公开(公告)号：JPH0262822B2

公开(公告)日：1990-12-26

申请号：JP13345679

申请日：1979-10-15

Applicant: SHIMADZU CORP

Inventor： FURUSAWA KAZUO ,  TSUNASAWA YOSHIO

IPC: G01N21/75 ,  C12M1/34 ,  G01N21/27 ,  G01N21/79 ,  G01N33/573

公开(公告)号：JPH0254489B2

公开(公告)日：1990-11-21

申请号：JP13465480

申请日：1980-09-27

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  NISHIMURA TAKASHI ,  TAIRA RIKUO

IPC: G01J3/427 ,  G01J3/42 ,  G01N21/31

公开(公告)号：JPH02226068A

公开(公告)日：1990-09-07

申请号：JP4789989

申请日：1989-02-27

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  TAIRA RIKUO

IPC: G01N33/543

Abstract: PURPOSE:To facilitate random access by a method wherein an active part provided with an antibody or an antigen immobilized is provided at the tip of a tubular object with a hole at the tip not closed. CONSTITUTION:A mentioned substrate is used being put into a reaction tube 10 with an active part 4 located in a lower section. When reactant solution 14 is injected into the reaction tube 10, with a nozzle 12 put against the upper end of a tubular object 2, the reactant solution 14 can be separately injected from the nozzle 12 and the reactant solution also can be stirred with air by blowing air into the reactant solution. When the active part 4 is a porous material or a fine tubular material, by increasing/decreasing pressure inside the tubular object 2 by the nozzle 12, the reactant solution 14 can be forced to move at the active part 4 to increase reaction speed.

公开(公告)号：JPS63168520A

公开(公告)日：1988-07-12

申请号：JP31325986

申请日：1986-12-29

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO

IPC: G01J3/443 ,  G01N21/64

Abstract: PURPOSE:To simultaneously measure the three-dimensional spectra of fluorescent intensities without performing mechanical scanning at all if a two-dimensional array is used as a detector, by constituting each of an exciting side spectroscope and a fluorescent side spectroscope of a polychromerter and allowing the dispersing direction of both spectroscopes to cross each other at a right angle. CONSTITUTION:The light from a light source 2 is projected on a diffraction grating 22 through an inlet slit 26 to be spectrally diffracted in said grating 22 and the exciting light dispersed in a vertical direction A is allowed to irradiate the specimen in a specimen cell 6 through a slit 28. The fluorescence generated from the specimen is spectrally diffracted by a diffraction grating 24 through the inlet slit of a fluorescent side spectroscope to be dispersed in a horizontal direction B. The fluorescent intensity 33 on two-dimensional orthogonal coordinates, wherein the wavelength lambdaex of the exciting light is set to one coordinates and the wavelength lambdaem of fluorescence is set to the other coordinates, is obtained on a two-dimensional photodiode array detector 32. Herein, each of the square measures of a detector 32 is allowed to correspond to each of array elements. By this constitution, a spectral fluorescent spectrometer capable of obtaining both of an exciting spectrum and a fluorescent spectrum is formed.

公开(公告)号：JPS63168519A

公开(公告)日：1988-07-12

申请号：JP31326086

申请日：1986-12-29

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  GOTO SEIJI ,  SATO TATSUMI

IPC: G01J3/18

Abstract: PURPOSE:To obtain a monochrometer having high refraction efficiency over a wide range of a wavelength region, by constituting the monochrometer of a main spectroscope having high resolving power and the pre-spectroscope having low resolving power connected to said main spectroscope in series and using a plane diffraction spparatus as the dispersing element of the pre-spectroscope. CONSTITUTION:A monochrometer is constituted of a main spectroscope 12 having high resolving power and a pre-spectroscope 4 having low resolving power, the light from a light source 16 is projected on a condensing mirror 26 through the inlet slit 24 of the pre-spectroscope 14 and the reflected light is allowed to be incident to a plane diffraction lattice 8 being a composite diffraction lattice having a plurality of blaze parts. This lattice 18 is supported by a support member 20 and made rotatable around shaft 22 but the shaft 22 is provided at a position shifted from the surface of the diffraction lattice. Further, each of the blaze parts is constituted of a blaze part 18a of 250nm and a blaze part 18b of 550nm and the reflected light from the lattice 18 is allowed to pass through the spectroscope 12, which has a concave mirror 32, a diffraction lattice 30 and a concave mirror 34 mounted therein, through the outlet slit 28 of the spectroscope 12 to be discharged to the outside from an outlet slit 36.

公开(公告)号：JPS6388413A

公开(公告)日：1988-04-19

申请号：JP23406586

申请日：1986-09-30

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  OKUBO KUNIHIKO

IPC: G01J1/42 ,  G01J1/44 ,  G01J3/02 ,  G01N21/27

Abstract: PURPOSE:To enable the switching of the photometry sensitivity of a sample light, by using a silicon photocell as monitoring photo detector while an input conversion circuit is provided with a means which is allowed to select the variation of an output level with respect to the same input. CONSTITUTION:This apparatus is made up of a photoelectric multiplier tube P1 which measures reflected lights from a TLC plate 3 as sample, a photomultiplier tube P2 for measuring a sample transmission light, a monitoring silicon photosell 7 and an input conversion circuit 9 which converts an output of the cell 7 into a negative high voltage to be applied to dinodes of the tubes P1 and P2. The circuit 9 converts an output current (i) of the cell 7 logarithmically, multiplies an output thereof by a fixed number to output the results after the addition of a constant to the output and the output (v) finally obtained is converted 7 into a negative high voltage V proportionally. Thus, an output of the cell 7 is applied to the multiplier tubes P1 and P2 for measuring a sample light through the circuit 9 to switch the input characteristic of the conversion circuit with the compensation for changes in a sample incident light. This can stabilize the operation of a monitor photometry system even in the switching of the sample light photometry system over to a high sensitivity.

公开(公告)号：JPS6385414A

公开(公告)日：1988-04-15

申请号：JP23391486

申请日：1986-09-30

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO

IPC: G01J3/08 ,  G01J3/42 ,  G01N21/25

Abstract: PURPOSE:To speedily measure plural samples by providing plural sample cells in the sample chamber of a spectrophotometer, irradiating those samples with measurement light in parallel or successively by switching, and detecting transmitted light in order. CONSTITUTION:Light from a light source 6 is dispersed by a spectroscope 8 to illuminate the six sample cells 4-1-4-6 in parallel through an optical fiber 12. Light beams passing through the cells are detected by detectors 10-1-10-6. The output signals of the detectors are amplified and integrated by amplifying and integration circuits 14-1-14-6 and applied to and converted by an A/D converter 18 in order through a multiplexer 16 into digital values, which are outputted to a data processing part. This multibeam constitution is employed to measure the plural samples at a high speed.

公开(公告)号：JPS6315535B2

公开(公告)日：1988-04-05

申请号：JP4252980

申请日：1980-03-31

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO ,  NISHIMURA TAKASHI ,  ICHIKAWA TETSUO

IPC: G01N21/27 ,  G01J3/02 ,  G01J3/42

公开(公告)号：JPS6238648B2

公开(公告)日：1987-08-19

申请号：JP14413676

申请日：1976-11-30

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO

IPC: G01N21/27 ,  G01J3/42 ,  G01N21/00 ,  G01N21/31 ,  G01N21/75

公开(公告)号：JPS62113033A

公开(公告)日：1987-05-23

申请号：JP25357285

申请日：1985-11-12

Applicant: SHIMADZU CORP

Inventor： TSUNASAWA YOSHIO

IPC: G01N21/27 ,  G01J3/42

Abstract: PURPOSE:To enable measurement of different kinds of samples, by setting optical systems for 2 luminous fluxes to be nonequivalent to each other to enable the setting of sample on any luminous flux side. CONSTITUTION:Light of a light source 2 serves as a sample luminous flux 42 over a long optical path via a focusing mirror 4, a slit 6, a diffraction grating 8, a slit 10, a halfmirror 14 and a reflection mirror 40. On the other hand, a part of a light from the halfmirror 14 serves as control luminous flux 50 short in the optical path length with reflection mirrors 46 and 48. The individual lights are detected with detectors 34 and 36 via lenses 54 and 56 and amplified with preamplifiers 58S and 58R. When measuring a macro material, material is housed into a material chamber 44. A changeover switch 6 is set on the solid side to measure. In the measurement of micro material, the material is placed into the material chamber 5 and the switch 6 is set on the broken line to measure.