Abstract:
PROBLEM TO BE SOLVED: To provide a method and system for performing sample assay to produce and measure optical responses and signatures. SOLUTION: According to various embodiments, a system is provided that includes one or more LEDs (111), a temperature sensor (118) and a temperature regulator (122). The temperature sensor can thermally-contact the LED (111), can measure operating temperature, and also can generate operating temperature signal. The temperature regulator can receive the operating temperature signal of the LED to adjust operating temperature based on its received operating temperature signal. According to various embodiments, there is provided a method for irradiating a reaction area (108) with excitation beam. The method may include a step for providing a system (100) containing the LED (111) and the reaction area (108). COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
A system and method are described herein for self-referencing a sensor that is used to detect a biomolecular binding event and/or kinetics which occur in a sample solution flowing along side a reference solution in a micron-sized deep flow channel.
Abstract:
PROBLEM TO BE SOLVED: To solve the problem that the depth of a focus becomes shallow because a fine flaw detection sensitivity is enhanced by raising a detection magnification in a flaw inspection device, an image forming position is shifted by environmental fluctuations and flaw detection sensitivity becomes unstable. SOLUTION: The flaw inspection device is equipped with an XY stage loaded with a substrate to be inspected to perform scanning in a predetermined direction and a mechanism for correcting the change of an image forming position with respect to a change in temperature and atmospheric pressure in order to hold an image forming state to the best state in a system for obliquely illuminating the flaw on the substrate to be inspected to detect the same by the detection optical system arranged above the substrate to be inspected. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an automatic analyzer without increasing a size of the analyzer and without complicating the analyzer, which is capable of detecting a measuring object with high sensitivity by correcting variations of light quantity data due to thermal deformation in an optical system caused by temperature variations in the analyzer.SOLUTION: Scattered light from a measuring object through a light-receiving window 43 is received by a detector 45a for scattered light at +θ angle and a detector 45b for scattered light at -θ angle, which are symmetrically arranged at equal angles and at equal intervals in a vertical direction about an optical axis as a center. A light source 40 is fixed by a light source holder 46 (a base member in which the light source is arranged), and the detectors 45a and 45b are arranged in a detector holder 47 (a base member in which each of the detectors is arranged) to be fixed. Thus comparing values of light quantity data from each of the detectors 45a and 45b allows a drift of the light quantity data due to thermal deformation in an optical system to be corrected.