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    METHOD FOR THE 3-DIMENSIONAL MEASUREMENT OF A SAMPLE WITH A MEASURING SYSTEM COMPRISING A LASER SCANNING MICROSCOPE AND SUCH MEASURING SYSTEM
    71.
    发明专利
    METHOD FOR THE 3-DIMENSIONAL MEASUREMENT OF A SAMPLE WITH A MEASURING SYSTEM COMPRISING A LASER SCANNING MICROSCOPE AND SUCH MEASURING SYSTEM 未知

    公开(公告)号：CA2861721A1

    公开(公告)日：2013-07-04

    申请号：CA2861721

    申请日：2012-01-05

    Applicant: FEMTONICS KFT

    Inventor： ROZSA BALAZS ,  KATONA GERGELY ,  CSIKOR FERENC ,  MAAK PAL

    IPC: G06F3/01

    Abstract: The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by - providing the measuring system with a 3-dimensional virtual reality device, - creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device, - allowing for selecting an operation in the virtual space, - providing real-time unidirectional or bidirectional connection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3- dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device.

    FOCUSING SYSTEM COMPRISING ACOUSTO-OPTIC DEFLECTORS FOR FOCUSING AN ELECTROMAGNETIC BEAM
    73.
    发明专利
    FOCUSING SYSTEM COMPRISING ACOUSTO-OPTIC DEFLECTORS FOR FOCUSING AN ELECTROMAGNETIC BEAM 未知

    公开(公告)号：HU0800781D0

    公开(公告)日：2009-03-02

    申请号：HU0800781

    申请日：2008-12-31

    Applicant: FEMTONICS KFT

    Abstract: A focusing system for focusing an electromagnetic beam for three-dimensional random access applications comprises a first pair of acousto-optic deflectors for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors for focusing an electromagnetic beam in a Y-Z plane substantially perpendicular to the X-Z plane. The second pair of acousto-optic deflectors is arranged between the acousto-optic deflectors of the first pair of acousto-optic deflectors such that the first and fourth acousto-optic deflectors of the system belong to the first pair of acousto-optic deflectors and the second and third acousto-optic deflectors of the system belong to the second pair of acousto-optic deflectors.

    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE
    75.
    发明公开
    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE 审中-公开
    组合成像系统和MRI兼容的激光扫描显微镜

    公开(公告)号：EP3221707A1

    公开(公告)日：2017-09-27

    申请号：EP15860226.8

    申请日：2015-11-18

    Applicant: Femtonics Kft.

    Inventor： RÓZSA, Balázs ,  KATONA, Gergely

    IPC: G01Q60/00 ,  G02B21/00 ,  G01N24/00

    CPC classification number: G01R33/4808 ,  G01R33/381 ,  G02B21/002

    Abstract: The subject of the invention relates to a combined imaging system (10') that includes a laser scanning microscope (50, 50'), and a measuring device with a lower resolution than the resolution of the laser scanning microscope (50, 50') and that measures over a larger spatial scale than the spatial scale of the laser scanning microscope (50, 50'). The subject of the invention also relates to an MRI compatible laser scanning microscope which comprises: deflecting means (24') for deflecting a laser beam (13), objective (28'), adjustable objective arm (38), distance adapter (39) and at least one detector (30'). The essence of the MRI compatible laser scanning microscope is that at least the objective (28'), the adjustable objective arm (38), the distance adapter (39) and the at least one detector (30') are made from non-magnetisable materials and the deflecting means (24') is magnetically shielded.

    Abstract translation: 本发明的主题涉及包括激光扫描显微镜（50,50'）和分辨率低于激光扫描显微镜（50,50'）的分辨率的测量装置的组合成像系统（10'）， 并且在比激光扫描显微镜（50,50'）的空间尺度更大的空间尺度上进行测量。 本发明的主题还涉及MRI兼容的激光扫描显微镜，其包括：用于偏转激光束（13）的偏转装置（24'），物镜（28'），可调物镜臂（38），距离适配器（39） 和至少一个检测器（30'）。 MRI兼容激光扫描显微镜的本质在于至少物镜（28'），可调物镜臂（38），距离适配器（39）和至少一个检测器（30'）由不可磁化的 材料和偏转装置（24'）被磁屏蔽。

    Laser scanning microscope
    78.
    发明公开
    Laser scanning microscope 审中-公开
    激光扫描-Mikroskop

    公开(公告)号：EP2146234A1

    公开(公告)日：2010-01-20

    申请号：EP08462010.3

    申请日：2008-12-31

    Applicant: Femtonics Kft.

    Inventor： Rózsa, Balázs ,  Katona, Gergely ,  Vizi, E. Szilveszter

    IPC: G02B21/00

    CPC classification number: G02B21/002 ,  G02B21/006 ,  G02B21/0076 ,  G02B21/241

    Abstract: The present invention relates to a laser scanning microscope (10) for scanning a sample, the microscope having
    - focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13),
    - drive means (18) for displacing the at least one optical element of the focusing means (15),
    - at least one detector means (24') for detecting light (13') reflected from the sample or back fluoresced light (13') emitted by the sample,

    characterised by the detector means (24') being connected to the drive means (18) such that the drive means (18) may simultaneously displace the detector means (24') with the at least one optical element of the focusing means (15).
    The present invention further relates to a method of performing 3D scanning with the inventive laser scanning microscope.

    Abstract translation: 本发明涉及一种用于扫描样品的激光扫描显微镜（10），该显微镜具有聚焦装置（15），该聚焦装置具有焦平面（29）并包括用于聚焦激光束（13）的至少一个光学元件， 用于移动聚焦装置（15）的至少一个光学元件的驱动装置（18）， - 用于检测从样品反射的光（13'）或反射荧光的光（13'）的至少一个检测器装置（24' 由所述样本发射，其特征在于，所述检测器装置（24'）连接到所述驱动装置（18），使得所述驱动装置（18）可以同时使所述检测器装置（24'）移位所述至少一个所述光学元件 聚焦装置（15）。 本发明还涉及使用本发明的激光扫描显微镜执行3D扫描的方法。

    METHOD FOR SCANNING ALONG A 3-DIMENSIONAL LINE AND METHOD FOR SCANNING A REGION OF INTEREST BY SCANNING A PLURALITY OF 3-DIMENSIONAL LINES
    79.
    发明公开
    METHOD FOR SCANNING ALONG A 3-DIMENSIONAL LINE AND METHOD FOR SCANNING A REGION OF INTEREST BY SCANNING A PLURALITY OF 3-DIMENSIONAL LINES 审中-公开

    公开(公告)号：EP4235292A3

    公开(公告)日：2023-09-06

    申请号：EP23173446.8

    申请日：2017-08-31

    Applicant: Femtonics Kft.

    Inventor： The designation of the inventor has not yet been filed

    IPC: G02B21/00 ,  G02F1/33

    Abstract: The invention relates to a method for correcting motion artifacts of in vivo fluorescence measurements by scanning a plurality of somata with a 3D laser scanning microscope having acousto-optic deflectors for deflecting a focus spot of a laser beam, the method comprising:
    selecting a scanning point within each somata,
    extending each scanning point to a plurality of parallel, substantially straight drift lines defining cuboides, preferably having sizes matched to the diameters of the somata, which cuboides are substantially centred on the given scanning points,
    scanning each drift line by focusing the laser beam at one end of the drift line and providing linear or non-linear chirp signals for the acoustic frequencies in the deflectors for continuously moving the focus spot along the drift line,
    repeating the measurement to obtain a time series of the scanned cuboids, and
    correcting motion artifacts using the time series.
    The invention further relates to a method for correcting motion artifacts of in vivo fluorescence measurements by scanning a 3D trajectory by extending each scanning point of the 3D trajectory to a plurality of parallel substantially straight drift lines which define a substantially continuous volume containing the 3D trajectory.

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