Abstract:
분광조립체는분광기를포함할수 있다. 상기분광기는샘플을조명하기위한광을생성하는조명소스를포함할수 있다. 상기분광기는상기샘플을조명하는광으로부터상기샘플에의해반사된광에기초하여분광측정을얻기위한센서를포함할수 있다. 상기분광조립체는상기샘플로부터반사된광을전달하기위한광 파이프를포함할수 있다. 상기광 파이프는상기분광기를수용하기위한제1 개구를포함할수 있다. 상기광 파이프는상기샘플이상기광 파이프에의해에워싸이도록상기샘플을수용하기위한제2 개구, 및상기샘플이상기제2 개구에수용될때 베이스표면을포함할수 있다. 상기광 파이프는상기조명소스와상기센서를상기샘플과정렬시키는것과관련될수 있다.
Abstract:
A unit for measurement of absorbance using a microchip has a microchip with a continuous cavity, a sample chamber, a reagent chamber, a reagent mixing chamber and a chamber for measuring absorbance, which is arranged in a straight line in the area of the continuous cavity. The microchip is located in a chip holder which has a capillary part which is arranged such that the light used to measure absorbance is delivered through the capillary part to the chamber for measuring absorbance, the capillary part having a smaller opening diameter than the diameter of the cross section which is perpendicular to the optical axis of the chamber for measuring absorbance.
Abstract:
Analysengerät zur gleichzeitigen Bestimmung von mehreren Gasen oder Flüssigkeiten, basierend auf der Absorptionsspektroskopie im Ultravioletten, mit einer Xenon-Blitzlampe, einer Probenküvette und einem Spektrometer, bestehend aus Eintrittsspalt, konkavem Reflexionsgitter und einer Detektorzeile. Der Eintrittsspalt und die Detektorzeile sind verschiebbar auf einem Halbkreis angeordnet. Das Licht der Blitzlampe wird direkt von einem Quarzstab ohne abbildende Optik eingefangen. Durch dieses Analysensystem können mehrere chemische Komponenten gleichzeitig und kontinuierlich im Ultravioletten bestimmt werden. Die verwendete Lichtquelle samt Transferoptik gewährleistet dabei eine lange Standzeit und eine konstante Basislinie.
Abstract:
Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which controlled light rays are directed along a transmission path from a light source (32) through a plurality of light traps (44) to expose or illuminate a specimen and nonspecular reflected light is passed from the specimen (42) through the light traps (44) along a transmission path to one or more detectors (36) where the nonspecular reflected light is measured, the detector's field of view being larger than the illuminated area of the specimen (42) over a wide range of specimen to source (32) and detector (36) distances.
Abstract:
Reflectance apparatus is disclosed for obtaining the measurement of reflected light in which a light trap is positioned in the light path between the specimen and the detector to minimize stray light reflected from the specimen being analyzed as light from the light source is reflected from the specimen to the detector.
Abstract:
A spectroscopic assembly (165) may include a spectrometer (110). The spectrometer may include an illumination source to generate a light to illuminate a sample. The spectrometer may include a sensor to obtain a spectroscopic measurement based on light, reflected by the sample, from the light illuminating the sample. The spectroscopic assembly may include a light pipe (120) to transfer the light reflected from the sample. The light pipe may include a first opening (146) to receive the spectrometer. The light pipe may include a second opening (148) to receive the sample, such that the sample is enclosed by the light pipe and a base surface when the sample is received at the second opening. The light pipe may be associated with aligning the illumination source and the sensor with the sample.
Abstract:
The optical head 41 includes first and second members 51, 61 and a tubular member 71. The first member 51 has first to fifth hole portions 52-56 continuously formed so as to penetrate the first member 51. The second member 61 has sixth to eighth hole portions 62-64 continuously formed so as to penetrate the second member 61. This second member 61 is housed in the fifth hole portion 56 and fixed to the first member 51. The tubular member 71 has a first tube portion 72 and a second tube portion 73. The tubular member 71 is housed in the fourth hole portion 55. The lens 27 is sandwiched and fixed between the first tube portion 72 and a step portion formed at a border portion between the second hole portion 53 and the third hole portion 54. The beam shaping member 25 is sandwiched and fixed between the second member 61 and a step portion formed at a border portion between the fourth hole portion 55 and the fifth hole portion 56.