back through both the second and first wavelength selective reflectors, with the selected wavelengths thereafter falling upon three separate detectors (32a, 32band 32c) of the array.

Abstract translation: 一种波长鉴别器，设计用于收集宽带，多波长输入能量，以分离感兴趣的特定窄带，并在紧密间隔的独立检测器上对感兴趣的这种窄带进行成像。 该鉴别器包括光学器件（22,18），用于引导一定质量的入射辐射能并且涉及通过透射感兴趣波长的介质分离的第一（26a）和第二（26b）波长选择反射器的宽波长范围。 根据本发明的波长选择反射器处于非平行配置并且以双通几何布置布置，其中从第二波长选择反射器（26b）反射的特定波长的能量通过第一波长选择反射器（26a） ），其中来自第一和第二波长反射器的能量此后被引导到相应的检测器（32a和32b）上。 可以使用涉及与第一和第二反射器分组的第三波长选择性反射器（26c）的实施例，其中从第三波长选择性反射器反射的不同波长的能量通过第二和第一波长选择反射器返回， 之后的波长落在阵列的三个单独的检测器（32a，32频带32c）上。

公开(公告)号：EP3121572A1

公开(公告)日：2017-01-25

申请号：EP15764852.8

申请日：2015-02-25

Applicant: Mitsubishi Materials Corporation

Inventor： SHIMA, Hirokazu ,  TAKATA, Yoshiaki

IPC: G01J5/00 ,  G01J5/06 ,  F27B7/42 ,  F27D7/06 ,  F27D21/00

CPC classification number: G01J5/0003 ,  F27B7/20 ,  F27B7/42 ,  F27D2019/0012 ,  F27D2019/0015 ,  G01J5/0044 ,  G01J5/061 ,  G01J5/0846 ,  G01J5/60 ,  G01J2005/0048 ,  G01J2005/607

Abstract: A first radiance meter that is provided so as to face an object in an atmosphere in which there is dust and measures the radiance of the object and a second radiance meter that is provided so as not to oppose the object and measures the radiance of the dust between the object and the first radiance meter are used to measure the temperature of the object on the basis of the object radiance that has been measured by the first radiance meter and the radiance of the dust between the obj ect and the first radiance meter that has been measured by the second radiance meter.

Abstract translation: 第一辐射度计，其设置成面对有灰尘的气氛中的物体，并测量物体的辐射度;以及第二辐射计，其设置为不与物体相反并且测量灰尘的辐射度 物体和第一辐射度计之间的物体用于根据由第一辐射度计测量的物体辐射和物体与具有第一辐射度计的第一辐射度计之间的灰尘的辐射度来测量物体的温度 由第二个辐射计测量。

公开(公告)号：EP0618432A3

公开(公告)日：1995-09-06

申请号：EP94400703.8

申请日：1994-03-31

Applicant: EUROPEAN GAS TURBINES SA

Inventor： Fally, Jacques

IPC: G01J5/60

CPC classification number: G01J5/60 ,  G01J2005/607

Abstract: Pyromètre bichromatique pour la détection de la température élevée d'un élément de surface d'un objet, comprenant deux photodiodes (18, 19) recevant le rayonnement de l'objet, chacune à large bande interdite et sensible au rayonnement dans un domaine de longueurs d'onde donné, ces domaines de sensibilité étant différents,
   et situés dans le visible ou proches du visible, et étant obtenu par le choix de la valeur de la bande interdite du matériau constitutif de chacune des photodiodes (18) et (19), qui est supérieure ou égale à celle du silicium (≧1,11e V).
Détermination de la température de surfaces rapidement évolutives avec une grande précision.