公开(公告)号：EP3201603A4

公开(公告)日：2018-05-23

申请号：EP15844704

申请日：2015-08-31

Applicant: INTEL CORP

Inventor： BAXI AMIT S ,  MAGESHKUMAR VINCENT S

IPC: G01N21/25 ,  G01N21/78 ,  G01N21/80

CPC classification number: G01N21/78 ,  G01N21/251 ,  G01N21/255 ,  G01N21/80 ,  G01N2021/0181 ,  G01N2021/7773 ,  G01N2201/0627 ,  G01N2201/0635 ,  G01N2201/125 ,  G01N2201/13

Abstract: Apparatus and methods may provide for determining a value of chemical parameter. One or more light emitters may be positioned within a housing to emit light through an aperture of the housing. The emitted light may illuminate a color area of a structure that is separable from the housing, such as a test strip, a printed color reference, and so on. A color sensor may be positioned within the housing to capture reflected light and to convert the reflected light to an initial digitized color space that may be usable to determine a color shade of a color area. The reflected light may, for example, be captured independently at least of a dimension (e.g., predetermined size, shape, etc.) of the color area.

公开(公告)号：EP3311146A1

公开(公告)日：2018-04-25

申请号：EP16725483.8

申请日：2016-05-23

Applicant: Krones AG

Inventor： PIANA, Stefan

IPC: G01N21/90 ,  G01L9/00 ,  G01M3/22 ,  G01M3/36 ,  G01M3/38 ,  G01B11/24 ,  G01B11/16

CPC classification number: G01N21/9054 ,  G01B11/167 ,  G01B11/24 ,  G01M3/226 ,  G01M3/36 ,  G01M3/38 ,  G01N21/9009 ,  G01N21/909 ,  G01N2201/061 ,  G01N2201/0635

Abstract: The invention relates to an inspection method (100) for the closure control of containers, in particular bottles, wherein the closed containers are transported (101) by means of a transport apparatus and closures applied to the containers are inspected (102 - 108) with regard to tightness and/or correct seating by an inspection device, characterized in that, by means of an optical 3-D measurement method, the inspection device at least partially senses (102) a container together with the closure of the container and generates (103) 3-D data thereof, in particular 3-D points, 3-D line elements, and/or 3-D surface elements, and that the 3-D data are processed (104 - 107) by means of an evaluation apparatus and the tightness and/or the correct seating of the closure is thereby inferred (108).

公开(公告)号：EP3230718A1

公开(公告)日：2017-10-18

申请号：EP15817671.9

申请日：2015-12-09

Applicant: Berkeley Lights, Inc.

Inventor： DU, Fenglei

IPC: G01N21/64 ,  B01L3/00 ,  G01N21/75 ,  G01N33/53

CPC classification number: G01N35/00 ,  B01L3/502792 ,  B01L7/00 ,  B01L2200/0668 ,  B01L2200/147 ,  B01L2200/148 ,  B01L2300/024 ,  B01L2300/0883 ,  B01L2300/1822 ,  B01L2400/0415 ,  B01L2400/0427 ,  B01L2400/0472 ,  G01N21/6458 ,  G01N21/75 ,  G01N21/8483 ,  G01N2021/752 ,  G01N2021/755 ,  G01N2021/757 ,  G01N2201/0635

Abstract: A method is provided for the automated detection of assay-positive assay areas in a microfluidic device comprising one or more circuit elements, the method comprising collecting a set of digital images of an automatically-identified assay area (570, 572), wherein the automatically-identified assay area is identified based, at least in part, on the dimensions of the one or more circuit elements (522), calculating a rate of change over the course of all or part of the assay based on the set of digital images of the automatically-identified assay area, comparing the rate of change to a threshold value, and determining that the automatically-identified assay region is assay-positive if the rate of change is greater than the threshold value.

Abstract translation: 提供了一种用于在包括一个或多个电路元件的微流体装置中自动检测测定阳性测定区域的方法，所述方法包括收集自动识别的测定区域（570,572）的一组数字图像，其中自动地 - 至少部分地基于所述一个或多个电路元件（522）的尺寸来识别所识别的测定区域，基于所述一组数字图像的数字图像来计算所述测定的全部或部分过程中的变化率 所述自动识别的化验区域，将所述变化率与阈值进行比较，并且如果所述变化率大于所述阈值，则确定所述自动识别的化验区域是化验阳性的。

公开(公告)号：EP3230717A2

公开(公告)日：2017-10-18

申请号：EP15816337.8

申请日：2015-12-08

Applicant: Berkeley Lights, Inc.

Inventor： DU, Fenglei ,  LUNDQUIST, Paul ,  TENNEY, John ,  LIONBERGER, Troy A.

IPC: G01N21/64 ,  B01L3/00 ,  G01N15/14 ,  G01N15/00 ,  G01N21/05 ,  G01N21/17

CPC classification number: G06T7/0012 ,  B01L3/502761 ,  G01N15/1434 ,  G01N15/1463 ,  G01N15/1475 ,  G01N15/1484 ,  G01N21/6456 ,  G01N27/453 ,  G01N2015/0038 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2015/1445 ,  G01N2015/1486 ,  G01N2015/1493 ,  G01N2015/1497 ,  G01N2021/056 ,  G01N2021/1765 ,  G01N2201/0635 ,  G01N2201/127 ,  G06T5/50 ,  G06T2207/30024 ,  G06T2207/30101

Abstract: Methods are provided for the automated detection of micro-objects in a microfluidic device. In addition, methods are provided for repositioning micro-objects in a microfluidic device. In addition, methods are provided for separating micro-objects in a spatial region of the microfluidic device.

Abstract translation: 提供了用于在微流体装置中自动检测微物体的方法。 另外，提供了用于在微流体装置中重新定位微物体的方法。 另外，提供了用于分离微流体装置的空间区域中的微物体的方法。

公开(公告)号：EP2743685B1

公开(公告)日：2015-05-20

申请号：EP12196560.2

申请日：2012-12-11

Applicant: Ricoh Company Ltd. ,  Ricoh UK Products Limited

Inventor： Smith, Mark Anthony-Edward ,  Moule, David Jeffrey ,  Katsuji, Ogawa

IPC: G01N21/952 ,  G03G21/00

CPC classification number: G01N21/55 ,  G01N21/952 ,  G01N2201/0635 ,  G03G21/0094

公开(公告)号：EP2743685A1

公开(公告)日：2014-06-18

申请号：EP12196560.2

申请日：2012-12-11

Applicant: Ricoh Company Ltd. ,  Ricoh UK Products Limited

Inventor： Smith, Mark Anthony-Edward ,  Moule, David Jeffrey ,  Katsuji, Ogava

IPC: G01N21/952 ,  G03G21/00

CPC classification number: G01N21/55 ,  G01N21/952 ,  G01N2201/0635 ,  G03G21/0094

Abstract: An inspection method and apparatus for detecting and or measuring wear or damage in a photoconductor of an image forming apparatus capturing an image of a mask having contrasting light and dark parts reflected in the photoconductor. Intensities of areas of the image corresponding to the light and dark parts of the mask are compared to derive a measurement of the specular reflectance of the photoconductor which correlates to the amount of wear.

Abstract translation: 一种用于检测和/或测量图像形成装置的感光体中的磨损或损伤的检查方法和装置，其捕获具有在光电导体中反射的对比光和暗部分的掩模的图像。 对应于掩模的亮部和暗部的图像的区域的强度进行比较，以导出与磨损量相关的光电导体的镜面反射率的测量。

公开(公告)号：EP2413132A1

公开(公告)日：2012-02-01

申请号：EP11175020.4

申请日：2011-07-22

Applicant: VIT

Inventor： Perriollat, Mathieu

IPC: G01N21/88 ,  G01N21/956 ,  G01B11/25 ,  G06T3/40

CPC classification number: G01N21/956 ,  G01B11/2545 ,  G01N21/8851 ,  G01N2021/95638 ,  G01N2201/0635 ,  G01R31/308 ,  G06T1/0007

Abstract: L'invention concerne une installation d'inspection optique de circuits intégrés ou analogues, comportant : un convoyeur plan selon une première direction (X) des objets à analyser et un système de prise de vues placé à l'aplomb d'une zone du convoyeur et dans une position fixe par rapport à celui-ci, le système de prise de vues comportant au moins un premier ensemble de caméras numériques (22) comportant chacune un réseau matriciel orthogonal de pixels, lesdites caméras étant alignées dans une deuxième direction (Y) différente de la première, les caméras étant toutes orientées de sorte qu'une des directions orthogonales de leur réseau de pixels fasse un premier angle (α) avec la première direction

Abstract translation: 该装置具有沿待分析物体的第一方向（X）放置的平面输送器。 摄影系统（2）被放置在输送机的区域上方并且相对于输送机处于固定位置。 摄影系统包括一组数字照相机/图像传感器（22），其包括正交阵列的像素（222），其中照相机沿与第一方向不同的正交方向（Y，Y'）排列。 相机被定向成使得像素阵列的正交方向之一与第一方向形成角度（α）。 图像传感器从由电荷耦合器件（CCD）或互补金属氧化物半导体（CMOS）传感器组成的组中选择。

公开(公告)号：EP1978351B1

公开(公告)日：2011-11-30

申请号：EP08011345.9

申请日：1999-05-17

Applicant: Life Technologies Corporation

Inventor： Gambini, Michael R. ,  Atwood, John G. ,  Young, Eugene F. ,  Lakatos, Edward J. ,  Cerrone, Anthony L.

IPC: G01N21/64 ,  G01N21/03 ,  B01L7/00

CPC classification number: G01N21/6428 ,  B01L3/5085 ,  B01L7/52 ,  B01L2200/10 ,  B01L2300/0654 ,  B01L2300/0663 ,  B01L2300/1811 ,  C12Q1/686 ,  C12Q2545/101 ,  G01N21/0303 ,  G01N21/274 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6439 ,  G01N2021/6441 ,  G01N2021/6463 ,  G01N2021/6482 ,  G01N2201/0245 ,  G01N2201/06113 ,  G01N2201/0628 ,  G01N2201/0635 ,  G01N2201/0636 ,  G01N2201/068 ,  C12Q2563/107

公开(公告)号：EP1978351A3

公开(公告)日：2008-10-15

申请号：EP08011345.9

申请日：1999-05-17

Applicant: Applera Corporation

Inventor： Gambini, Michael R. ,  Atwood, John G. ,  Young, Eugene F. ,  Lakatos, Edward J. ,  Cerrone, Anthony L.

IPC: G01N21/64

CPC classification number: G01N21/6428 ,  B01L3/5085 ,  B01L7/52 ,  B01L2200/10 ,  B01L2300/0654 ,  B01L2300/0663 ,  B01L2300/1811 ,  C12Q1/686 ,  C12Q2545/101 ,  G01N21/0303 ,  G01N21/274 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6439 ,  G01N2021/6441 ,  G01N2021/6463 ,  G01N2021/6482 ,  G01N2201/0245 ,  G01N2201/06113 ,  G01N2201/0628 ,  G01N2201/0635 ,  G01N2201/0636 ,  G01N2201/068 ,  C12Q2563/107

Abstract: The invention relates to an optical instrument which is particularly suited for DNA PCR monitoring. The instrument comprises a plurality of spaced-apart reaction ingredient containers (1b), a light source (11) adapted to direct an excitation beam (22) toward the plurality of containers (1b), a field lens (3) disposed along an excitation beam path between the light source (11) and the plurality of containers (1b) and a detector (10) disposed along an excitation beam path and arranged to receive emission beams (26) emitted from the field lens (3) which is also disposed along an emission beam path between the plurality of containers (1b) and the detector (10).

公开(公告)号：EP1397671A2

公开(公告)日：2004-03-17

申请号：EP02800094.1

申请日：2002-09-18

Applicant: Carl Zeiss Microelectronic Systems GmbH

Inventor： DOBSCHAL, Hans-Jürgen ,  STEINER, Reinhard ,  BISCHOFF, Jörg

IPC: G01N21/55 ,  G01N21/21

CPC classification number: G01N21/55 ,  G01N21/211 ,  G01N21/4788 ,  G01N2021/4711 ,  G01N2021/4714 ,  G01N2021/4735 ,  G01N2021/4792 ,  G01N2201/0635

Abstract: The invention relates to a measuring array having a radiation source (10), a deflecting device (5) arranged downstream thereof, which can be hit by a ray (2) coming out of the radiation source (1) and which deflects said ray successively in time in different directions. Said array also comprises a first and a second optical device (9, 10) and a detector (6), wherein the first optical device (9) deflects the rays coming from the deflecting device (5) in the form of measuring rays to a point (P) of a sample (11) that is to be arranged in a measuring position in such a way that the angle of incidence of the measuring ray on the sample (11) varies depending on the direction. The sample rays coming out of the sample (11) due to the interaction between the measuring rays and the sample are deflected by the second optical device (10) onto the detector (11). At least one of the two optical devices (9, 10) has a diffracting element (7) for deflection, said element diffracting the incident rays coming from different directions in such a way that the rays diffracted in a given diffraction order are focused on a point (P, D).