Abstract:
The invention relates to an optical sensor device (100) for detecting target particles (1) at a contact surface (12) of a carrier (11), said sensor device comprising a light source (21, 22) for emitting an input light beam (Ll) into the carrier (11) such that it is totally internally reflected and partially scattered by target particles (1) at the contact surface (12) into an output light beam (L2). The sensor device further comprises an optical system (30) for directing said output light beam (L2) onto a light detector (50), wherein a filter (32) in the optical system (30) suppresses the components (L2d) of totally internally reflected light. The detector therefore primarily measures the fraction of scattered light (L2s).
Abstract:
A method for validating a security feature of an object. The method includes measuring spectral data of the object under a first illumination condition and a second illumination condition. The second illumination condition is different than the first illumination condition. The method also includes determining a presence of the security feature based on the spectral data measured under each illumination condition, and comparing the security feature to a standard.
Abstract:
An apparatus for optical inspection of containers (12) includes a light source (14) having at least one light emitting diode (16) with a light emitting die surface (18). Lenses and/or mirrors (20, 43) focus the light emitting die surface onto a selected portion of a container, and a light sensor (24) receives an image of the selected portion of the container illuminated by the light source. An information processor (28) is coupled to the light sensor for detecting commercial variations in the illuminated portion of the container as a function of the image received at the sensor. The image can be developed by transmission of the light energy through the selected portion of the container, and/or by reflection and/or refraction of the light energy at the selected portion of the container. The light source may include a single light emitting diode, or a plurality of light emitting diodes having light emitting die surfaces focused onto the container in such a way that the images of the light emitting die surfaces overlap and/or are adjacent to each other at the container.
Abstract in simplified Chinese:一种微粒侦测系统包括:适用于以至少二波长照明接受监视的体积之至少一个光源;具有一视野之一接收器,其系适用于来自于至少一个光源的光已经通过接受监视的体积后接收该光,且系适用于产生指示于该接收器之视野内部各区所接收的光强度;与该接收器结合之一处理器,其系适用于处理由该接收器所产生之信号来相关联该接收器之视野内部于相对应区所接收的至少二波长光,及产生指示所接收的至少二波长光之相对位准的一输出信号。
Abstract:
빔검출기(10)는 모니터되는 영역(38)에 있는 입자들을 검출하기 위해 공동 협력해 동작하는 광원(32), 수신기(34), 및 타겟(36)을 포함한다. 타겟(36)은 입사광(40)을 반사하고, 반사광(32)이 수신기(34)로 되돌아 가게 한다. 수신기(34)는 뷰필드를 가로질러 복수의 지점들에서의 광강도를 기록하고 보고할 수 있다. 바람직한 형태로, 검출기(10)는 제 1 파장대역에서 제 1 광빔(3614), 제 2 파장대역에서 제 2 광빔(3618), 및 제 3 파장대역에서 제 1 광빔(3616)을 방출하고, 제 1 및 제 2 파장대역은 실질적으로 같고 제 3 파장대역과는 다르다.
Abstract:
An apparatus for optical inspection of containers (12) includes a light source (14) having at least one light emitting diode (16) with a light emitting die surface (18). Lenses and/or mirrors (20, 43) focus the light emitting die surface onto a selected portion of a container, and a light sensor (24) receives an image of the selected portion of the container illuminated by the light source. An information processor (28) is coupled to the light sensor for detecting commercial variations in the illuminated portion of the container as a function of the image received at the sensor. The image can be developed by transmission of the light energy through the selected portion of the container, and/or by reflection and/or refraction of the light energy at the selected portion of the container. The light source may include a single light emitting diode, or a plurality of light emitting diodes having light emitting die surfaces focused onto the container in such a way that the images of the light emitting die surfaces overlap and/or are adjacent to each other at the container.
Abstract:
A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.
Abstract:
The disclosed technology brings histopathology into the operating theatre, to enable realtime intra-operative digital pathology. The disclosed technology utilizes confocal imaging devices image, in the operating theatre, "optical slices" of fresh tissue - without the need to physically slice and otherwise process the resected tissue as required by frozen section analysis (FSA). The disclosed technology, in certain embodiments, includes a simple, operating-table-side digital histology scanner, with the capability of rapidly scanning all outer margins of a tissue sample (e.g., resection lump, removed tissue mass). Using point-scanning microscopy technology, the disclosed technology, in certain embodiments, precisely scans a thin "optical section" of the resected tissue, and sends the digital image to a pathologist rather than the real tissue, thereby providing the pathologist with the opportunity to analyze the tissue intra-operatively. Thus, the disclosed technology provides digital images with similar information content as FSA, but faster and without destroying the tissue sample itself.