Abstract:
Method for calibrating a photodetector (3), the method comprising the following steps; measuring an afterpulsing probability and/or timing of the photodetector (3) under different operating conditions defined by values of one or more operating parameters, at least one of which is a single-photon property of an optical signal (2) incident on the photodetector (3) when measuring the afterpulsing probability, and recording the measured afterpulsing probability and/or timing in relation to the values of the one or more operating parameters; and photodetector calibrated using this method.
Abstract:
A circuit arrangement for an optical monitoring system comprises a driver circuit (DRV) which is configured to generate at least one driving signal for driving the light source (LS). A detector terminal (DT) is arranged for receiving a detector current (Id) from an optical detector (OD). Again stage (GS) is connected at its input side to the driver circuit (DRV) for receiving the driving signal and generates a noise signal depending on the driving signal. A processing unit (PU) is configured to generate an output signal (SO) depending on the detector current (Id) and the noise signal.
Abstract:
Utilizing a quench time to deionize an ultraviolet (UV) sensor tube are described herein. One method includes monitoring firing events within a UV sensor tube, where a particular firing event initiates arming the UV sensor tube, initiating a quench time to deionize the UV sensor tube, where the quench time includes, disarming the UV sensor tube to prevent a firing event.
Abstract:
Die Erfindung betrifft ein Verfahren zur Verbesserung des Dynamikbereichs einer Vorrichtung zum Detektieren von Licht, vorzugsweise zur Anwendung in einem Mikroskop, mitmindestens zwei Detektionsbereichen (8, 9), wobei die Detektionsbereiche (8, 9) jeweils aus einer Anordnung (Array) (8, 9) aus mehreren Single-Photon-Avalanche-Dioden (SPAD) gebildet werden und wobei die Detektionsbereiche (8, 9) jeweils zumindest einen Signal- Ausgang (10, 11) aufweisen, wobei für jeden der Detektionsbereiche (8, 9) eine Kennkurve (12, 13) ermittelt wird und wobei die Kennkurven (12, 13) zum Erhalt einer Korrekturkurve (15) und/oder eines Korrekturfaktors (17) miteinander kombiniert und/oder verrechnet werden. Des Weiteren betrifft die Erfindung eine Vorrichtung zum Detektieren von Licht, insbesondere zur Anwendung in einem Mikroskop. Ferner betrifft die Erfindung ein entsprechendes Mikroskop.
Abstract:
An imaging system includes a shutter, an array of photodetectors, and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors, the electronic circuitry including elements configured to provide an operating bias point of the photodetectors. The imaging system includes components, such as a controller, configured to adaptively adjust the operating bias for the photodetectors wherein the adjustment is based at least in part on intermittent measurement of a flat field image. During use, the imaging system can be configured to perform intermittent adjustments of the operating bias based on changes in photodetector values for intermittently acquired flat field images. Adjustment of the operating bias may provide compensation for drift over time of the photodetectors and/or electronics due to effects including but not limited to temperature changes.