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公开(公告)号：KR1020120017527A
公开(公告)日：2012-02-29
申请号：KR1020100080154
申请日：2010-08-19
IPC: B23K26/70 , B23K26/04 , B23K26/042
Abstract: PURPOSE: A laser processing apparatus and a control method thereof which can minimize errors due to the unnecessary use of equipment are provided to minimize the energy intensity loss of a laser beam by selectively using an inspection member according to needs. CONSTITUTION: A laser processing apparatus comprises a laser beam source(10), an optical unit(30), a stage(60), and a detecting unit. The optical unit processes the laser beam emitted from the laser beam source . The stage supports a workpiece(65) on which the laser beam penetrating through the optical unit is irradiated The detecting unit is arranged between the optical unit and the stage. The detecting unit selectively detects the laser beam passing through the optical unit according to needs.
Abstract translation: 目的：提供一种激光加工装置及其控制方法，其能够最小化由于不必要的设备使用造成的误差，以通过根据需要选择性地使用检查部件来最小化激光束的能量强度损失。 构成：激光加工装置包括激光束源（10），光学单元（30），平台（60）和检测单元。 光学单元处理从激光束源发射的激光束。 舞台支撑着穿过光学单元的激光束照射的工件（65）。检测单元布置在光学单元和舞台之间。 检测单元根据需要选择性地检测通过光学单元的激光束。
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公开(公告)号：KR1020110057568A
公开(公告)日：2011-06-01
申请号：KR1020090114028
申请日：2009-11-24
Inventor： 유병소
CPC classification number: G01R31/2635 , G01J1/02 , G01R1/073 , G01R31/2863 , G01R31/2867 , G01R31/2889 , G01R31/2893 , H01L21/67271
Abstract: PURPOSE: An LED chip test device and an LED chip classifying device are provided to reduce manufacturing costs. CONSTITUTION: A mounting member(21) mounts an LED chip. A rotating member(22) rotates an LED chip to a test position for measuring the property of the LED chip. A test unit(3) is installed near the rotating member and measures the property of the LED chip at the test position.
Abstract translation: 目的：提供LED芯片测试装置和LED芯片分选装置，以降低制造成本。 构成：安装构件（21）安装LED芯片。 旋转构件（22）将LED芯片旋转到用于测量LED芯片的特性的测试位置。 测试单元（3）安装在旋转构件附近，并测量LED芯片在测试位置的性能。
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公开(公告)号：KR1020110053033A
公开(公告)日：2011-05-19
申请号：KR1020090109824
申请日：2009-11-13
Inventor： 유병소
Abstract: PURPOSE: A pickup device is provided to stably pick up an object by supporting the object with a support pin. CONSTITUTION: A support member is installed on the lower side of a maintenance member and includes a groove on the surface facing the maintenance member. A support pin(120) is protruded from the inside of the groove of the support member to the maintenance member. The support pin passes through the maintenance member and supports an object(L). A picker(130) is installed on the upper side of the object and picks up the object. An inhalation hole and an installation hole are installed in the groove of the support member. The support pin is located through the installation hole.
Abstract translation: 目的：提供拾取装置以通过用支撑销支撑物体来稳定地拾取物体。 构成：支撑构件安装在维护构件的下侧，并且在面向维护构件的表面上包括凹槽。 支撑销（120）从支撑构件的凹槽的内部突出到维护构件。 支撑销穿过维护部件并支撑物体（L）。 拾取器（130）安装在物体的上侧并拾取物体。 吸入孔和安装孔安装在支撑构件的槽中。 支撑销穿过安装孔。
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64.发明公开
公开(公告)号：KR1020110053031A
公开(公告)日：2011-05-19
申请号：KR1020090109822
申请日：2009-11-13
Inventor： 유병소
IPC: G01J1/58
Abstract: PURPOSE: An integrating sphere unit with a probe card, and an LED chip testing apparatus therewith, and an LED chip sorting apparatus therewith are provided to accurately measure the light properties of a light source. CONSTITUTION: An integrating sphere unit with a probe card comprises an integrating sphere body(110), a probe card(150), and a transfer member. The integrating sphere body has a hollow unit and a light receiving hole for transferring light to the hollow unit. The probe card is integrally formed in the integrating sphere body and has an insertion hole for transferring light. The transfer member is integrally formed in the bottom of the probe card and transfers light toward the hollow unit.
Abstract translation: 目的：提供具有探针卡的积分球单元以及其中的LED芯片测试装置，以及其中的LED芯片分选装置，以准确地测量光源的光特性。 构成：具有探针卡的积分球单元包括积分球体（110），探针卡（150）和转印构件。 积分球体具有中空单元和用于将光传送到中空单元的光接收孔。 探针卡一体地形成在积分球体中，并具有用于传递光的插入孔。 传送构件整体地形成在探针卡的底部，并将光传送到中空单元。
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公开(公告)号：KR100986248B1
公开(公告)日：2010-10-07
申请号：KR1020100026627
申请日：2010-03-25
IPC: H05K13/04 , H05K13/08 , H01L21/677 , H01L21/66
CPC classification number: H05K13/0404 , H01L21/67271 , H01L21/67721 , H01L22/12 , H01L22/30 , H05K13/08
Abstract: PURPOSE: A multi-arm structure and a target object classification device thereof are provided to prevent the damage of a picker and a target object by interposing a damper between the picker and a rotating arm. CONSTITUTION: A multi-arm structure(10) comprises a rotating member(100), a plurality of rotating arms(200), and a picker(300). A plurality of rotating arms are extended from the rotating member in a radial direction. The rotating arm comprises a damper. When the picker is contacted with an object, the damper prevents the damage of the object and the picker. The picker is arranged in the end part in the radial direction of the rotating arm. The picker selectively picks up the object from an object holding member. The object is a semiconductor chip or a LED(Light Emitting Diode) chip.
Abstract translation: 目的：提供一种多臂结构和目标物体分类装置，通过在拾取器和旋转臂之间插入阻尼器来防止拾取器和目标物体的损坏。 构造：多臂结构（10）包括旋转构件（100），多个旋转臂（200）和拾取器（300）。 多个旋转臂从旋转构件沿径向方向延伸。 旋转臂包括阻尼器。 当拾取器与物体接触时，阻尼器防止物体和拾取器的损坏。 拾取器沿旋转臂的径向布置在端部中。 拾取器从对象保持构件中选择性地拾取对象。 目的是半导体芯片或LED（发光二极管）芯片。
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Patent Agency Ranking
公开(公告)号：KR100984719B1
公开(公告)日：2010-10-01
申请号：KR1020100035137
申请日：2010-04-16
IPC: B23K26/38 , B23K26/02 , B23K26/08 , H01L21/304
Abstract: PURPOSE: A laser processing apparatus which is suitable for a cutting process or scribing process of an object with a mounting pat is provided to prevent the heat and crack between a substrate and a nitride layer. CONSTITUTION: A laser processing apparatus comprises a laser light source(103), a light-collecting unit(105), a driving unit(101) and a controller(106). The laser orphanage emits ultra-short pulse laser beam. The light-collecting unit condenses the laser beam on a sapphire substrate from the laser light source. The driving unit moves the light-collecting unit or the sapphire substrate in order to position the laser beam on a light focusing point within the sapphire substrate. The controller controls the driving unit so that a phase transformation domain can be formed inside the sapphire substrate.
Abstract translation: 目的：提供一种适用于具有安装件的物体的切割过程或划线过程的激光加工装置，以防止基板和氮化物层之间的热和裂纹。 构成：激光加工装置包括激光源（103），聚光单元（105），驱动单元（101）和控制器（106）。 激光孤儿院发射超短脉冲激光束。 集光单元将激光束从激光光源冷凝到蓝宝石衬底上。 驱动单元移动聚光单元或蓝宝石衬底，以将激光束定位在蓝宝石衬底内的光聚焦点上。 控制器控制驱动单元，从而可以在蓝宝石衬底内部形成相变区域。
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公开(公告)号：KR100984716B1
公开(公告)日：2010-10-01
申请号：KR1020100030998
申请日：2010-04-05
Applicant: (주)큐엠씨 , 엘지이노텍 주식회사
IPC: H01L21/66
Abstract: PURPOSE: A method and an apparatus for correcting the measurement result of an LED chip are provided to rapidly correct errors by easily grasping the causes of measurement errors in a test process of an LED chip. CONSTITUTION: An LED chip test apparatus(100) includes a measuring member(110), a contact member(120), a moving member(130), and a correcting member(140). A vertical support frame is fixed to a support frame(102). The measuring member is installed on the vertical support frame. The contact member is formed on the lower side of the measuring member. The moving member is formed on the support frame and includes a test shelf(132), a rotation member(134), a Y axis test moving member(136), and an X axis moving member(138).
Abstract translation: 目的：提供一种用于校正LED芯片的测量结果的方法和装置，用于通过在LED芯片的测试过程中容易地掌握测量误差的原因来快速校正误差。 构成：LED芯片测试装置（100）包括测量构件（110），接触构件（120），移动构件（130）和校正构件（140）。 垂直支撑框架固定到支撑框架（102）。 测量部件安装在垂直支撑架上。 接触构件形成在测量构件的下侧。 移动构件形成在支撑框架上，包括测试架（132），旋转构件（134），Y轴测试移动构件（136）和X轴移动构件（138）。
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公开(公告)号：KR100902150B1
公开(公告)日：2009-06-10
申请号：KR1020080097806
申请日：2008-10-06
Inventor： 유병소
CPC classification number: H01L33/0079 , B23K26/066 , H01L21/268 , Y10T156/1917
Abstract: An apparatus and method for the manufacturing the emitting device is provided to laminate the thin film from the substrate and to improve the productivity and the process. The apparatus for manufacturing a light-emitting device comprises a laser beam illumination, and a mesh type mask and an imaging lens. The laser beam illumination emits the laser beam. The mesh type mask passes selectively the laser beam. A plurality of apertures is formed in the mesh type mask. The size of aperture can be controlled. The imaging lens forms a plurality of beam spots. The beam spot is generated by focusing the laser beam passing through the mesh type mask on the target object. The target object is the sapphire substrate in which the epi layer of GaN is formed. The beam spot is formed in the reverse surface of the sapphire substrate(100).
Abstract translation: 提供一种用于制造发光器件的设备和方法，用于从薄膜层压薄膜并提高生产率和工艺。 用于制造发光装置的装置包括激光束照明和网状掩模和成像透镜。 激光束照射发射激光束。 网状掩模选择性地通过激光束。 在网状掩模中形成多个孔。 可以控制光圈的大小。 成像透镜形成多个光束点。 通过将通过网状掩模的激光束聚焦在目标物体上来产生束斑。 目标物体是其中形成GaN的外延层的蓝宝石衬底。 束斑形成在蓝宝石衬底（100）的相反表面上。
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公开(公告)号：KR100694807B1
公开(公告)日：2007-03-14
申请号：KR1020050015092
申请日：2005-02-23
IPC: G02F1/13
Abstract: 본 발명은 반사검사의 전/후 시점에서 편광필름을 이송컨베어의 밸트에 비접촉식으로 평평하게 고정/분리할 수 있음은 물론, 반사검사를 모두 이송컨베어의 상측에서 실시할 수 있도록 한 편광필름 검사방법 및 장치에 관한 것이다.
본 발명에 따른 검사방법은, 편광필름을 이송컨베어에 공급하는 단계, 공급된 편광필름을 이송컨베어의 밸트에 정전기를 이용하여 고정하는 단계, 평평한 상태로 고정된 편광필름의 일측면을 반사검사하는 단계, 검사된 편광필름의 정전기를 제거하여 이송컨베어에서 분리하는 단계, 분리된 편광필름을 뒤집어서 이송컨베어에 공급하는 단계, 공급된 편광필름을 이송컨베어의 밸트에 정전기를 이용하여 고정하는 단계, 뒤집혀져 평평한 상태로 고정된 편광필름의 타측면을 반사검사하는 단계, 검사된 편광필름의 정전기를 제거하여 이송컨베어에서 분리한 후 배출하는 단계를 포함하는 것을 특징으로 한다.
이에, 본 발명은 편광시트를 접촉식으로 고정하는 종래의 방식과는 달리 편광필름의 전범위를 검사할 수 있음은 물론 스크레치의 발생을 방지할 수 있는 효과를 가진다. 또한, 검사라인의 규모를 대폭 축소하여 작업공간으로 활용할 수 있을 뿐만 아니라, 검사장비를 손쉽게 유지 및 보수할 수 있는 효과를 가진다.
이송컨베어, 반사검사부, 투광검사부
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