PARTICULATE DETECTING AND OPTICAL COUPLING ARRANGEMENTS
    72.
    发明授权
    PARTICULATE DETECTING AND OPTICAL COUPLING ARRANGEMENTS 失效
    设备对于粒子检测和光学式离合器。

    公开(公告)号:EP0464048B1

    公开(公告)日:1995-08-16

    申请号:EP90904402.6

    申请日:1990-03-16

    Abstract: Apparatus for detecting particulates (46) within a medium in a chamber (10) comprises a photo-detector (14) which is maintained at a stable low temperature by a Peltier type cooling device (42). Scattered light from the particulate (46) is focussed by a spherical lens (34) onto the input face (30) of a rod lens (22). The latter has an optical pitch of 0.5 and transfers the image to its output face (25) whence it passes via a light pipe (18) to the sensitive area (16) of the photo-electric device (14). The rod lens (22) provides an inexpensive means for transferring the light and which provides a thermal barrier. Thus, although the photo-electric device (14) is held at a low temperature, the input face (30) of the rod lens (22) can be held at the temperature of the medium within the chamber (10) and is not subjected to the formation of mist or ice. The lens (34) is mounted by means of a collar (28) which is slidable into a position in which the lens (34) focusses the input light onto the face (30) of the lens (22), and then secured in this position by ultra-violet-cured adhesive fillets (32, 34).

    AVALANCHE PHOTODIODE QUENCHING CIRCUIT
    73.
    发明授权
    AVALANCHE PHOTODIODE QUENCHING CIRCUIT 失效
    所得款项CHUNG电路是否雪崩光电二极管。

    公开(公告)号:EP0481016B1

    公开(公告)日:1994-05-25

    申请号:EP90917799.0

    申请日:1990-07-02

    CPC classification number: G01J1/44 G01J2001/4466 G01S7/4861

    Abstract: An avalanche photodiode quenching circuit (20) incorporates an avalanche photodiode (APD) (22) and a first comparator (C1) responsive to reduction in APD voltage. The comparator (C1) is arranged to activate an APD quench circuit (38) in response to APD avalanche initiation. The circuit (20) also includes a second comparator (C2) arranged to reset the first comparator input (N2) in response to a further reduction in APD voltage caused by initiation of quenching. The second comparator (C2) is also connected to a monostable circuit (48) arranged to latch the first comparator output response to resetting. The monostable circuit (48) maintains the first comparator output level constant until the APD (22) has recharged.

    AVALANCHE PHOTODIODE QUENCHING CIRCUIT
    74.
    发明授权
    AVALANCHE PHOTODIODE QUENCHING CIRCUIT 失效
    AVALANCHE光电焦点电路

    公开(公告)号:EP0333751B1

    公开(公告)日:1992-07-22

    申请号:EP87907973.9

    申请日:1987-11-23

    CPC classification number: G01J1/44 G01J2001/442 G01J2001/4466

    Abstract: An avalanche photodiode quenching circuit (10) comprises a low value photodiode series resistor (20) and a comparator amplifier (40). The comparator (40) compares the photodiode potential with a reference voltage and changes state rapidly after initiation of a photodiode avalanche. The photodiode (12) is actively quenched by taking its potential below breakdown. This is achieved by a fast-switching transistor (30) activated by avalanche detection at the comparator. A further fast-switching transistor (42) is arranged to reset the comparator input (38) after a preset delay following avalanche detection. The photodiode (12) recharges passively through the series resistor (20) at a rapid rate since this resistor has a low value. The transistors (30) and (42) are diactivated by comparator reset, the latter after the preset delay once more, and are isolated from the photodiode (12) during recharge by diodes (16) and (18). The invention avoids the use of active photodiode reset pulses, and has constant output pulse width and well-defined dead-time.

    Positionsempfindlicher Fotodetektor
    76.
    发明公开
    Positionsempfindlicher Fotodetektor 失效
    Positionsempfindlicher Fotodetektor。

    公开(公告)号:EP0385135A1

    公开(公告)日:1990-09-05

    申请号:EP90102238.4

    申请日:1990-02-05

    Abstract: Die Erfindung betrifft einen positonsempfindlichen Fotodetektor zur Erfassung der ortsbezogenen Intensitätsverteilung von einer auf einer Empfängerfläche erzeugten Abbildung, wie er insbesondere für die LaserTriangulation verwendet werden kann. Durch die Trennung von Empfängerfläche (2) und optoelektronischen Wandlern (3) durch zwischengeschaltete Lichtleiter (1) und durch das Vorhandensein einer Vielzahl von Lichtleitern innerhalb einer Empfängerfläche (2) wird eine hochaufgelöste Verarbeitung einer auf der Empfängerfläche (2) vorhandenen Abbildung, beispielsweise einem Lichtfleck (6) bei gleichzeitiger Auslesung mittels sämtlicher Lichtleiter 1.1 bis 1.n von der Empfängerfläche ermöglicht. Somit ist eine parallele Verarbeitung der in jedem Element innerhalb der Empfängerfläche (2) gleichzeitig vorhandenen Signale, wie beispielsweise dem Lichtfleck (6), ohne Verzögerung möglich. Die örtliche Zuordnung richtet sich auf die detektorbezogene Koordinatenrichtung (X).

    Abstract translation: 本发明涉及一种用于检测在接收器表面上产生的图像的空间参考强度分布的位置敏感光电检测器,例如可用于激光三角测量。 通过插入的光导(1)分离接收器表面(2)和光电换能器(3),并且在接收器表面(2)内存在多个光导,使得能够对存在的图像进行高分辨率处理 在接收器表面(2)上,例如光接收器(6),结合从接收器表面通过所有光导1.1至1.n的同时读出。 结果,可以毫不延迟地并行处理在接收器表面(2)内的每个元件中同时存在的信号,例如光斑(6)。 空间分配由检测器参考坐标方向(X)确定。

    Single photon semiconductor avalanche photodiode and active quenching circuit assembly
    77.
    发明公开
    Single photon semiconductor avalanche photodiode and active quenching circuit assembly 失效
    有源猝熄电路,用于通过单光子半导体雪崩光电二极管,适于与位于远程位置的光电二极管的操作触发。

    公开(公告)号:EP0365095A2

    公开(公告)日:1990-04-25

    申请号:EP89202618.8

    申请日:1989-10-17

    Inventor: Cova, Sergio

    CPC classification number: H03K17/74 G01J1/44 G01J2001/4466 H03K17/941

    Abstract: The quenching circuit comprises a signal comparator (CP) having a first input connected to the photodiode (SPAD) under control and a second input connected to a balancing impedance (C) equal to that of the photodiode. At the output of the comparator (CP) there is connected a signal generator (M), which generates a quenching signal (S) having a predetermined duration each time there is an imbalance between the two inputs of the comparator. Circuital switching means (I1, I2, I3, I4) are provided, capable of holding the bias voltage of the photodiode normally high and of lowering it below the breakdown level following the generation and for the entire holding time of said quenching signal.

    Abstract translation: 淬火电路包括具有连接到在控制之下的光电二极管(SPAD)和连接到一个平衡阻抗(C)等于第二输入以做了光电二极管的第一输入端的信号比较器(CP)。 在比较器(CP)的输出上连接有信号发生器(M)哪些基因速率每次具有预定的持续时间淬火信号(S)有比较器的两个输入端之间的不平衡。 Circuital开关装置(I1,I2,I3,I4)被提供,能够保持光电二极管通常高的偏置电压,并降低它低于击穿电平以下的生成和对所述淬火信号的整个保持时间。

    형광수명 측정장치 및 측정방법
    78.
    发明授权
    형광수명 측정장치 및 측정방법 有权
    荧光寿命测量装置和测量方法

    公开(公告)号:KR101835815B1

    公开(公告)日:2018-03-07

    申请号:KR1020160172862

    申请日:2016-12-16

    Abstract: 본발명의일 실시예에따른형광수명측정장치는조사광을발생시키는조사광발생부, 상기조사광으로형광분자를포함하는샘플을조사하여생성되는형광광자를수집하는형광광자검출부,상기수집된형광광자를제1클럭신호, 상기샘플을통하지않은조사광을제2클럭신호로변환하는변환부, 상기변환부로부터수집된형광광자의형광수명을분석하는제1모듈, 상기제1모듈로부터샘플의관심영역(ROI, Range of interesting)을지정하는제어부, 상기관심영역에대응되는형광광자의형광수명을분석하는제2모듈을포함한다.

    Abstract translation: 根据本发明实施例的荧光寿命测量设备包括:荧光光子检测单元,用于收集通过用照射光照射包含荧光分子的样品而产生的荧光光子; 第一模块,用于分析从转换部分收集的荧光光子的荧光寿命;第二模块,用于分析从第一模块收集的荧光光子的荧光寿命; 第二个模块用于分析对应于感兴趣区域的荧光光子的荧光寿命。

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