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71.发明公开VERFAHREN ZUR KOMPENSATION VON TEMPERATURBEDINGTEN MESSFEHLERN IN EINEM KONFOKAL CHROMATISCH MESSENDEN ABSTANDSSENSOR 有权方法补偿温度相关的测量误差的一个共焦色测量距离传感器
公开(公告)号：EP2149028A1
公开(公告)日：2010-02-03
申请号：EP08758152.6
申请日：2008-05-21
Applicant: Micro-Epsilon Messtechnik GmbH & Co. KG
Inventor： HOENICKA, Reinhold , FINK, Alexander
CPC classification number: G01B11/026 , G01B2210/50 , G01J3/02 , G01J3/0208 , G01J3/024 , G01J3/12 , G02B21/0064
Abstract: According to the invention, a method for compensating for temperature related measurement errors in an optical arrangement, comprising at least one lens (2) is designed with a view to an economical and reliable as possible compensation for temperature related measurement errors without significant increased production expense, wherein a multicoloured beam (5) is passed through the optical arrangement (1, 1'), which is focussed at points at varying distances from the lens (2) as a result of the chromatic aberration of the lens (2), at least a part of the spectrum of the light beam (5) being at least partly reflected within the optical arrangement (1, 1') and directed to a detector device (12) by means of which a determination of a spectrum is carried out, the temperature of the arrangement (1, 1') is determined from the spectrum recorded by the detection device (12) and a compensation for temperature related measurement errors is carried out based on the temperature determined thus. A corresponding optical arrangement in disclosed.
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公开(公告)号：EP1019685B1
公开(公告)日：2004-10-27
申请号：EP97930542.2
申请日：1997-07-17
Applicant: VALTION TEKNILLINEN TUTKIMUSKESKUS
Inventor： MALINEN, Jouko
IPC: G01J3/10
CPC classification number: G01J3/10 , G01J3/0205 , G01J3/0208 , G01J3/021 , G01J3/0216 , G01J3/0218 , G01J3/024 , G01J3/0259 , G01J3/0286 , G01J3/18 , G01J3/32 , G01J2003/104
Abstract: The present invention concerns an LED spectrometer operating without moving parts, according to the sweep principle, and appropriate to serve as a structural component in many kinds of spectroscopic concentration analysers. The design of the invention affords the advantage that, even at its minimum, the optical power of the LED spectrometer of the invention is about fivefold compared with designs of prior art. Furthermore, improvement of the efficiency of the LED radiation source and of that of the optics has brought a multiple augmentation in power to the wavelength spectrum sent out by the radiation source. In the design of the invention, concentrators (6) of non-imaging type are used to collimate the wavelength spectrum emitted by the LEDs (3).
Abstract translation: 本发明涉及根据扫描原理工作而没有移动部件的LED光谱仪，并且适合用作多种光谱浓度分析仪中的结构部件。 与现有技术的设计相比，本发明的设计提供的优点是，即使在最小的情况下，本发明的LED光谱仪的光功率也是大约五倍。 此外，提高LED辐射源和光学器件的效率已经为辐射源发出的波长谱带来了多倍的功率增加。 在本发明的设计中，使用非成像类型的聚光器（6）来准直由LED（3）发射的波长谱。
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公开(公告)号：EP0241135B1
公开(公告)日：1991-04-17
申请号：EP87301949.1
申请日：1987-03-06
Applicant: Hewlett-Packard Company
Inventor： Hopkins II, George W. , Willis, Barry G.
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0229 , G01J3/024
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74.发明公开Flat band optical relay using apertures and simple lenses 失效Optisches Breitband-Abbildungsystem mit Aperturen und einfachen Linsen。
公开(公告)号：EP0241135A2
公开(公告)日：1987-10-14
申请号：EP87301949.1
申请日：1987-03-06
Applicant: Hewlett-Packard Company
Inventor： Hopkins II, George W. , Willis, Barry G.
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0229 , G01J3/024
Abstract: An optical relay having a pair of simple lenses and an opaque barrier defining an aperture. In a spectrometer, the optical relay is positioned between a light source and an opaque barrier defining a slit to focus light of a reference wavelength w r onto the slit. The location of the aperture and the choice of w r are selected so that the flux of light through the slit is substantially flat as a function of wavelength.
Abstract translation: 具有一对简单透镜和限定孔径的不透明屏障的光学继电器。 在光谱仪中，光学继电器位于光源和限定狭缝的不透明屏障之间，以将参考波长wr的光聚焦到狭缝上。 选择孔的位置和选择wr，使得通过狭缝的光通量基本上是波长的函数。
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公开(公告)号：EP0135761A2
公开(公告)日：1985-04-03
申请号：EP84109506.0
申请日：1984-08-09
Applicant: THE PERKIN-ELMER CORPORATION
Inventor： Young, Eugene F.
CPC classification number: G01J3/02 , G01J3/0229 , G01J3/024 , G01J3/08 , G01J3/453
Abstract: A spectrophotometer includes means for ensuring that the active area of a detector is always filled regardless of the resolution aperture setting of the instrument.
Abstract translation: 分光光度计包括用于确保检测器的有效区域总是被填充的装置，而与仪器的分辨率孔径设置无关。
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Patent Agency Ranking
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77.发明专利Spectrum measurement device, image evaluation device and image formation device 有权光谱测量装置，图像评估装置和图像形成装置
公开(公告)号：JP2013186023A
公开(公告)日：2013-09-19
申请号：JP2012052478
申请日：2012-03-09
Applicant: Ricoh Co Ltd , 株式会社リコー
Inventor： KAMIJO TADAHIRO , SHINPO KOHEI , KUBOTA YOICHI , SEO MANABU
CPC classification number: G01J3/42 , G01J3/0208 , G01J3/0229 , G01J3/024 , G01J3/0262 , G01J3/0297 , G01J3/18 , G01J3/24 , G01J3/2823 , G01J3/50 , G01J2003/503 , G03G15/00 , G03G15/5062
Abstract: PROBLEM TO BE SOLVED: To provide a spectrum measurement device that allows a wavelength spectrum of reflection light from an object to be stably measured with high accuracy.SOLUTION: A spectrum measurement device 10 comprises: a light source unit 11 that irradiates a recording paper P with light; an aperture element 13 that is arranged on an optical path of reflection light from the recording paper P and provided with a plurality of apertures; a diffraction element 15 that is arranged on optical paths of a plurality of pieces of light which, out of the reflection light, have passed through a plurality of apertures; a mask element 17 that includes a plurality of passage parts allowing a plurality of +1-order diffraction images, out of a plurality of diffraction images of the plurality of pieces of light formed by the diffraction element 15, to individually pass through, and a light shield part shielding diffraction images in orders other than +1-order; and a linear sensor 16 that includes a plurality of spectrum sensors individually receiving the plurality of +1-order diffraction images passing through the plurality of passage parts.
Abstract translation: 要解决的问题：提供一种允许以高精度稳定地测量来自物体的反射光的波长谱的光谱测量装置。解决方案：光谱测量装置10包括：光源单元11，其照射记录纸P 与光; 光圈元件13，其设置在来自记录纸P的反射光的光路上并且设置有多个孔; 配置在多个光的光路上的衍射元件15，其在反射光中已经通过多个孔; 掩模元件17，其包括多个通过衍射元件15形成的多个光的多个衍射图像中的多个+1阶衍射图像的通过部分，以分别通过， 屏蔽部分屏蔽除+ 1级以外的顺序的衍射图像; 以及线性传感器16，其包括分别接收通过多个通道部分的多个+ 1级衍射图像的多个频谱传感器。
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公开(公告)号：JP5265632B2
公开(公告)日：2013-08-14
申请号：JP2010181806
申请日：2010-08-16
Applicant: 株式会社サイム
IPC: G01N21/65
CPC classification number: G01N21/65 , G01J3/02 , G01J3/0208 , G01J3/0216 , G01J3/0221 , G01J3/024 , G01J3/44
Abstract: An apparatus for receiving Raman scattering signals, includes an optic light-collection system for collecting Raman scattering lights having scattered from an object when excitation laser beams are irradiated thereto, a spectroscope including a diffraction grating, for separating the Raman scattering lights into its spectral components, and an optical path converter including at least one optical waveguide for converting lights having been collected by the optic light-collection system into slit-shaped lights in compliance with an orientation of the diffraction grating.
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公开(公告)号：JP5111163B2
公开(公告)日：2012-12-26
申请号：JP2008053720
申请日：2008-03-04
Applicant: 浜松ホトニクス株式会社
Inventor： 勝己 柴山
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/024 , G01J3/0259 , G01J3/0262 , G01J3/0286 , G01J3/0291 , G01J3/18
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公开(公告)号：JP2012230074A
公开(公告)日：2012-11-22
申请号：JP2011099894
申请日：2011-04-27
Applicant: Hitachi High-Technologies Corp , 株式会社日立ハイテクノロジーズ
Inventor： KURIMOTO DAISUKE , WAKUI TAKAYUKI
IPC: G01J3/04
Abstract: PROBLEM TO BE SOLVED: To select wavelength resolution capable of detecting a real spectral peak of a sample based on measurer's experience and knowledge when a sample whose spectral shape is unknown is to be measured.SOLUTION: Wavelength resolution setting operation can be automatically set in accordance with a measurement spectrum. Therefore, a plurality of slits with respectively different aperture widths are prepared and a wavelength of monochromatic light passing an individual slit is scanned within a predetermined wavelength range to measure a spectrum in each aperture width of the slit. Based on compared results of a plurality of spectra measured about the slits with respectively different aperture widths, a slit condition for regulating relation between the aperture width of at least one slit to be used for measurement of the sample and at least one wavelength range applying the aperture width of the slit is determined.
Abstract translation: 要解决的问题：当要测量其光谱形状未知的样品时，基于测量者的经验和知识选择能够检测样品的实际光谱峰值的波长分辨率。
解决方案：可以根据测量光谱自动设置波长分辨率设置操作。 因此，准备具有不同孔径宽度的多个狭缝，并且在预定波长范围内扫描通过单个狭缝的单色光的波长，以测量狭缝的每个孔径宽度中的光谱。 基于对具有分别不同的孔径宽度的狭缝测量的多个光谱的比较结果，用于调节用于测量样品的至少一个狭缝的孔径宽度与施加样品的至少一个波长范围之间的关系的狭缝条件 确定狭缝的孔径宽度。 版权所有（C）2013，JPO＆INPIT
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