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    GLOBAL SOLAR SPECTRUM DEVICES AND METHODS
    61.
    发明公开
    GLOBAL SOLAR SPECTRUM DEVICES AND METHODS 审中-公开

    公开(公告)号：EP3365643A1

    公开(公告)日：2018-08-29

    申请号：EP16856512.5

    申请日：2016-10-20

    Applicant: Spectrafy Inc.

    Inventor： BEAL, Richard ,  TATSIANKOU, Viktar

    IPC: G01J3/51 ,  G01N21/31

    CPC classification number: G01J3/36 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0474 ,  G01J1/0492 ,  G01J1/06 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0262 ,  G01J2001/061 ,  G01J2001/4266 ,  G01J2003/1213 ,  G01N21/31 ,  G01N21/538 ,  G01N2201/0616 ,  G01N2201/065

    Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapour absorptions.

    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME
    63.
    发明公开
    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME 审中-公开
    美国德黑兰大学学报（自然科学版）

    公开(公告)号：EP2659510A2

    公开(公告)日：2013-11-06

    申请号：EP12743355.5

    申请日：2012-07-10

    Applicant: Heptagon Micro Optics Pte. Ltd.

    Inventor： RUDMANN, Hartmut ,  ROSSI, Markus

    IPC: H01L25/04

    CPC classification number: H01L31/16 ,  B29D11/00298 ,  B29D11/00307 ,  G01J1/0209 ,  G01J1/0233 ,  G01J1/0271 ,  G01J1/0411 ,  G01J1/06 ,  G01J1/42 ,  G01J5/00 ,  G01J5/022 ,  G01J5/0235 ,  G01J5/024 ,  G01J5/0265 ,  G01J5/045 ,  G01J5/0806 ,  G01J5/20 ,  G01J2001/061 ,  G02B3/0031 ,  G02B3/0056 ,  G02B13/0085 ,  H01L25/167 ,  H01L27/14618 ,  H01L27/14625 ,  H01L27/14627 ,  H01L27/14687 ,  H01L31/02325 ,  H01L31/167 ,  H01L2924/0002 ,  Y10T29/49002 ,  H01L2924/00

    Abstract: Manufacturing opto-electronic modules (1) includes providing a substrate wafer (PW) on which detecting members (D) are arranged; providing a spacer wafer (SW); providing an optics wafer (OW), the optics wafer comprising transparent portions (t) transparent for light generally detectable by the detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by the detecting members; and preparing a wafer stack (2) in which the spacer wafer (SW) is arranged between the substrate wafer (PW) and the optics wafer (OW) such that the detecting members (D) are arranged between the substrate wafer and the optics wafer. Emission members (E) for emitting light generally detectable by the detecting members (D) can be arranged on the substrate wafer (PW). Single modules (1) can be obtained by separating the wafer stack (2) into separate modules.

    Abstract translation: 制造光电模块（1）包括提供其上布置有检测构件（D）的衬底晶片（PW）; 提供间隔晶片（SW）; 提供光学晶片（OW），所述光学晶片包括对于通常可由检测构件检测的光透明的透明部分（t）和用于基本上衰减或阻挡通常由检测构件可检测的入射光的至少一个阻挡部分（b） 以及准备其中所述间隔晶片（SW）布置在所述衬底晶片（PW）和所述光学晶片（OW）之间的晶片堆叠（2），使得所述检测构件（D）布置在所述衬底晶片和所述光学晶片之间 。 用于发射由检测部件（D）可以通常检测的光的发射部件（E）可以布置在基板晶片（PW）上。 可以通过将晶片堆叠（2）分离成单独的模块来获得单个模块（1）。

    A receiving head for a radiation detector having a defined field of view
    64.
    发明公开
    A receiving head for a radiation detector having a defined field of view 失效
    具有定义视野的辐射探测器

    公开(公告)号：EP0428345A3

    公开(公告)日：1992-03-18

    申请号：EP90312275.2

    申请日：1990-11-09

    Applicant: GEC-MARCONI AVIONICS (HOLDINGS) LIMITED

    Inventor： Parker, John Campbell

    IPC: G01J1/04 ,  G01S3/78

    CPC classification number: G01S3/782 ,  G01J1/04 ,  G01J1/0422 ,  G01J1/0425 ,  G01J1/0474 ,  G01J1/4228 ,  G01J2001/061 ,  G01S3/78

    Abstract: A radiation detector, including a photodiode, has improved uniformity of sensitivity over the field of view because the receiving surface is provided by an optical diffusing layer, and the field of view is defined by a baffle arrangement, each internal surface of which is reflective. The baffle arrangement also defines a volume and the diffusing layer conforms to a part of the volume adjacent to the apex thereof. The diffusing layer may be provided by material, initially in liquid form, solidified in situ within the baffle arrangement. The receiving surface may be provided within a receiving head of the detector, spaced from the photodiode. Radiation may be transmitted from the receiving surface, whether part of a separate receiving head or not, to the photodiode by an optical fibre. An assembly of four constituent detectors, each having three orthogonally arranged mirrors, may together define a hemispherically shaped volume.

    SYSTEM AND METHOD FOR OPTICAL MEASUREMENTS ON A TRANSPARENT SHEET
    65.
    发明公开
    SYSTEM AND METHOD FOR OPTICAL MEASUREMENTS ON A TRANSPARENT SHEET 审中-公开

    公开(公告)号：EP3387413A1

    公开(公告)日：2018-10-17

    申请号：EP16819473.6

    申请日：2016-12-12

    Applicant: DSM IP Assets B.V.

    Inventor： ABEN, Gerardus ,  THEISS, Wolfgang

    IPC: G01N21/47 ,  G01N21/86 ,  G01N21/896 ,  G01N21/84 ,  G01J1/06 ,  G01N21/59

    CPC classification number: G01N21/474 ,  G01J3/0254 ,  G01J2001/0481 ,  G01J2001/061 ,  G01N21/59 ,  G01N21/8422 ,  G01N21/86 ,  G01N21/896 ,  G01N2021/4735 ,  G01N2021/8411 ,  G01N2021/8618 ,  G01N2201/0632 ,  G01N2201/065

    Abstract: The invention relates to a system for measuring light transmission and/or light reflection properties of a transparent sample sheet, the system comprising a detection assembly and a control unit, wherein the detection assembly comprises an integrating sphere having a sample port, an illumination port, a detection port, an internal light source positioned at the illumination port, and a photodetector coupled to a spectrometer and positioned at the detection port; means to detect radiation coming either directly from the sample port or from the wall of the integrating sphere; an external light source axially aligned with the sample port; means to illuminate with the internal light source or with the external light source; a reference standard, and means to position it at and from the sample port. This system is relatively compact, and can advantageously be used at existing sheet production lines for process and quality control. The invention also relates to a method for measuring light transmission and/or light reflection properties of a transparent sample sheet that applies said system; and to processes of making a sheet, especially an AR-coated glass sheet, comprising said method.

    LIGHT DIRECTIONALITY SENSOR
    67.
    发明公开
    LIGHT DIRECTIONALITY SENSOR 有权
    富集轻董先生SENSOR

    公开(公告)号：EP2342578A1

    公开(公告)日：2011-07-13

    申请号：EP09787367.3

    申请日：2009-10-06

    Applicant: Koninklijke Philips Electronics N.V.

    Inventor： VAN BOMMEL, Ties ,  MEIJER, Eduard, J. ,  HIKMET, Rifat, A., M. ,  VAN SPRANG, Hendrik, A. ,  VERSCHUUREN, Marcus, A.

    IPC: G01S3/782 ,  G01S3/783 ,  H01L31/0232 ,  H01L27/146

    CPC classification number: H01L27/1462 ,  G01J1/04 ,  G01J1/0407 ,  G01J1/0429 ,  G01J1/06 ,  G01J1/4257 ,  G01J2001/061 ,  G01S3/784 ,  H01L27/14625 ,  H01L27/14685

    Abstract: The present invention relates to light sensors for measuring light characteristics. In particular, the present invention relates to a light directionality sensor that is capable of measuring light characteristics such as the light direction, light collimation, and light distribution. According to a first aspect of the present invention there is provided a light directionality sensor comprising a photo-sensor (2), comprising a plurality of photo-sensitive elements (3), and a plurality of light-absorbing light selecting structures (1) arranged on the photo-sensor so as to form an array of light-absorbing light selecting structures. In the array of light-absorbing light selecting structures, a succession of at least some of the light- absorbing light selecting structures has varying structural characteristics. The varying structural characteristics is achieved by each individual structure of the succession being formed such that it allows light within a different angle interval with respect to the array to be sensed. Further, according to a second aspect of the invention, there is provided a method for forming a light sensor according to the first aspect of the present invention.

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