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公开(公告)号:DD160640C2
公开(公告)日:1988-06-08
申请号:DD22455280
申请日:1980-10-14
Applicant: INST KOSM ISSLED AN SSSR
Inventor: AVANESOV GENRICH A
IPC: G01J3/38
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公开(公告)号:FR2467395B1
公开(公告)日:1983-11-18
申请号:FR8021328
申请日:1980-10-06
Applicant: ASEA AB
IPC: G01D5/353 , G01J5/58 , G01K1/02 , G01K11/12 , G01K11/20 , G01K11/32 , G01J5/08 , G01K13/00 , G01J3/38 , G01J3/50 , G02B5/16
Abstract: A fiber-optic temperature-measuring apparatus which monitors the photo-luminescence of a body of solid material subjected to the temperature to be measured. Exciting radiation is conducted by means of at least one optical fiber towards a material with temperature-dependent luminescence which is in optical contact with the fiber, whereby luminescence occurs. The radiation emitted as a consequence of the luminescence is transmitted via at least one optical fiber from the body to a place of measurement, where a measure of the temperature may be obtained. The luminescent body may consist of a semiconductor material.
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公开(公告)号:CH639489A5
公开(公告)日:1983-11-15
申请号:CH30779
申请日:1979-01-12
Applicant: HOFFMANN LA ROCHE
Inventor: FRANKLIN MICHAEL LEON , JEUNELOT CHARLES WILLIAM
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公开(公告)号:DE3121216A1
公开(公告)日:1982-02-04
申请号:DE3121216
申请日:1981-05-27
Applicant: SHIMADZU CORP
Inventor: OHKUBO KUNIHIKO
Abstract: A spectralphotofluorometer is described in which at least the excitation monochromator is constructed such that the entry slit and the exit slit are arranged on opposite sides of a plane which contains the mid-point of the grating and is at right angles to its axis of rotation, so that the doubly diffracted light of zero order cannot exit from the exit slit as stray light.
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公开(公告)号:CS188357B1
公开(公告)日:1979-03-30
申请号:CS109575
申请日:1975-02-19
Applicant: EIGL JAN , FIKAR ZDENEK , JAHODA MIROSLAV
Inventor: EIGL JAN , FIKAR ZDENEK , JAHODA MIROSLAV
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68.
公开(公告)号:GB1541679A
公开(公告)日:1979-03-07
申请号:GB990676
申请日:1976-03-12
Applicant: KLOECKNER WERKE AG
Abstract: An alloy to be tested is formed of a basis metal and a plurality of alloying elements. A diffraction spectrum having lines corresponding to the basis metal and to each of the alloying elements is generated from the alloy by sparking and electrical signals each having an intensity proportional to the intensity of a respective one of the lines of the spectrum are formed. Each of these signals is integrated and the integrated signals corresponding to lines of the alloy elements are each compared with the integrated signal corresponding to the line of the basis metal and difference signals are generated. These difference signals are evaluated by being passed through a threshold circuit which sounds an alarm when they lie outside a predetermined range. The device can be calibrated by comparing each of the signals corresponding to one of the alloying elements with only a portion of the signal corresponding to the basis metal so that the arrangement can be set up to generate an output only when the alloy being sampled has a composition different from a predetermined calibrated composition.
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公开(公告)号:GB1537933A
公开(公告)日:1979-01-10
申请号:GB3712477
申请日:1977-09-06
Applicant: KOLLMORGEN TECH CORP
Abstract: A light source (2, 3) uniformly illuminates a specimen (1). The light radiated by the specimen (1) is collected by a lens (5). A slit (6) restricts the angle of the light emanating from the lens (5), which is thereupon decomposed by a dispersion device (8) into the various wavelengths. A lens arrangement (9) focuses the decomposed light and projects it onto a plurality of photodetectors (10) which are arranged in the plane of the focused spectrum. The signals of the photodetectors are evaluated in an electronic device (11). This spectrophotometer makes it possible for the intensities of the individual light components to be measured simultaneously.
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