Abstract:
There is provided a time-series conversion pulse spectrometer capable of easily performing time-series conversion pulse spectrometer measurement of various samples and their states in a short time. The time-series conversion pulse spectrometer includes: a pulse laser light source; division means for dividing the pulse laser beam from the pulse laser light source into an excitation pulse laser beam and a detection pulse laser beam; detection means; a sample holding section for holding a sample; and a sample section incoming/outgoing optical system. The time-series conversion pulse spectrometer is characterized by further including: optical path length modifying means for setting at least one measurement light range arranged in the incident side optical path from the division means to the pulse light emitting means and/or the detection side optical path from the division means to the detection means; and optical delay means for measuring at least one time-series signal arranged in the incident side optical path from the division means to the pulse light emitting means and/or the detection side optical path from the division means to the detection means.
Abstract:
The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two-dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterised in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60, 66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.
Abstract:
A spectroscopy system (500) is provided which operates in the vacuum ultra-violet spectrum. More particularly, a system utilizing reflectometry techniques in the vacuum ultraviolet spectrum is provided for use in metrology applications. To ensure accurate and repeatable measurement, the environment of the optical paths (506, 508) is controlled to limit absorption effects of gases that may be present in the optical path. To account for absorption effects that may still occur, the length of the optical path is minimized. To further account for absorption effects, the reflectance data may be referenced to a relative standard.
Abstract:
The invention relates to a spectrometer assembly (10) containing: a radiation source (11) with a continuous spectrum; a pre-monochromator (2) for generating a spectrum with relatively little linear dispersion, from which a spectral segment can be selected, whose spectral bandwidth is less than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum, for which the mean wavelength of the selected spectral segment can be measured with a maximum blaze efficiency; an echelle spectrometer (4) comprising means for wavelength calibration; an entry slit (21) on the pre-monochromator (2) and an intermediate slit assembly (3) comprising an intermediate slit and a local resolution radiation receiver (5) on the exit plane of the spectrometer for detecting wavelength spectra. The assembly is characterised in that the width of the intermediate slit (3) is greater than the monochromatic image of the entry slit generated by the pre-monochromator at the location of the intermediate slit and that means are provided for calibrating the pre-monochromator, by means of which the radiation that is reproduced in the detector of the radiation source with a continuous spectrum can be calibrated to a reference position.
Abstract:
Bei einem Zweistrahlphotometer, enthaltend eine Lichtquelle (10), Detektormittel, einen Probenbereich (44), optische Mittel (16,40,46,36) zum Leiten eines von der Lichtquelle (10,58) ausgehenden Lichtbündels (14) als Meßlichtbündel (34) durch den Probenbereich (44) hindurch auf die Detektormittel, Mittel (16,36) zum Leiten des gleichen Lichtbündels (14) als Referenzlichtbündel (32) unter Umgehung des Probenbereichs (44) auf die Detektormittel und Choppermittel in Meß und Referenzlichtbündel, durch welche der Strahlengang des von der Lichtquelle (10) ausgehenden Lichtbündels (14) in einen Strahlengang des Meßlichtbündels (34) und in einen Strahlengang des Referenzlichtbündels an einer Aufspaltstelle aufspaltbar ist und diese Strahlengänge, nachdem des Meßlichtbündel (34) durch den Probenbereich (44) hindurchgetreten ist, an einer Rekombinationsstelle wieder zu einem Strahlengang rekombinierbar, sind, liegen Aufspaltstelle und Rekombinationsstelle räumlich dicht beieinander. Die Choppermittel weisen einen einzigen Chopper (20) auf, der gleichzeitig die Aufspaltung und Rekombination von Meß- und Referenzlichtbündel (34 bzw. 32) bewirkt.
Abstract:
The system is provided with a first branch (10, 12) and a second branch (14) which receive light from a sample and reference target respectively. A shutter (22) sequentially allows light from the two branches to pass to a mirror (20) having a slit (30), reflective portions (32) and transparent portions (34). Light from the first branch passes through portions (30) and (34) to a detecting branch (42, 46, 50-56) and some light is reflected through a lens (16) to eye piece (19). Similarly some light from the second branch passes through mirror (30) and (34) to eye piece (19) and some light is reflected to the detecting branch. Accordingly the measunngfield can be accurately identified by looking through the eye piece (19) whilst at the same time light is directed to the detecting branch for analysis.
Abstract:
A dual beam spectrophotometer includes a radiation chopper (5) and a monochromator (3) which includes a diffraction grating driven by a stepper motor. The chopper (5) includes a gate pulse generator (24) which produces gate pulses Gs and G R which correspond to periods during which radiation from the source (2) passes through a sample cell (19) and a reference cell (14) respectively. A stepper motor drive circuit (134) produces pulses to step the stepper motor which are synchronised with the chopping cycle by means of the G R and Gs pulses. The stepper motor is arranged to step an equal number of times in each half of a chopping cycle. A further condition which is preferably satisfied is that the first pulse of a sequence should start in the opposite half of the chopping cycle from that in which the first pulse started in a previous chopping cycle. At low stepping rates the motor will step twice in one chopping cycle and then pause for several cycles before again stepping twice.