-
公开(公告)号:ES253429A1
公开(公告)日:1960-01-16
申请号:ES253429
申请日:1959-10-29
Applicant: APPLIED RES LAB INC
IPC: F04A
-
公开(公告)号:ITMI20090343A1
公开(公告)日:2010-01-10
申请号:ITMI20090343
申请日:2009-03-09
Applicant: NAT APPLIED RES LAB IES
Inventor: TSAI KEH-CHYUAN , WEI CHIH-YU
-
公开(公告)号:FR2567646A1
公开(公告)日:1986-01-17
申请号:FR8411418
申请日:1984-07-16
Applicant: APPLIED RES LAB
Inventor: SLICKERS KARL
Abstract: This method consists in subjecting the surface of the metal to an electrical discharge under an inert atmosphere and in simultaneously recording, as a function of time, the spectral response emitted. Before recording, the sample to be analysed is covered with an electrically conducting layer. This conducting layer is produced in situ, before the analysis, by reverse polarity electrical discharge.
-
公开(公告)号:FR2504264A1
公开(公告)日:1982-10-22
申请号:FR8108144
申请日:1981-04-16
Applicant: APPLIED RES LAB
Inventor: VOGEL WILFRIED , CHENUZ JEAN-MARC
Abstract: A arrangement uses a series of secondary slits which are mounted on a Rowland circle with a concave system and the primary slit. Luminous detectors in the form of photomultipliers are located behind the secondary slits. A mark allows only light to enter a photomultiplier from a narrow slit facing a secondary slit. The photo multiplier has a photocathode which is aligned with the concave system. As the primary slit is moved, the spectral displacement occurs. This movement is controlled from a calculator which also controls the position of the photomultiplier, the photo multiplier is mounted on a cam in order that its axis remains aligned with the centre of the concave system.
-
公开(公告)号:DE2437310A1
公开(公告)日:1976-02-19
申请号:DE2437310
申请日:1974-08-02
Applicant: APPLIED RES LAB
Inventor: SLICKERS KARL
IPC: G01J3/02
Abstract: The plate cut from a quartz crystal plate (15) whose sides and its sides are optically flat and are perpendicular to the light path. The spectrum is produced by an electric arc struck between electrodes (10) enclosed in a chamber (3). A current of argon is admitted to the chamber through a pipe (8) and leaves through a second pipe (9). The light from the arc enters the vacuum spectrometer (2) through the quartz plate and falls on a diffraction grating (6). Light diffracted from the grating falls on a photocell (7). A vacuum pump (4) of normal pattern is connected to the spectrometer by a pipe (4).
-
公开(公告)号:CA979240A
公开(公告)日:1975-12-09
申请号:CA176347
申请日:1973-07-12
Applicant: APPLIED RES LAB
Inventor: DAHLQUIST RALPH L
Abstract: An analyte material is prepared for spectrochemical analysis by depositing it in solution or electrostatically precipitating it upon a previously purged yarn of finely divided carbon fibers, dessicating it in situ, and electrically heating the yarn sufficiently to vaporize the analyte material while passing a gas stream over it in which the analyte material is condensed in particles of sufficiently small size to form an aerosol which is then conducted to any of a variety of excitation sources for spectrochemical analysis.
-
公开(公告)号:GB1385784A
公开(公告)日:1975-02-26
申请号:GB2135072
申请日:1972-05-08
Applicant: APPLIED RES LAB
IPC: G01N23/22 , G01N23/223 , B01F7/20 , B01F13/08
Abstract: 1385784 Mixing apparatus APPLIED RESEARCH LABORATORIES LTD 8 May 1972 [14 May 1971] 21350/72 Heading B1C [Also in Divisions G1 and G2] In a liquid cell for X-ray fluorescence analysis comprising a receptacle 27 for a liquid sample, a window opening 29 and an arrangement 45 for imparting rotary motion to the liquid, means, e.g. a baffle arrangement 83, are provided to inhibit creation of a vortex adjacent opening 29. In this way a substantially flat upper surface is presented to irradiating X-rays. The baffle 83 may comprise two connected inverted U-shaped members, Fig. 8 (not shown). As shown the rotor 45 is a bar magnet which is rotated by a motor-driven magnet arrangement 73-77 located below the receptacle base. Alternatively a rotating vane (112) may be coupled direct to the motor 47, Fig. 9 (not shown). Excess liquid drains away through passage 41. For Figure see next column
-
-
公开(公告)号:FR2129644A5
公开(公告)日:1972-10-27
申请号:FR7208751
申请日:1972-03-14
Applicant: APPLIED RES LAB
IPC: G01N15/06 , G01N23/223 , G01N23/00 , F01M11/00 , F02B77/00
-
公开(公告)号:DE1798021A1
公开(公告)日:1971-08-26
申请号:DE1798021
申请日:1966-10-11
Applicant: APPLIED RES LAB INC
Inventor: JAKOB LIEBE HELMUT
IPC: G01Q10/00 , G01Q30/06 , H01J29/58 , H01J37/05 , H01J37/252 , H01J37/256 , H01J49/02 , H01J49/14 , H01J49/20 , H01J49/28 , H01J49/30 , H01J49/32
Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.
-
-
-
-
-
-
-
-
-