公开(公告)号：WO2011082695A1

公开(公告)日：2011-07-14

申请号：PCT/CN2011/070145

申请日：2011-01-10

Applicant: OTO PHOTONICS, INC. ,  KO, Cheng-Hao

Inventor： KO, Cheng-Hao

IPC: G02B5/18 ,  G02B6/10 ,  G01N21/00

CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/20

Abstract: A spectrometer capable of eliminating side-tail effects includes a body and an input section, a diffraction grating, an image sensor unit and a wave-guiding device, which are mounted in the body. The input section receives a first optical signal and outputs a second optical signal travelling along a first light path. The diffraction grating receives the second optical signal and separates the second optical signal into a plurality of spectrum components, including a specific spectrum component travelling along a second light path. The image sensor unit receives the specific spectrum component. The wave-guiding device includes first and second reflective surfaces opposite to each other and limits the first light path and the second light path between them to guide the second optical signal and the specific spectrum component. The first and second reflective surfaces are separated from a light receiving surface of the image sensor unit by a predetermined gap.

Abstract translation: 能够消除侧尾效应的光谱仪包括安装在本体中的主体和输入部，衍射光栅，图像传感器单元和波导装置。 输入部分接收第一光信号并输出​​沿着第一光路行进的第二光信号。 衍射光栅接收第二光信号并将第二光信号分离成多个光谱分量，包括沿着第二光路行进的特定光谱分量。 图像传感器单元接收特定的光谱分量。 波导装置包括彼此相对的第一和第二反射表面，并限制它们之间的第一光路和第二光路，以引导第二光信号和特定光谱分量。 第一和第二反射表面与图像传感器单元的光接收表面以预定的间隙分开。

公开(公告)号：WO2007050123A9

公开(公告)日：2007-06-28

申请号：PCT/US2006019161

申请日：2006-05-17

Applicant: HONEYWELL INT INC ,  BONNE ULRICH ,  DETRY JAMES ,  MARTA TERESA ,  JOHNSON KLEIN

Inventor： BONNE ULRICH ,  DETRY JAMES ,  MARTA TERESA ,  JOHNSON KLEIN

IPC: G01J3/20

CPC classification number: G01J3/20 ,  G01F1/6845 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0291 ,  G01N21/05 ,  G01N21/65 ,  G01N21/658 ,  G01N27/02 ,  G01N2021/0346 ,  G01N2021/058 ,  G01N2021/651

Abstract: An optical spectrometer (10, 20, 30, 40, 50) having a multi-wafer structure. The structure may be fabricated with MEMS technology. The spectrometer may be integrated with a fluid analyzer (110). A reflective grating (14) such as a diffraction or holographic grating situated on the circumference of a Rowland circle (15) along with a point (17) of light emission and a detector (19) may be a configuration of the spectrometer. Some configurations may use an external light source where the light may be optically conveyed to the point (17) of emission on the circle. There may be a Raman configuration where an interaction of light (48) with a sample or an interactive film (49) of a channel in a fluid analyzer is the point of light emission for the spectrometer. In some configurations of the spectrometer, the grating (14, 55) and/or the film may be reflective or transmissive.

Abstract translation: 一种具有多晶片结构的光学分光计（10,20,30,40,50）。 该结构可以用MEMS技术制造。 光谱仪可以与流体分析仪（110）集成。 位于罗兰圆（15）的圆周上的衍射或全息光栅以及光发射点（17）和检测器（19）的反射光栅（14）可以是光谱仪的配置。 一些配置可以使用外部光源，其中光可以被光学地传送到圆上发射的点（17）。 可能存在拉曼配置，其中光（48）与流体分析器中的通道的样品或交互式膜（49）的相互作用是光谱仪的光发射点。 在光谱仪的一些配置中，光栅（14,55）和/或膜可以是反射或透射的。

公开(公告)号：WO2006063637A1

公开(公告)日：2006-06-22

申请号：PCT/EP2005/011844

申请日：2005-11-04

Applicant: SPECTRO ANALYTICAL INSTRUMENTS GMBH & CO. KG ,  JOOSTEN, Heinz-Gerd

Inventor： JOOSTEN, Heinz-Gerd

IPC: G01J3/443 ,  G01J3/28 ,  G01N21/71 ,  G01J3/30 ,  G01J3/04

CPC classification number: G01N21/274 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/027 ,  G01J3/04 ,  G01J3/20 ,  G01J3/28

Abstract: Die Erfindung betrifft eine Spektrometeroptik mit einem Strahlengang von einer Strahlenquelle zu einer Anzahl von nicht ortsauflösenden elektrooptischer Sensoren, wobei der Strahlengang einen Eintrittsspalt (7), ein dispersives Element (8) und eine Anzahl von auf einer Fokalkurve angeordneten Austrittspalten (9) aufweist, wobei weiter ein ersten Aktuator zur Änderung des Einfallswinkels E (23) zwischen dem Strahl von dem Eintrittsspalt auf das dispersive Element und der Normalen (13) zu dem dispersiven Element, eine Anzahl von zweiten Aktuatoren zum Verfahren der Austrittsspalte tangential zur Fokalkurve (6) oder in Umfangsrichtung entlang der Fokalkurve (6) und eine Steuerung, die dazu eingerichtet ist, den ersten Aktuator und die zweiten Aktuatoren zur Durchführung einer Kalibrierung anzusteuern, vorgesehen ist.

Abstract translation: 本发明涉及与来自辐射源的光束路径的光谱仪光学器件以许多非空间分辨光电传感器，其具有入口狭缝（7），色散元件（8）和多个设置在一个焦点弯道出口狭槽（9），其中，所述光路 还包括用于从入口狭缝色散元件和正常（13）连接到色散元件，用于移动所述出口槽切向于聚焦曲线多个第二致动器上改变入射角电子商务（23）的光束之间的角的第一促动器（6），或在 沿聚焦曲线（6），并且适于驱动所述第一促动器和所述第二致动器用于执行一个校准控制器周向设置。

公开(公告)号：WO02001198A1

公开(公告)日：2002-01-03

申请号：PCT/CA2001/000582

申请日：2001-04-30

IPC: G01J3/20 ,  G01J3/42 ,  G01N21/03 ,  G01N21/05 ,  G01N21/31 ,  G01N21/33

CPC classification number: G01N21/0303 ,  G01J3/20 ,  G01J3/42 ,  G01N21/031 ,  G01N21/05 ,  G01N21/31 ,  G01N21/33 ,  G01N2021/3129 ,  G01N2021/3133 ,  G01N2021/3137 ,  G01N2021/3155 ,  G01N2021/3185

Abstract: A spectrometer or multiple wavelength absorbance detection method and apparatus providing improved accuracy for an array of measurements at different wavelengths. The spectrometer utilizes a multiple wavelength illumination system with an array of independent detectors with different pathlength cells, where each cell is illuminated with predominately monochromatic light after separation by a light dispersing element. Each sample cell has an optical pathlength, optics and photodetection device that are optimized for its particular wavelength to accurately measure absorbance through an expected substance.

Abstract translation: 一种对不同波长的测量阵列提供改进的精度的光谱仪或多波长吸光度检测方法和装置。 光谱仪利用具有不同光程长度单元的独立检测器阵列的多波长照明系统，其中通过光分散元件分离后，每个单元被主要单色光照射。 每个样品池具有光学长度，光学和光电检测装置，其针对其特定波长进行优化，以通过预期物质精确测量吸光度。

公开(公告)号：WO1998028609A1

公开(公告)日：1998-07-02

申请号：PCT/IB1997001526

申请日：1997-12-04

Applicant: PHILIPS ELECTRONICS N.V. ,  PHILIPS NORDEN AB

Inventor： PHILIPS ELECTRONICS N.V. ,  PHILIPS NORDEN AB ,  VAN EGERAAT, Walterus, Alphonsus, Laurentius, Antonius

IPC: G01N23/207

CPC classification number: G01N23/20008 ,  G01J3/20 ,  G01N23/2055

Abstract: An imaging optical system having a Rowland geometry can be used in a spectrometer for X-ray fluorescence. For the focusing of the X-ray beam emanating from the specimen to be analyzed, use is made of a curved analyzer crystal (28) whose radius of curvature may be variable, as in the case of a crystal surface (29) in the form of a logarithmic spiral (40). If such an analyzer crystal is to be made sufficiently large so as to achieve adequate intensity in the X-ray detector, a part of the crystal would have to be given a radius of curvature which is smaller than permissible so as to avoid fracturing of the crystal. In accordance with the invention, a first part (40) of the reflective surface (29) has a radius of curvature which is dependent on the location on the crystal whereas another part (42) of the reflective surface has a constant radius of curvature (44). A crystal part having a constant radius of curvature exhibits angular deviations, but for as long as these angular deviations are smaller than a given (not very low) limit value, they can be ignored in relation to other, larger deviations of the log spiral part. Such larger deviations occur notably when a multilayer mirror is chosen for the analyzer crystal (28).

Abstract translation: 具有Rowland几何形状的成像光学系统可用于X射线荧光的光谱仪中。 对于要从​​要分析的样品发出的X射线束的聚焦，使用其曲率半径可以是可变的弯曲分析器晶体（28），如在晶体表面（29）的情况下， 的对数螺旋（40）。 如果要使这种分析器晶体足够大以便在X射线检测器中获得足够的强度，那么晶体的一部分必须具有比允许的小的曲率半径，以避免裂纹 水晶。 根据本发明，反射表面（29）的第一部分（40）具有取决于晶体上的位置的曲率半径，而反射表面的另一部分（42）具有恒定的曲率半径（ 44）。 具有恒定曲率半径的晶体部分表现出角度偏差，但是只要这些角度偏差小于给定（非常低）的极限值，它们可以相对于对数螺旋部分的其它较大偏差而被忽略 。 当为分析器晶体（28）选择多层反射镜时，这种较大的偏差显着出现。

公开(公告)号：WO2016040603A1

公开(公告)日：2016-03-17

申请号：PCT/US2015/049386

申请日：2015-09-10

Applicant: OPTONET, INC. ,  HO, Seng-Tiong ,  HUANG, Yingyan

Inventor： HO, Seng-Tiong ,  HUANG, Yingyan

IPC: G01J3/18 ,  G01J3/28 ,  G01N21/31

CPC classification number: G01J3/20 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/04 ,  G01J3/18 ,  G01J3/1895 ,  G01J3/24 ,  G01J3/28 ,  G01J2003/1842 ,  G01J2003/1847 ,  G02B5/1861 ,  G02B6/29326 ,  G02B6/2938

Abstract: The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location; of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be ah integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.

Abstract translation: 本申请公开了一种包括紧凑弯曲光栅（CCG）及其相关联的紧凑弯曲光栅光谱仪（CCGS）或紧凑弯曲光栅波长多路复用器/解复用器（WMDM）模块的系统及其制造方法。 该系统能够实现非常小的（分辨率vs.尺寸）RS因子。 那个地点; 可以调节入口狭缝和检测器，以便为特定设计目标具有最佳性能。 使用取决于工作波长的规定公式计算初始槽间距。 基于两个条件计算凹槽的位置。 第一个是相邻凹槽之间的路径差应为介质中的波长的整数倍，以便在检测器或第一锚定输出狭缝处聚焦的无差异光栅，即使是从入射狭缝处的大的光束衍射角， 输入狭缝，第二个特定于弯曲光栅光谱仪的特定设计目标。

公开(公告)号：WO2015199861A1

公开(公告)日：2015-12-30

申请号：PCT/US2015/032451

申请日：2015-05-26

Applicant: INTEL CORPORATION

Inventor： HUTCHISON, David, N. ,  KIM, Kyu Hyun ,  RONG, Haisheng ,  HECK, John ,  XU, Shengbo

IPC: G01J3/18 ,  G02B6/122 ,  G01N21/27

CPC classification number: G02B6/4295 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0297 ,  G01J3/1809 ,  G01J3/1895 ,  G01J3/20 ,  G01J3/32 ,  G02B6/00 ,  G02B6/12033

Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

Abstract translation: 单片光子集成电路（PIC）提供光谱功能的技术和机制。 在一个实施例中，PIC包括光子器件，第一波导和第二波导，其中第一波导和第二波导中的一个包括相对于PIC的衬底自由移动的释放部分。 在用于评估被测材料的计量循环期间，控制逻辑操作致动器以相对于光子器件连续配置释放部分的多个位置。 在另一个实施例中，来自第一波导的光在计量周期期间由光子器件的光栅进行各种衍射，其中光的一部分被引导到第二波导中。 对于释放部分的不同位置，可以连续地检测衍射到第二波导中的不同波长的光，以确定波长范围上的光谱测量。

公开(公告)号：WO2013049942A1

公开(公告)日：2013-04-11

申请号：PCT/CA2012/050706

申请日：2012-10-05

Applicant: VALORBEC S.E.C. ,  POTTIER, Pierre ,  PACKIRISAMY, Muthukumaran

Inventor： POTTIER, Pierre ,  PACKIRISAMY, Muthukumaran

IPC: G02B27/00 ,  G02B1/02 ,  G02B17/00 ,  G02B5/18 ,  H04J14/02

CPC classification number: G02B6/34 ,  G01J3/0256 ,  G01J3/18 ,  G01J3/20 ,  G02B5/1814 ,  G02B5/1861 ,  G02B6/12007 ,  G02B6/124 ,  G02B6/29328 ,  G02B27/4244

Abstract: A concave diffraction grating for integrated optics is constructed by replacing the reflective metallic part by either multiple thin elements of metal or multiple elements of dielectric material, each partially reflecting the light, and arranged on elliptical fashion in order to distribute the diffraction/reflection of light and provide aberration-free focusing, by combining diffraction condition and Bragg condition of these curved reflectors.

Abstract translation: 用于集成光学器件的凹面衍射光栅通过用金属或多个介电材料元件的多个薄元件代替反射金属部件来构造，每个元件均部分地反射光，并以椭圆形方式布置，以分布光的衍射/反射 并通过组合这些弯曲反射器的衍射条件和布拉格条件，提供无像差聚焦。

公开(公告)号：WO2005050149A3

公开(公告)日：2009-04-16

申请号：PCT/EP2004013135

申请日：2004-11-18

Applicant: MBR GMBH ,  JUNGMANN HOLGER ,  SCHIETZEL MICHAEL ,  SCHMIDT MARTIN

Inventor： JUNGMANN HOLGER ,  SCHIETZEL MICHAEL ,  SCHMIDT MARTIN

IPC: G01J3/20 ,  G01J3/06 ,  G01J3/18 ,  G01N21/33

CPC classification number: G01J3/20 ,  G01J3/06 ,  G01N21/33 ,  G01N2201/0221

Abstract: The invention relates to a method and device for collecting spectrometric measuring signals. The aim of said invention is to deliver solutions which make it possible to exactly collect spectrometric measuring signals in a low-cost matter. Said aim is attained by a spectrometric measuring device comprising an input splitting device for passing studied radiation, a Rowland grid device which is associated therewith and reflects incident radiation by spectral spreading, a recording device for recording the narrow part of the spectrum spread by said Rowland grid device and a guiding device which guides and displaces the recording device on a detection path whose spectral clearness is substentially contrast, whereby making it possible to obtain an accurate spectral distribution of studied light in an advantage manner. Said invention also makes it possible to form a recording device or to couple said device to an evaluation system in an operational manner in such a way that possible dependencies of the recorded intensity with respect to the wavelength of the light incident to the recording device are compensated by evaluation procedures. Compensating parameters can determined by gauging procedures and recorded in the internal memory of the device.

Abstract translation: 本发明涉及一种方法和用于收集光谱测量信号的装置。 本发明具有提供解决方案，通过该精确的测量，光谱测量信号被以较低的成本成为可能的对象。 根据本发明的这个目的通过一种分光测定装置，其包括一个入口狭缝实现装置，用于允许试剂的通道进行测试辐射，入射狭缝中的一个装置相关联罗兰光栅装置，反射入射辐射光谱它们散开，一个检测装置，用于检测所述由一个窄段 罗兰光栅装置扇形谱; 和导向装置，用于引导所述检测装置，其中所述导向装置被设计成使得其移动检测装置以基本上恒定的光谱锐度的检测路径。 这使得可以在设置要精确地检测的光的光谱分布的有利方式。 所以能够形成检测装置，可操作地左右以耦合至评价系统，即所检测到的强度的任何依赖关系可以通过在检测入射光的波长来补偿通过评估程序装置。 补偿参数可以通过校准过程确定，并存储在设备的内部存储装置。

公开(公告)号：WO2008018913A3

公开(公告)日：2008-10-09

申请号：PCT/US2007002927

申请日：2007-02-01

Applicant: FOSTER MILLER INC ,  CHADHA SUNEET ,  CURTISS LAWRENCE E

Inventor： CHADHA SUNEET ,  CURTISS LAWRENCE E

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/0216 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/18 ,  G01J3/20 ,  G01J3/2803

Abstract: A spectroanalytical system for receiving radiation to be analyzed along a first path includes a grating in the first path with periodic faceted grooves for spatially separating the radiation as a function of wavelength. The blaze angles of the faceted grooves are progressively graded. A multielement detector detects radiation spatially separated by the grating. An optical conditioner is disposed in the first path between the grating and a multielement detector.

Abstract translation: 用于接收沿着第一路径分析的辐射的分光系统包括在第一路径中具有周期性刻面凹槽的光栅，用于将辐射空间上分离为波长的函数。 分面凹槽的闪光角逐渐分级。 多元检测器检测由光栅在空间上分离的辐射。 光学调节器设置在光栅和多元件检测器之间的第一路径中。