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    Dopant-assisted direct analysis in real time mass spectrometry
    41.
    发明授权
    Dopant-assisted direct analysis in real time mass spectrometry 有权

    公开(公告)号：US09899196B1

    公开(公告)日：2018-02-20

    申请号：US15403108

    申请日：2017-01-10

    Applicant: JEOL USA, INC

    Inventor： Robert B. Cody

    IPC: H01J49/00

    CPC classification number: H01J49/0031 ,  H01J49/0045 ,  H01J49/0077 ,  H01J49/142

    Abstract: The present invention is directed to a method of Direct Analysis in Real Time (DART) analysis with a carrier gas in the addition of an efficient dopant to the carrier gas stream exiting the DART source. Charge-exchange and proton transfer reactions are observed with the addition of dopants such as toluene, anisole, and acetone. The argon DART mass spectrum in the presence of an efficient dopant was dominated by molecular ions for aromatic compounds, whereas the helium DART mass spectrum of the same aromatic showed both molecular ions and protonated molecule species. Fragment ions generated from analysis with argon gas in the presence of an efficient dopant can be used to distinguish isobaric analytes.

    MASS SPECTROMETER
    43.
    发明申请
    MASS SPECTROMETER 审中-公开

    公开(公告)号：US20170236699A1

    公开(公告)日：2017-08-17

    申请号：US15502533

    申请日：2014-08-20

    Applicant: Shimadzu Corporation

    Inventor： Hiroko UEDA ,  Takeshi UCHIDA

    IPC: H01J49/16 ,  H01J49/02

    CPC classification number: H01J49/165 ,  H01J49/0031 ,  H01J49/025 ,  H01J49/142

    Abstract: Before a sample is pierced with a probe of a PESI ion source, a total ion current is measured under a condition with no voltage applied from a high voltage generator to the probe as well as under a condition with the voltage applied. If the probe is properly attached to the holder, a considerable difference in total ion current occurs between the period with no voltage applied and the period with the voltage applied. By comparison, if the probe is improperly attached, no significant difference in the total ion current occurs between the period with no voltage applied and the period with the voltage applied. Referring to a threshold determined under the normal condition, a probe attachment checker detects an insufficient attachment of the probe by checking the difference in the total ion current, and displays an error message on a display unit if an improper attachment is detected.

    Device for mass spectrometry
    46.
    发明申请
    Device for mass spectrometry 有权
    质谱仪

    公开(公告)号：US20170025264A1

    公开(公告)日：2017-01-26

    申请号：US15218732

    申请日：2016-07-25

    Applicant: TESCAN Brno, s.r.o.

    Inventor： Libor Sedlacek ,  Jaroslav Jiruse

    IPC: H01J49/40 ,  H01J49/14 ,  H01J49/04

    CPC classification number: H01J49/401 ,  G01N23/2258 ,  H01J37/26 ,  H01J49/142

    Abstract: A device for mass spectrometry in continuous operation can be equipped with a focused electron beam source or laser radiation source. It can further include a vacuum chamber, a stage for placing the specimen, and an ion beam column with a plasma source for producing a primary ion beam and a secondary ion mass spectrometer for secondary ion analysis. The ion beam column is connected to an inert gas source and to a reactive gas source and is modified for simultaneous introduction of at least two gases from the inert gas source and reactive gas source. The secondary ion mass spectrometer is of an orthogonal Time-of-Flight type to ensure the function with the ion beam column in continuous operation.

    Abstract translation: 在连续操作中用于质谱的装置可以配备聚焦电子束源或激光辐射源。 它还可以包括一个真空室，一个用于放置试样的载物台和一个用于产生一次离子束的等离子体源的离子束柱和用于二次离子分析的二次离子质谱仪。 离子束柱连接到惰性气体源和反应气体源，并被修改为同时引入来自惰性气体源和反应气体源的至少两种气体。 二次离子质谱仪具有正交飞行时间，以确保连续运行时离子束柱的功能。

    Impactor Spray Atmospheric Pressure Ion Source with Target Paddle
    48.
    发明申请
    Impactor Spray Atmospheric Pressure Ion Source with Target Paddle 有权
    具有目标桨的冲击喷雾大气压离子源

    公开(公告)号：US20160365232A1

    公开(公告)日：2016-12-15

    申请号：US15121508

    申请日：2015-02-26

    Applicant: Micromass UK Limited

    Inventor： Stevan Bajic

    IPC: H01J49/04 ,  H01J49/14 ,  H01J49/00

    CPC classification number: H01J49/045 ,  H01J49/0031 ,  H01J49/0445 ,  H01J49/142 ,  H01J49/16

    Abstract: An ion source is provided comprising one or more nebulisers and one or more targets, wherein the one or more nebulisers are arranged and adapted to emit, in use, a stream predominantly of droplets which are caused to impact upon the one or more targets and to ionise the droplets to form a plurality of ions. The ion source further comprises one or more electrodes arranged adjacent to and/or attached to the one or more targets wherein the one or more electrodes comprise one or more apertures, notches or cut-outs wherein at least some of the plurality of ions pass, in use, through the one or more apertures, notches or cut-outs.

    Abstract translation: 提供了包括一个或多个雾化器和一个或多个靶的离子源，其中所述一个或多个雾化器被布置和适于在使用中发射主要由液滴引起的流动，所述液滴被流过所述一个或多个靶，并且 电离液滴以形成多个离子。 离子源还包括一个或多个电极，其布置成邻近于和/或连接到一个或多个靶，其中一个或多个电极包括一个或多个孔，切口或切口，其中多个离子中的至少一些通过， 在使用中，通过一个或多个孔，切口或切口。

    Sputter neutral particle mass spectrometry apparatus with optical element
    49.
    发明授权
    Sputter neutral particle mass spectrometry apparatus with optical element 有权
    具有光学元件的溅射中性粒子质谱仪

    公开(公告)号：US09431229B2

    公开(公告)日：2016-08-30

    申请号：US14643682

    申请日：2015-03-10

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Toma Yorisaki ,  Reiko Saito ,  Haruko Akutsu

    IPC: H01J49/14 ,  H01J49/16 ,  H01J49/04

    CPC classification number: H01J49/161 ,  H01J49/0409 ,  H01J49/0459 ,  H01J49/142 ,  H01J49/162

    Abstract: A sputter neutral particle mass spectrometry apparatus includes a sample table holding a sample which is a mass spectrometry target, an ion beam irradiation device which irradiates an ion beam on the sample held by the sample table to generate neutral particles in an adjacent region of the sample, a light beam irradiation device which irradiates a light beam on the neutral particles positioned in the adjacent region to obtain photoexcited ions, a draw-out electrode which draws out the photoexcited ions, a mass spectrometer which draws in the drawn out photoexcited ions to perform mass analysis, and an optical element which is provided in a light path after the light beam passes the adjacent region, and changes a traveling direction of the light beam so that the light beam passes the adjacent region again.

    Abstract translation: 溅射中性粒子质谱仪装置包括：样品台，其保持作为质谱分析对象的样品;离子束照射装置，其将离子束照射在由样品台保持的样品上，以在样品的相邻区域产生中性粒子 光束照射装置，其将位于相邻区域的中性粒子上的光束照射以获得光激发离子;拉出光激发离子的拉出电极;抽出被引出的光激发离子进行表征的质谱仪; 质量分析，以及在光束通过相邻区域之后设置在光路中的光学元件，并且改变光束的行进方向，使得光束再次通过相邻区域。

    System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis
    50.
    发明授权
    System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis 有权
    液体萃取电喷辅助样品转移到化学分析溶液的系统和方法

    公开(公告)号：US09390901B2

    公开(公告)日：2016-07-12

    申请号：US14529307

    申请日：2014-10-31

    Applicant: UT-Battelle, LLC

    Inventor： Vilmos Kertesz ,  Gary J. Van Berkel

    IPC: H01J49/04 ,  H01J49/16 ,  H01J49/26

    CPC classification number: H01J49/167 ,  H01J49/04 ,  H01J49/0431 ,  H01J49/142 ,  H01J49/26

    Abstract: A system for sampling a surface includes a surface sampling probe comprising a solvent liquid supply conduit and a distal end, and a sample collector for suspending a sample collection liquid adjacent to the distal end of the probe. A first electrode provides a first voltage to solvent liquid at the distal end of the probe. The first voltage produces a field sufficient to generate electrospray plume at the distal end of the probe. A second electrode provides a second voltage and is positioned to produce a plume-directing field sufficient to direct the electrospray droplets and ions to the suspended sample collection liquid. The second voltage is less than the first voltage in absolute value. A voltage supply system supplies the voltages to the first electrode and the second electrode. The first electrode can apply the first voltage directly to the solvent liquid. A method for sampling for a surface is also disclosed.

    Abstract translation: 用于对表面进行采样的系统包括包括溶剂液体供应管道和远端的表面采样探针以及用于将样品收集液体悬挂在探针的远端附近的样品收集器。 第一电极在探针的远端处向溶剂液体提供第一电压。 第一电压产生足以在探针的远端产生电喷雾羽流的场。 第二电极提供第二电压并且被定位成产生足以将电喷雾液滴和离子引导到悬浮样品收集液体的羽流引导场。 第二电压小于绝对值中的第一电压。 电压供应系统将电压提供给第一电极和第二电极。 第一电极可以将第一电压直接施加到溶剂液体上。 还公开了一种用于表面采样的方法。

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