Abstract:
PROBLEM TO BE SOLVED: To provide an atomic absorption spectrophotometer capable of acquiring measured data in a state that lower detection limit performance is normally optimized regardless of the power supply frequency of an AC power source. SOLUTION: A plurality of lighting periods and sampling data extracting periods of light sources 11, 12 are stored in which lower detection limit performance to each case of the power supply frequencies (50 Hz/60 Hz) of an AC power source for driving an AC motor 22 in a control program operating on a microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110. When a device is used, the power supply frequency of the AC power source used in the device is discriminated by the control program, and the lighting period and the sampling data extracting period corresponding to the power supply frequency discriminated from among the plurality of lighting periods and sampling data extracting periods which are stored and a measurement mode is previously set by a device user are selected. Thus, a proper lighting period is set in a hardware (PLD43). This enables the acquisition of measured data in the state that lower detection limit performance is normally optimized regardless of the power supply frequency. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Abstract:
Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location (2) for receiving a sample (3) for analysis; an illumination arrangement (4) for directing light towards a received sample; a detector (6) for detecting light reflected by a received sample; and collection optics (5) for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer (42) and a half beam block (45a, 45b) which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from reentering the interferometer. A half beam block (45a) may be disposed in the optical path between the interferometer and the light source (41) for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block (45b) may be disposed in the optical path on the opposite side of the interferometer than the light source.
Abstract:
Die Erfindung betrifft ein Messgerät zur Messung einer bestimmten Gaskomponente, das mit weniger makromechanischen, bewegten Komponenten realisiert werden soll. Es wird deshalb ein Messgerät vorgeschlagen, das ausgerüstet ist - mit einer breitbandigen Lichtquelle, die ausgebildet ist, Licht moduliert abzugeben, - mit einem Messvolumen, in der das zu messende Gas vorliegt, - mit einer ersten Lichtablenkeinheit, die wenigstens einen MEMS-Spiegel umfasst und das Licht abwechselnd auf zwei optische Pfade umlenkt, - und der eine erste Pfad als Messpfad ausgebildet ist und ein erstes Filterelement enthält, - und der andere zweite Pfad als Referenzpfad ausgebildet ist und ein zweites Filterelement enthält, - mit einem optischen Element, das Mess- und Referenzpfad wieder auf einen gemeinsamen optischen Pfad führt, - mit einem Lichtdetektor und - mit einer Auswerte- und Steuereinheit zur Ansteuerung der Lichtquelle und der Lichtablenkeinheit und zur Auswertung detektierter Lichtintensitäten und damit Messung der Gaskomponente.