公开(公告)号：JPH08162003A

公开(公告)日：1996-06-21

申请号：JP32116294

申请日：1994-12-01

Applicant: CANON KK

Inventor： NOMA TAKASHI

IPC: H01J1/316 ,  H01J1/30 ,  H01J9/02 ,  H01J31/12 ,  H01J31/15

Abstract: PURPOSE: To reduce forming power, and also to stabilize electron emission characteristics of a surface conductive electron emission element to be used as an electron source of an image forming device. CONSTITUTION: In a surface conductive electron emission element wherein an electron emitting part 2 is provided on a conductive thin film 3 extending over electron electrodes 4, 5 by electrification forming, the conductive thin film 3 is formed of mixture of high melting point particulates 7 and low melting point particulates 8.

公开(公告)号：JPH06244275A

公开(公告)日：1994-09-02

申请号：JP4993793

申请日：1993-02-17

Applicant: CANON KK

Inventor： MIYATA HIROKATSU ,  YAMAGATA KENJI ,  MIURA NAOKO ,  NOMA TAKASHI

IPC: H01L21/20 ,  H01L21/304 ,  H01L21/336 ,  H01L21/76 ,  H01L21/762 ,  H01L27/12 ,  H01L29/78 ,  H01L29/786 ,  H01L29/784

Abstract: PURPOSE:To enable adjacent semiconductor crystals whose surfaces are flat and which are electrically and fully insulated from each other to be formed high with thickness controllability. CONSTITUTION:Insulator is deposited to cover a semiconductor single crystal 13 grown on an insulator surface so as to be flat, or insulator deposited on a semiconductor single crystal 13 is flattened. By this setup, a first process wherein a flattened insulating layer 14 in which a semiconductor crystal 13 is buried is formed, a second process wherein the insulating layer 14 is selectively removed to be as thick as required to make the semiconductor crystal 13 exposed, and a third process wherein the exposed semiconductor single crystal 13 is polished to make its top flush with the surface of the left insulating layer 14 are prepared.

公开(公告)号：JP2002308623A

公开(公告)日：2002-10-23

申请号：JP2002027055

申请日：2002-02-04

Applicant: CANON KK

Inventor： OGAWA YOSHINORI ,  NOMA TAKASHI

IPC: C01G19/02

Abstract: PROBLEM TO BE SOLVED: To prepare a thin film of a tin oxide meso structural body provided with a fine pore structure having high structural regularity and a crystalline fine pore wall, and to provide a manufacturing method thereof. SOLUTION: The thin film has the fine pore structure formed by containing an oxide, holds a surfactant in the fine pore and contains tin oxide crystal in the fine pore wall. The manufacturing method for the fine pore structural body has a process for preparing a reaction solution containing a metallic compound and the surfactant, a process for applying the reaction solution on a substrate and a process for holding the substrate in an atmosphere containing steam.

公开(公告)号：JP2001141674A

公开(公告)日：2001-05-25

申请号：JP32534599

申请日：1999-11-16

Applicant: CANON KK

Inventor： TAKADA KAZUHIRO ,  NOMA TAKASHI

IPC: G01N23/207

Abstract: PROBLEM TO BE SOLVED: To measure a diffraction pattern having a desired S/B ratio by reducing the scattering of air around a sample by a simple method without scaling up an apparatus in the case of the measurement of the diffraction of obliquely emitted X-rays. SOLUTION: A sample holder 15 for measuring the diffraction of obliquely emitted X-rays is constituted of a container 14 holding a sample 3 therein, and an atmosphere control means 13 for controlling the atmosphere in the container 14. An X-ray incident window 11 for permitting primary X-rays 4 to transmit to allow the same to be incident on the sample 3, and an X-ray emitting window 12 for permitting diffracted X-rays to transmit to emit the same to the outside, are formed to the container 14 so as to be separated mutually. When the diffraction of obliquely emitted X-rays is measured, primary X-rays 4 are emitted from an X-ray source 9 in such a state that the atmosphere in the container 14 holding the sample 3 therein is controlled by the atmosphere control means 13 to be diffracted by the sample 3, and the diffracted X-rays 5 are detected and recorded by an X-ray detector 6 to measure the diffraction pattern of the sample 3.

公开(公告)号：JP2000310955A

公开(公告)日：2000-11-07

申请号：JP24806199

申请日：1999-09-01

Applicant: CANON KK

Inventor： NOMA TAKASHI ,  KOBAYASHI TOYOKO ,  MOTOI YASUKO ,  MIURA NAOKO ,  KOBAYASHI TATSU ,  TAKASE HIROMITSU

IPC: B09B3/00 ,  B03B9/06 ,  B09B5/00 ,  C22B3/04 ,  C22B7/00 ,  G02F1/13 ,  G09F9/00 ,  H01J9/50 ,  H01J9/52

Abstract: PROBLEM TO BE SOLVED: To enable processes conforming with the earth environment such as the separation and processing of lead components for the reuse of glass used for a flat panel display. SOLUTION: The method for disassembling a flat panel display structured by airtightly joining a face plate 2 and a rear plate 1, made principally of glass, with frit glass through a frame includes a stage for separating the face plate 2 and rear plate 1. In the separating stage, they are separated by being cut, dissolved, and fused.

公开(公告)号：JP2000275193A

公开(公告)日：2000-10-06

申请号：JP8173799

申请日：1999-03-25

Applicant: CANON KK

Inventor： TAKADA KAZUHIRO ,  NOMA TAKASHI

IPC: G01N23/20 ,  G01N9/24

Abstract: PROBLEM TO BE SOLVED: To measure the surface density of a minute region in a non-destructive manner. SOLUTION: In this measuring apparatus, a sample 3 is held on a goniometer 14 having a sample rotating mechanism and the incident angle α of primary X-rays 4 from an X-ray source 10 is set by the sample rotating mechanism. The intensity of diffracted/scattered X-rays 5 from the sample 3 is measured by an X-ray detector 6 and a calculation part 13 detects the angle 2 θ of diffraction of X-rays from the intensity distribution of diffracted/scattered X-rays 5 measured by the X-ray detector 6 and also regulates the emitting angle βof X-rays. The change quantity of the angle of diffraction due to the refraction effect of X-rays is calculated from the data of the incident angle a and the angle 2 θ of diffraction or the data of the emitting angle B and the angle 2 θof diffraction and the density of the substance constituting the surface of the sample 3 is calculated on the basis of the change quantity.

公开(公告)号：JPH11201916A

公开(公告)日：1999-07-30

申请号：JP771098

申请日：1998-01-19

Applicant: CANON KK

Inventor： NOMA TAKASHI ,  TAKADA KAZUHIRO

IPC: G01N23/201 ,  G01N23/207

Abstract: PROBLEM TO BE SOLVED: To implement a sample measuring device capable of measuring wide- angle regions and narrow-angle regions and of switching the constitution of the device in the case of measuring wide-angle regions and the case of measuring narrow-angle regions by simple operation. SOLUTION: An x-ray generating means 1, a slit 4, and goniometers 2 and 3 are arranged in a line in this order. The goniometer 2 is provided with a sample holder 8 rotated about the axis of rotation 2a and an arm 11 with a slit 5 swung about the axis of rotation 2a. In the case of measuring wide-angle regions, a sample 10 is placed to the sample holder 8, and an x-ray detector 7 is installed on the arm 11. The goniometer 3 is provided with a sample holder 9 rotated about the axis of rotation 3a and an arm 12 swung about the axis of rotation 3a. In the case of measuring narrow-angle regions, the sample 10 is placed to the sample holder 9, and the x-ray detector 7 is installed on the arm 12. The slit 5 is arranged between the goniometer 2 and the goniometer 3.

公开(公告)号：JP2592931B2

公开(公告)日：1997-03-19

申请号：JP24632788

申请日：1988-09-30

Applicant: CANON KK

Inventor： INO SHOZO ,  NOMA TAKASHI ,  MYATA HIROKATSU

IPC: G01N23/223

公开(公告)号：JPH07192613A

公开(公告)日：1995-07-28

申请号：JP34593093

申请日：1993-12-24

Applicant: CANON KK

Inventor： NOMA TAKASHI ,  UNO KUMIKO

IPC: H01J9/02 ,  H01J1/30 ,  H01J31/12 ,  H01J31/15

Abstract: PURPOSE:To suppress a fluctuation of electric resistance of an electron emitting part forming thin film and to collect its material made reusable. CONSTITUTION:An electron emitting part 3 is provided between opposed electrodes 5, 6 formed on an insulating substrate 1. An organic metal compound having volatility is applied onto the substrate, formed with electrodes, to form a thin film 7. A region, where the electron emitting part of this organic metal compound thin film is formed, is coated with a coating material 8. An organic metal compound in a part except the region, coated with this coating material, is removed. By heating the film baked, a thin film 14 consisting of metal particulates or metal oxide particulates or a mixture thereof is created. Next by a current carrying process, the electron emitting part is formed in the thin film.

公开(公告)号：JPH0463829A

公开(公告)日：1992-02-28

申请号：JP17699290

申请日：1990-07-03

Applicant: CANON KK

Inventor： TOSHIDA YOSHI ,  YOSHINAGA KAZUO ,  SATO KOICHI ,  NOMA TAKASHI ,  KURIHARA SUOMI

IPC: G02F1/13 ,  C08G63/181 ,  C09K19/38

Abstract: PURPOSE:To prepare the title copolymer which exhibits a chiral smectic phase over a wide temp. range and a high spontaneous polarization and is easily formed into a thin film by incorporating two specific repeating units into the copolymer. CONSTITUTION:For instance, a dicarboxylic acid having a mesogen and an optically active diol are copolymerized to give the title copolymer which has a degree of polymn. of 5-1000, a wt.-average mol.wt. of 2000-100000, the repeating units of formula I or II (wherein X and Y are each H or CH3 provided that Xnot equal to Y; k is 0-1; m1 is 1-18; m2 is 2-10; m3 is 2-5; and a carbon atom to which CH3 is bound is an asymmetric carbon atom) in the main chain as the first flexible spacer, and the repeating units of formula III (wherein x and y are each 0-18 provided that xnot equal to y and x+y