AMORPHOUS OXIDE AND FIELD EFFECT TRANSISTOR

    公开(公告)号:CA2585190A1

    公开(公告)日:2006-05-18

    申请号:CA2585190

    申请日:2005-11-09

    Abstract: A novel amorphous oxide film applicable, for example, to an active layer of a TFT is provided. The amorphous oxide film has an electron carrier concentration of less than 10 18 /cm 3 at a temperature of 25° C, wherein the amorphous oxide is any one selected from the group consisting of an oxide containing In, Zn, and Sn; an oxide containing In and Zn; an oxide containing In and Sn; and an oxide containing In, Zn, and Ga. The oxide comprises one type of element or a plurality of elements selected from the group consisting of Li, Na, Mn, Ni, Pd, Cu, Cd, C, N, and P; or at least one element selected from the group consisting of Ti, Ru, and F.

    53.
    发明专利
    未知

    公开(公告)号:DE69814751D1

    公开(公告)日:2003-06-26

    申请号:DE69814751

    申请日:1998-07-24

    Applicant: CANON KK

    Inventor: SANO MASAFUMI

    Abstract: A photovoltaic device is provided which comprises a back reflection layer, a zinc oxide layer and a semiconductor layer stacked in this order on a substrate, wherein the zinc oxide layer contains a carbohydrate. The content of the carbohydrate is preferably in the range of from 1 mu g/cm to 100 mg/cm . Thereby, the zinc oxide layer can be formed without abnormal growth to have a rough surface to achieve sufficient optical confinement effect, and the photovoltaic device is improved in the durability and the photoelectric conversion efficiency.

    54.
    发明专利
    未知

    公开(公告)号:DE69330990T2

    公开(公告)日:2002-04-04

    申请号:DE69330990

    申请日:1993-11-11

    Applicant: CANON KK

    Abstract: An object of the present invention is to provide a photoelectrical conversion device in which re-combination of carriers excited by light is prevented and the open voltage and the carrier range of positive holes are improved and to provide a generating system using the photoelectrical conversion device. The photoelectrical conversion device includes a p-layer, an i-layer, and an n-layer, wherein the photoelectrical conversion device being formed by stacking the p-layer, the i-layer and the n-layer each of which is made of non-single-crystal silicon semiconductor, the i-layer contains germanium atoms, the band gap of the i-layer is smoothly changed in a direction of the thickness of the i-layer, the minimum value of the band gap is positioned adjacent to the p-layer from the central position of the i-layer and both of a valence control agent to serve as a donor and another valence control agent to serve as an acceptor are doped into the i-layer. Further, at least either of the p-layer or the n-layer is formed into a stacked structure consisting of a layer mainly composed of group III elements of the periodic table and/or group V elements of the same and a layer containing the valence control agent and mainly composed of silicon atoms.

    55.
    发明专利
    未知

    公开(公告)号:ES2164816T3

    公开(公告)日:2002-03-01

    申请号:ES96115386

    申请日:1996-09-25

    Applicant: CANON KK

    Abstract: A method for producing a photovoltaic device comprises a base member (190) comprising a substrate (100) and a superposingly formed thereon a reflecting layer (101) and a reflection enhancing layer (102), and a pin structure formed of an n-type (103), i-type (104) and p-type (105) semiconductor layers containing silicon atoms and being non-single crystal as crystal structure, the pin structure being repeated at least once on said base member. The method comprises the steps of (a) depositing a material constituting the reflecting layer, at a substrate temperature of from 200 to 500 DEG C to form the reflecting layer; (b) lowering after the step (a) the substrate temperature to 100 DEG C or below; and (c) depositing after the step (b) a material constituting the reflection enhancing layer, on the reflecting layer at a substrate temperature of from 200 to 400 DEG C to form the reflection enhancing layer.

    Pin junction photovoltaic device having an i-type a-SiGe semiconductor layer with a maximal point for the Ge content

    公开(公告)号:AU656067B2

    公开(公告)日:1995-01-19

    申请号:AU3690293

    申请日:1993-04-14

    Applicant: CANON KK

    Abstract: A pin junction photovoltaic device comprising a substrate and a pin junction semiconductor active layer region disposed on said substrate, said pin junction semiconductor active layer region comprising a p-type semiconductor layer (105) composed of a p-type non-single crystalline semiconductor material, an i-type semiconductor layer composed of an i-type non-single crystalline semiconductor material, and an n-type semiconductor layer (103) composed of an n-type non-single crystalline semiconductor material, characterized in that (a) a buffer layer (118) comprising a non-single crystalline silicon semiconductor material substantially not containing germanium atoms is interposed between said p-type semiconductor layer and said i-type semiconductor layer, (b) a buffer layer (117) comprising a non-single crystalline silicon semiconductor material substantially not containing germanium atoms is interposed between said i-type semiconductor layer and said n-type semiconductor layer, and said i-type semiconductor layer is formed of an amorphous silicon germanium semiconductor material containing the germanium atoms in an amount of 20 to 70 atomic % in the entire region in which the concentration distribution of the germanium atoms in the thickness direction is varied while providing a maximum concentration point.

    Photoelectrical conversion device and generating system using the same

    公开(公告)号:AU5068293A

    公开(公告)日:1994-05-26

    申请号:AU5068293

    申请日:1993-11-12

    Applicant: CANON KK

    Abstract: An object of the present invention is to provide a photoelectrical conversion device in which re-combination of carriers excited by light is prevented and the open voltage and the carrier range of positive holes are improved and to provide a generating system using the photoelectrical conversion device. The photoelectrical conversion device includes a p-layer, an i-layer, and an n-layer, wherein the photoelectrical conversion device being formed by stacking the p-layer, the i-layer and the n-layer each of which is made of non-single-crystal silicon semiconductor, the i-layer contains germanium atoms, the band gap of the i-layer is smoothly changed in a direction of the thickness of the i-layer, the minimum value of the band gap is positioned adjacent to the p-layer from the central position of the i-layer and both of a valence control agent to serve as a donor and another valence control agent to serve as an acceptor are doped into the i-layer. Further, at least either of the p-layer or the n-layer is formed into a stacked structure consisting of a layer mainly composed of group III elements of the periodic table and/or group V elements of the same and a layer containing the valence control agent and mainly composed of silicon atoms.

    Photoelectric Conversion Element and Power Generation System Using the Same

    公开(公告)号:CA2102948A1

    公开(公告)日:1994-05-17

    申请号:CA2102948

    申请日:1993-11-12

    Applicant: CANON KK

    Abstract: The present invention is directed to provide a photovoltaic element in which the open-circuit voltage and the carrier range of holes are improved by preventing the recombination of photoexcited carriers. The photovoltaic element composed of a p-type layer, an i-type layer of a lamination structure consisting of an i-type layer by RFPCVD on the p-type layer side and an i-type layer by microwave ( mu W) PCVD on the n-type layer side, or an i-type layer by microwave ( mu W) PCVD on the p-type layer side and an i-type layer by RFPCVD on the n-type layer side, characterized in that the i-type layer by mu WPCVD is one formed by a mu WPCVD in which a lower mu W energy and a higher RF energy than mu W energy to decompose source gas at 100% are simultaneously applied to a source gas containing Si and Ge at a pressure of 50mTorr or less, such that the minimum values of bandgap is biased toward the p-type layer side off the center of the i-type layer, and the i-type layer by RFPCVD is one formed 30nm thick or less by a RFPCVD using a source gas containing a silicon containing gas at a deposition rate of 2nm/sec or less.

    Pin junction photovoltaic device having an i-type a-SiGe semiconductor layer with a maximal point for the Ge content

    公开(公告)号:AU3690293A

    公开(公告)日:1993-10-21

    申请号:AU3690293

    申请日:1993-04-14

    Applicant: CANON KK

    Abstract: A pin junction photovoltaic device comprising a substrate and a pin junction semiconductor active layer region disposed on said substrate, said pin junction semiconductor active layer region comprising a p-type semiconductor layer (105) composed of a p-type non-single crystalline semiconductor material, an i-type semiconductor layer composed of an i-type non-single crystalline semiconductor material, and an n-type semiconductor layer (103) composed of an n-type non-single crystalline semiconductor material, characterized in that (a) a buffer layer (118) comprising a non-single crystalline silicon semiconductor material substantially not containing germanium atoms is interposed between said p-type semiconductor layer and said i-type semiconductor layer, (b) a buffer layer (117) comprising a non-single crystalline silicon semiconductor material substantially not containing germanium atoms is interposed between said i-type semiconductor layer and said n-type semiconductor layer, and said i-type semiconductor layer is formed of an amorphous silicon germanium semiconductor material containing the germanium atoms in an amount of 20 to 70 atomic % in the entire region in which the concentration distribution of the germanium atoms in the thickness direction is varied while providing a maximum concentration point.

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