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公开(公告)号：EP0192722B1
公开(公告)日：1989-03-08
申请号：EP85904469.5
申请日：1985-09-09
Inventor： MOUNTAIN, David, Stevenson
IPC: G01N25/72
CPC classification number: G01L1/248
Abstract: A method for indicating static stress in an object utilising the stress dependence of the specific heat of the object by scanning the surface of the object (10) with a pulsed laser light source (12) and measuring the resulting temperature changes by means of an infra red detector (18) to provide stress information. A beam splitter (15) enables light transmission and infra red reception to be scanned simultaneously. A further laser source (20) provides three spaced beams which are transmitted through beam splitter (13) so as to impinge on the surface of the object (10) at points surrounding the instantaneous point of inspection. Reflected light from these beams is processed to give instantaneous angle of incidence information necessary to correct the infra red measurements when scanning complex objects.
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公开(公告)号：EP0192722A1
公开(公告)日：1986-09-03
申请号：EP85904469.0
申请日：1985-09-09
Inventor： MOUNTAIN, David, Stevenson
IPC: G01L1
CPC classification number: G01L1/248
Abstract: Un procédé d'indication de l'effort statique dans un objet utilise la dépendance de l'effort de la chaleur spécifique de l'objet en balayant la surface de l'objet (10) avec une source de lumière laser pulsée (12) et en mesurant les changements résultants de la température avec un détecteur d'infrarouges (18) pour obtenir des informations sur l'effort. Un diviseur optique du faisceau (15) permet de balayer simultanément la transmission de lumière et la réception des infrarouges. Une source supplémentaire de laser (20) fournit trois rayons espacés transmis à travers le diviseur optique du faisceau (13) de façon à toucher la surface de l'objet (10) en des points entourant le point instantané d'inspection. La lumière réfléchie de ces rayons est mesurée pour donner des informations sur l'angle instantané d'incidence, nécessaires pour corriger les mesures fournies par les infrarouges lorsque l'on balaie des objets complexes.
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43.发明公开
公开(公告)号：EP0020341A1
公开(公告)日：1981-01-07
申请号：EP79900544.0
申请日：1979-05-25
Applicant: SIRA LIMITED
Inventor： MOUNTAIN, David Stevenson , ALLNUTT, Anthony John , BAKER, Lionel Richard , COX, Laurence John , PICOT, Alan John , WARDROPPER, Peter Frederick , WEBBER, Julian Martin Bartlett
Abstract: Un appareil et une methode d'indication de la contrainte dans un objet (10) consiste a projeter la variation de la temperature d'une partie de la surface de l'objet lorsqu'il est soumis a une contrainte. Un detecteur a rayons infrarouges (13) detecte de faibles changements de temperature et la contrainte peut etre appliquee par charge naturelle ou par contrainte cyclique imposee par un vibrateur.
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公开(公告)号：US20240183728A1
公开(公告)日：2024-06-06
申请号：US18285601
申请日：2022-01-18
Applicant: Sony Group Corporation
Inventor： Kazuo HONGO
CPC classification number: G01L1/248 , G01B11/026 , G01B11/16 , G01C3/08 , G01L1/044 , G02B17/004
Abstract: There is provided a sensor device to detect a force sense with a smaller and simpler mechanism. The sensor device includes: a force acting portion exposed from an opening provided on an exterior portion and attached to an inside of the exterior portion via a flexible body; a reflection space of which at least two surfaces are surrounded by a first mirror provided on an inner bottom surface of the exterior portion and a second mirror provided on a surface of the force acting portion or flexible body, the surface facing the first mirror; and a light source unit configured to emit light to the reflection space; and an imaging unit provided on the inner bottom surface of the exterior portion and configured to capture an image including a force sense detection region in which reflection light of the light emitted from the light source unit is seen.
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公开(公告)号：US11906370B2
公开(公告)日：2024-02-20
申请号：US17124735
申请日：2020-12-17
Inventor： Yousuke Irie , Ryoji Hirose
IPC: G01N25/72 , G01K5/56 , G01M5/00 , G01L1/24 , G01M99/00 , G01M11/08 , G06T7/00 , G06T7/20 , H04N5/33 , G01G19/02
CPC classification number: G01K5/56 , G01L1/248 , G01M5/0008 , G01M5/0091 , G01M11/081 , G01M99/002 , G01N25/72 , G06T7/0004 , G06T7/20 , H04N5/33 , G01G19/022 , G06T2207/10048 , G06T2207/20056 , G06T2207/30132 , G06T2207/30236
Abstract: A method is disclosed for measuring stress distribution generated on a structural object including two support parts and a beam part provided between the support parts. The method includes: generating first data by sensing, through a first sensing unit, of a moving object or an identification display object attached to the structural object; calculating, based on the first data, a movement duration in which the moving object moves between the support parts; generating, as second data, thermal data by sensing of a surface of the beam part through a second sensing unit; calculating a temperature change amount based on a second data group corresponding to the movement duration; and calculating a stress change amount based on the temperature change amount to calculate stress distribution based on the stress change amount.
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Patent Agency Ranking
公开(公告)号：US11761833B2
公开(公告)日：2023-09-19
申请号：US17085403
申请日：2020-10-30
Inventor： Yousuke Irie
IPC: G01L1/24 , G01K3/10 , G01J5/00 , H04N5/33 , H04N7/18 , G01B11/16 , G01L1/00 , G01M5/00 , G01N25/20 , G01N25/72 , G01M99/00 , G01M11/08
CPC classification number: G01L1/248 , G01B11/16 , G01J5/0003 , G01K3/10 , G01L1/00 , G01M5/0008 , G01M5/0091 , G01M11/081 , G01M99/002 , G01N25/20 , G01N25/72 , H04N5/33 , H04N7/181 , G01J2005/0077
Abstract: A stress measurement device includes a first obtaining unit obtaining thermal data including information indicating a temperature of a measuring region, a second obtaining unit obtaining data related to stress occurring in one part of the measuring region, and a controller finding stress occurring in the measuring region from the thermal data and the data related to the stress. The controller finds, first waveform data respectively on the one part and a part other than the one part based on a change with time of the thermal data, and second waveform data based on a change with time of the data related to the stress. The controller finds, disturbance data through a deduction of the second waveform data from the first waveform data on the one part, and stress data indicating stress occurring in the part through a deduction the disturbance data from the first waveform data on the part.
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公开(公告)号：US20160363542A1
公开(公告)日：2016-12-15
申请号：US15245442
申请日：2016-08-24
Applicant: Intel Corporation
Inventor： Liang W. Zhang , Zhihua Zou , Osborne A. Martin, III , Robert F. Wiedmaier
CPC classification number: G01B11/14 , G01B11/18 , G01B11/272 , G01L1/241 , G01L1/248 , G01N21/8806 , G01N21/9501 , G03F7/70775 , G03F9/7007 , G03F9/7046 , G03F9/7065 , H01L22/12 , H05K1/0269 , H05K3/0008
Abstract: Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.
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48.发明申请PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING ION-EXCHANGED WAVEGUIDES WITH LARGE DEPTH-OF-LAYER 有权用于表征具有大层深度的离子交换波长的原始耦合系统和方法公开(公告)号：US20160178477A1
公开(公告)日：2016-06-23
申请号：US14966642
申请日：2015-12-11
Applicant: Corning Incorporated
CPC classification number: G01M11/08 , C03C21/002 , G01B11/0641 , G01B11/22 , G01L1/24 , G01L1/248 , G01N21/23 , G01N21/41 , G01N21/8422 , G01N2021/4126 , G02B5/04 , G02B6/1345 , G02B6/14 , G02B6/34 , G02B6/362
Abstract: Prism-coupling systems and methods for characterizing large depth-of-layer waveguides formed in glass substrates are disclosed. One method includes making a first measurement after a first ion-exchange process that forms a deep region and then performing a second measurement after a second ion-exchange process that forms a shallow region. Light-blocking features are arranged relative to the prism to produce a mode spectrum where the contrast of the mode lines for the strongly coupled low-order modes is improved at the expense of loss of resolution for measuring characteristics of the shallow region. Standard techniques for determining the compressive stress, the depth of layer or the tensile strength of the shallow region are then employed. A second measurement can be made using a near-IR wavelength to measure characteristics of the deeper, first ion-exchange process. Systems and methods of measuring ion-exchanged samples using shape control are also disclosed.
Abstract translation: 公开了用于表征玻璃基板中形成的大深度深度波导的棱镜耦合系统和方法。 一种方法包括在形成深区域的第一离子交换过程之后进行第一测量，然后在形成浅区域的第二离子交换过程之后进行第二测量。 光阻特征相对于棱镜布置以产生模式光谱，其中强耦合低阶模的模式线的对比度以改善浅区域特性的分辨率损失为代价而得到改善。 然后采用用于确定压缩应力，层的深度或浅区域的拉伸强度的标准技术。 可以使用近红外波长进行第二次测量，以测量较深的第一离子交换过程的特性。 还公开了使用形状控制测量离子交换样品的系统和方法。
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49.发明申请Witness Material and Method for Monitoring the Environmental History of an Object 有权用于监测对象环境史的证人材料和方法公开(公告)号：US20150308907A1
公开(公告)日：2015-10-29
申请号：US14259519
申请日：2014-04-23
Applicant: The Boeing Company
Inventor： Gary E. Georgeson , Morteza Safai
Abstract: A witness material for monitoring an environmental history of an object may include a material containing a dye of a type that fluoresces in response to actinic radiation in one or both of a shift in color and a change in intensity when subjected to a predetermined stress above a predetermined level; and the material forming a coating on one or more of an outer container for the object, an inner container for the object, a tape that is applied to an outer container for the object, a tape that is applied to an inner container for the object, a shrink wrap enclosing the object, an outer surface of the object, and an inner surface of the object.
Abstract translation: 用于监测物体的环境历史的目击材料可以包括含有染料的材料，该染料的颜色响应于光化辐射中的一种或两种而发生荧光，并且当受到预定的应力以上时的强度变化 预定水平; 并且在用于该物体的外部容器中的一个或多个上形成涂层的材料，用于该物体的内部容器，应用于该物体的外部容器的带，被施加到该物体的内部容器的带 包围对象的收缩包装，物体的外表面和物体的内表面。
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公开(公告)号：US20150276621A1
公开(公告)日：2015-10-01
申请号：US14229824
申请日：2014-03-28
Applicant: Liang W. Zhang , Zhihua Zou , Osborne A. Martin, III , Robert F. Wiedmaier
Inventor： Liang W. Zhang , Zhihua Zou , Osborne A. Martin, III , Robert F. Wiedmaier
CPC classification number: G01B11/14 , G01B11/18 , G01B11/272 , G01L1/241 , G01L1/248 , G01N21/8806 , G01N21/9501 , G03F7/70775 , G03F9/7007 , G03F9/7046 , G03F9/7065 , H01L22/12 , H05K1/0269 , H05K3/0008
Abstract: Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.
Abstract translation: 使用近红外光描述微电子器件的检查。 在一个示例中，用近红外光束照射基板上的电介质材料层。 衬底具有至少一个接触焊盘，电介质材料层覆盖接触焊盘的至少一部分，并且衬底具有限定在介电材料层中的至少一个通孔，该通孔暴露至少一部分接触焊盘。 反射的近红外光在相机处从基板反射。 使用图像处理装置，相对于来自反射光束的接触面确定通孔的位置。
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