REFLECTANCE MEASURING APPARATUS FOR MIRROR SURFACE

    公开(公告)号:JPS62278434A

    公开(公告)日:1987-12-03

    申请号:JP12200286

    申请日:1986-05-27

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To eliminate the spatial restriction of a measuring sample during the measurement of reflectance without significant alteration of two luminous flux formation systems, by positioning the measuring sample behind a reference sample in the incident direction of a luminous flux in such a manner as not to contact the reference sample. CONSTITUTION:In a double-beam type ultraviolet, visible light spectrophotometer or the like a reflector M1 reflects a luminous flux R on the side of a reference optical path so as to be incident on a reference sample MR at a specified angle of incidence. A reflector M2 reflects the luminous flux reflected from the sample MR so as to be incident on a detector along the extension of the luminous flux R incident on the reflector M1. A reflector M3 reflects a luminous flux S on the side of the optical path of the sample so as to be incident on a measuring sample MS at a specified angle of incidence the same as that of the luminous flux R into the sample MR. A reflector M4 reflects the luminous flux reflected from the sample MS so as to be incident on the detector along the extension of the luminous flux S incident on the reflector M3. Then, the interval between the reflectors M3 and M4 is made so larger than the interval between the reflectors M1 and M2 as to place the sample MS behind the sample MR thereby making the angle of incidence on the sample in the manner that both of the optical paths are equal to each other.

    SPECTROPHOTOMETER USING INTEGRATING SPHERE

    公开(公告)号:JPS61225620A

    公开(公告)日:1986-10-07

    申请号:JP6779685

    申请日:1985-03-29

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To exclude the cause of errors, by arranging a singe window having no corresponding window on any opposed wall surface on an integrating sphere and a pair of windows corresponding to each other with the center of the sphere therebetween to make the positional relationship between the incident luminous flux and the integrating sphere rotatable to enable one integrating sphere to cover the measurement of transmission light and reflected light. CONSTITUTION:In the measuring of transmission light, as shown by the drawing A, the positional relationship between an integrating sphere I and incident luminous flux S is such that the luminous flux S is incident through a single window Ws having no window on any opposed wall surface of the integrating sphere and a sample L is placed in front of the single window Ws. As the internal surface of the integrating sphere is opposite the single window Ws, the condition in the internal reflection of a sample light incident into the integrating sphere is the same whether measurement is done at the transmittance of 100% or with the sample placed diffusing luminous flux as illustrated, thereby eliminating any cause of errors. In the measuring of the reflected light, luminous flux S is made incident through a window Wr as illustrated by B and a reflection reference plate RS and a sample D are set alternately in contact with the outside of the opposed window Wb.

    Spectral transmittance measuring apparatus
    83.
    发明专利
    Spectral transmittance measuring apparatus 失效
    光谱传输测量装置

    公开(公告)号:JPS6183940A

    公开(公告)日:1986-04-28

    申请号:JP20516084

    申请日:1984-09-29

    Applicant: Shimadzu Corp

    Inventor: AKIYAMA OSAMU

    CPC classification number: G01N21/255

    Abstract: PURPOSE:To enable highly accurate measurement with a simple construction, by providing an integrating sphere with a light incident window, a detection window and additional one window the same in the area as the light emission window. CONSTITUTION:A light source unit L, a spectrometer M and an integrating sphere S are arranged. The integrating sphere S is provided with a light incident window W1, a detector window D, a photo detector P and a window W2 the same in the area as the window W1. A sample G shall be a plate of optical glass. To measure the transmittance 100%, the sample G is set at the position as indicated by the chain line and the window W2 is closed while the window W1 opened. In the measurement of the sample, the sample G is set at the position of the solid line and the window W2 is opened. In such a manner, a highly accurate measurement can be done with a simple construction simply by providing additional one window W2 on the integrating sphere S.

    Abstract translation: 目的:通过简单的结构实现高精度测量,通过在光发射窗口的区域中提供具有光入射窗的积分球,检测窗和附加一个窗口相同。 构成:布置有光源单元L,光谱仪M和积分球S。 积分球S在窗口W1的区域设置有光入射窗口W1,检测器窗口D,光电检测器P和与其相同的窗口W2。 样品G应为光学玻璃板。 为了测量100%的透射率,将样品G设置在由链线所示的位置,并且窗口W1打开时关闭窗口W2。 在样品的测量中,将样品G设置在实线的位置,并且窗口W2打开。 以这种方式,可以简单地通过在积分球S上提供另外的一个窗口W2来进行高精度的测量。

    Spectrophotometer
    84.
    发明专利
    Spectrophotometer 失效
    分光光度计

    公开(公告)号:JPS6182141A

    公开(公告)日:1986-04-25

    申请号:JP20533384

    申请日:1984-09-28

    Applicant: Shimadzu Corp

    Inventor: AKIYAMA OSAMU

    CPC classification number: G01N21/255

    Abstract: PURPOSE:To eliminate the influence of the movement of a measuring luminous flux by a sample and to improve quality control by constituting a spectrophotometer in such a manner that an integrating sphere is disposed in the light inlet side of a spectroscope and that the light transmitted through the sample is made incident on the spectroscope through the integrating sphere. CONSTITUTION:The integrating sphere IS is disposed on the light inlet side of the spectroscope M. The spectrophotometer is so constituted that the light transmitted through the sample is made incident through the sphere IS on the spectroscope M. More specifically, a light incident window W1 is opened toward a measuring optical system L in a preliminarily placed optical system P and the image of a light exit window W2 is formed by a lens l5 and a mirror ml onto the inlet slit S1 of the spectroscope M. The integrating sphere is used as the preliminarily placed optical system of the spectroscope in the above- mentioned manner and therefore there is no influence of the movement of the measuring luminous flux by the sample and the direct measurement of the product such as worked part on the production site of a factory, etc. is made possible. The quality control is thus improved.

    Abstract translation: 目的:为了消除样品的测量光通量的运动的影响,通过构成分光光度计来提高质量控制,使得积分球设置在分光器的光入口侧,并且透过光 样品通过积分球入射到分光镜上。 构成:积分球IS配置在分光计M的光入射侧。分光光度计的结构使得透过样品的光通过分光计M上的球体IS入射。更具体地,光入射窗口W1 在预先放置的光学系统P中向测量光学系统L打开,并且通过透镜15和反射镜ml将光出射窗W2的图像形成在分光计M的入口狭缝S1上。积分球用作 以上述方式预先放置了光谱仪的光学系统,因此样品的测量光通量的移动和工件的加工部件等的直接测量对工厂的生产现场没有影响, 等等是可能的。 从而改善质量控制。

    Diffraction grating spectroscope
    85.
    发明专利
    Diffraction grating spectroscope 失效
    衍射光栅

    公开(公告)号:JPS5979820A

    公开(公告)日:1984-05-09

    申请号:JP19130182

    申请日:1982-10-29

    Applicant: Shimadzu Corp

    Inventor: AKIYAMA OSAMU

    CPC classification number: G01J3/18

    Abstract: PURPOSE:To enable the covering a broad wavelength with a high sensitivity to a certain extent by setting several kinds of diffraction gratings varied in the blaze wavelength so that sharing wavelength ranges of the respective diffraction gratings give specified multiplied values of blaze wavelengths of the diffraction gratings. CONSTITUTION:In the embodiment, three kinds of diffraction gratings having the same grating constant and with blaze wavelengths of 0.2, 0.53 and 1.4mum respectively and the sharing wavelength ranges of the respective diffraction gratings are set at 0.14-0.37, 0.37-0.98 and 0.93-2.59mum with respect to the blaze wavelengths of 0.2, 0.53 and 1.4mum correspondingly. The range of the sharing wavelength area is set at (0.65-0.7)lambdab-(1.7-2.0)lambdab when the blaze wavelength is put at lambdab. In this embodyment the relative diffraction intensity with respect to the entire measuring wavelength area is as illustrated. The grating switching waves are 0.37 and 0.98mum where the relative diffraction intensity is a half of that at the blaze angle while the relative diffraction intensity is held within the range of 0.5-1 from 0.14-2.59mum in the wavelength.

    Abstract translation: 目的:通过设置在火焰波长中变化的几种衍射光栅,能够在一定程度上以高灵敏度覆盖宽波长,使得各衍射光栅的共享波长范围给出衍射光栅的闪耀波长的规定相乘值 。 构成:在本实施例中,分别具有相同的光栅常数和亮度波长分别为0.2,0.53和1.4μm的三种衍射光栅和各个衍射光栅的共享波长范围为0.14-0.37,0.37-0.98和0.93 相对于火焰波长为0.2,0.53和1.4mum的-2.59mum。 当火焰波长放在lambdab时,共享波长区域的范围设定为(0.65-0.7)lambdab-(1.7-2.0)lambdab。 在该实施例中,相对于整个测量波长区域的相对衍射强度如图所示。 光栅切换波为0.37和0.98μm,其中相对衍射强度为闪耀角的相对衍射强度的一半,而相对衍射强度保持在波长为0.14-2.59μm的0.5-1的范围内。

    Slit mechanism for spectroscope
    86.
    发明专利
    Slit mechanism for spectroscope 失效
    分光光度仪

    公开(公告)号:JPS5979819A

    公开(公告)日:1984-05-09

    申请号:JP19130582

    申请日:1982-10-29

    Applicant: Shimadzu Corp

    CPC classification number: G01J3/04

    Abstract: PURPOSE: To enable a measurement with a high sensitivity and a measurement with a high S/N ratio by providing a plurality of slits varied in the height with the same width for each slit width of a width varying slit mechanism designed to change several slits varied in the width.
    CONSTITUTION: Slits 1,2... and 1',2'... varied in the width and the height are provided along the circumference of a slit disc D. Slits n, n' (n=1, 2...) are arranged in pairs with these slits on both ends of each one diameter of the disc D to form slits for incidence and emission. A diffraction grating G is provided. The drawing shows slits 3 and 3' are in the service position. Any other pairs of slits can be selected by turning the disc D.
    COPYRIGHT: (C)1984,JPO&Japio

    Abstract translation: 目的:为了使具有高灵敏度的测量和具有高S / N比的测量,通过为设计成改变多个狭缝的宽度可变狭缝机构的每个狭缝宽度设置多个高度不同的狭缝,具有相同的宽度 在宽度。 构成:狭缝1,2和1',2'...沿宽度和高度变化沿着切割圆盘D的圆周设置。狭缝n,n'(n = 1,2 ... )与盘D的每一个直径的两端上的这些狭缝成对布置,以形成用于入射和发射的狭缝。 提供衍射光栅G。 附图示出了狭缝3和3'处于使用位置。 可以通过转盘D来选择任何其他成对的狭缝。

    COLORRMEASURING DEVICE
    87.
    发明专利

    公开(公告)号:JPS56120927A

    公开(公告)日:1981-09-22

    申请号:JP2588180

    申请日:1980-02-28

    Applicant: SHIMADZU CORP

    Inventor: AKIYAMA OSAMU

    Abstract: PURPOSE:To enable measurement of color with sufficient sensitivity by lighting with a commercial power source by a constitution wherein a fluorescent discharge lamp is used as a power source of white light and reflected light is interrupted intermittently by a frequency which is the same with the frequency of the lighting voltage of the lamp or is the frequency multipled or divided by integral numbers thereof. CONSTITUTION:In the device wherein white light is applied to a color sample S to be measured and a control sample R and respective reflected light thereof is measured through spectral diffraction, the fluorescent discharge lamp is used as a power source 1, while a sector 5 making the light flux of the reflected light from the samples S and R by interrupted intermittently and fall on a spectroscope 6 is rotated, by a synchronous motor 7, with the frequency which is the same with the lighting frequency or with the frequency multipled or divided by the integral numbers thereof, and thus photoelectric current (i) corresponding to the strength of diffracted spectrum is detected. By this method, the surfaces of the samples can be irradiated directly by the face light source of the fluorescent lamp without using an expensive integrating sphere and thereby high sensitivity can be obtained.

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