SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

    公开(公告)号:US20230184681A1

    公开(公告)日:2023-06-15

    申请号:US17925131

    申请日:2021-03-17

    Inventor: Satoshi YAMAMOTO

    CPC classification number: G01N21/6456 G01N21/6452 G01N2201/103 G02B21/06

    Abstract: In this sample observation device, a reference table in which an optimum light amount of planar light at a measurement sensitivity represented by the product of a light amount of the planar light and a scanning speed is set according to the scanning speed is referred to, and the scanning speed of a scanning unit and the optimum light amount of the planar light that is applied to a sample are determined on the basis of the measurement sensitivity selected by a user.

    APPARATUS AND METHOD FOR INSPECTION OF A MID-LENGTH SUPPORTED STEERING COLUMN ASSEMBLY
    88.
    发明申请
    APPARATUS AND METHOD FOR INSPECTION OF A MID-LENGTH SUPPORTED STEERING COLUMN ASSEMBLY 审中-公开
    用于检查中长度支撑转向柱组件的装置和方法

    公开(公告)号:US20160356725A1

    公开(公告)日:2016-12-08

    申请号:US15116554

    申请日:2015-02-04

    Abstract: An apparatus (110) (and associated method) for inspecting a steering column assembly (10) including at least one motorized roller support assembly (118) that is adapted to rotatably support the steering column assembly at least partially along its length, and at least one optical scanning device (158) adapted to optically scan a feature of Interest of the steering column assembly while the shaft of the steering column assembly is rotated for gathering data for identifying one or more deviations from one or more predetermined values for the feature of interest.

    Abstract translation: 一种用于检查转向柱组件(10)的装置(110)(和相关联的方法),该转向柱组件包括至少一个电动辊支撑组件(118),其适于至少部分沿其长度可旋转地支撑转向柱组件,并且至少 一个光学扫描装置(158),其适于在转向柱组件的轴旋转时光学地扫描转向柱组件的特征,以收集用于识别关于感兴趣特征的一个或多个预定值的一个或多个偏差的数据 。

    Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis
    89.
    发明授权
    Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis 有权
    在具有测量轴的单个检查站处光学检查制造的部件的方法和系统

    公开(公告)号:US09370799B2

    公开(公告)日:2016-06-21

    申请号:US14876187

    申请日:2015-10-06

    Abstract: A method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis are provided. The system comprises a fixture assembly which includes a rotatable first fixturing component to support a part in a generally vertical orientation and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component includes a device for holding the part in a generally horizontal orientation and to permit rotation of the horizontally held part about the measurement axis between first and second predetermined angular positions about the axis. The system also comprises an actuator assembly, a backside illumination assembly, a frontside illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly.

    Abstract translation: 提供了在具有测量轴的单个检查站上光学检查制造部件的方法和系统。 该系统包括夹具组件,其包括可旋转的第一夹持部件以支撑大致垂直的方向的部件,以及可旋转的第二夹紧部件,其与第一夹持部件配合并可拆卸地连接,以将转矩从第一夹持部件传递到第二夹持 零件。 第二固定部件包括用于将部件保持在大体上水平的方向并且允许水平保持部分围绕测量轴线围绕轴线在第一和第二预定角度位置之间旋转的装置。 该系统还包括致动器组件,背面照明组件,前侧照明装置,透镜和检测器组件以及用于处理由透镜和检测器组件产生的电信号的至少一个处理器。

    X-Ray Analyzer
    90.
    发明申请
    X-Ray Analyzer 有权
    X射线分析仪

    公开(公告)号:US20150268179A1

    公开(公告)日:2015-09-24

    申请号:US14611668

    申请日:2015-02-02

    Inventor: Masahiro Sakuta

    Abstract: An X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit with keeping a holding state, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

    Abstract translation: X射线分析装置包括:样本台,对原样X射线照射样本的X射线源;检测从样本产生的二次X射线的检测器;调整样品台的相对位置的位置调整机构; 和主X射线,获取样本的观察图像的观察机构,以及具有显示单元和输入单元的计算机。 计算机具有响应于通过在保持保持状态下拖动输入单元而将指示器从观察屏幕的中心区域移动到特定位置的功能,使移动方向和移动速度移动样本台 对应于该位置相对于中心区域的方向和距离。

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