Abstract:
A gas analyzer system includes an optical source, an optical filter assembly, a controller, and an analyzer. The optical source generates an optical signal. The optical filter assembly includes different optical filters in which to filter the optical signal. During operation, the controller selects sequential application of each of the different optical filters in a path of the optical signal to modulate the optical signal using different frequency bands of optical energy. The modulated optical signal passes through an unknown sample. Based on absorption of the optical signal by the sample gas at different frequencies, the optical analyzer detects which types of multiple different gases are present in the sample.
Abstract:
The invention provides a method for identifying the impacts of interfering effects on experimental data. In particular, a method is described for identifying the impacts of unwanted auto-fluorescence, fluorescence quenching, and deterioration of a fluorescent sample under study on the collected experimental data. The data are analyzed whether or not said data fulfill certain criteria with respect to a threshold which is indicative for said interfering effect.
Abstract:
A method and apparatus for interfacing a plurality of gas measurement systems, including a mainstream and a sidestream gas measurement system, to a host system via an interface unit. The present invention also pertains to a sidestream gas measurement system that output signals emulating the signals output by a mainstream gas measurement system or portion thereof, so that the sidestream gas measurement system can seamlessly communicate with a host system configured to communicate with a mainstream gas measurement system or a portion thereof.
Abstract:
A method and apparatus for interfacing a plurality of gas measurement systems, including a mainstream and a sidestream gas measurement system, to a host system via an interface unit. The present invention also pertains to a sidestream gas measurement system that output signals emulating the signals output by a mainstream gas measurement system or portion thereof, so that the sidestream gas measurement system can seamlessly communicate with a host system configured to communicate only a mainstream gas measurement system or a portion thereof.
Abstract:
A selective gas detecting apparatus for determining the concentration and type of hydrocarbon gas in a gas sample based upon absorption of infrared radiation by the gas sample, the apparatus having at least two infrared radiation absorption channels with the wavelengths for measurement in the two channels selected as 3.2 microns and 3.4 microns, signals in the two channels being processed to formulate an indication of absorbance of hydrocarbons at the selected wavelength, the absorbance signal in one channel being displayed as an indication of concentration of approximately the total hydrocarbon gas in air and the ratio of absorbances being displayed as an indication of the type of hydrocarbon in air and independent of the concentration of the gas.
Abstract:
The present invention pertains to an apparatus that is capable of correcting for inaccuracies caused by molecular collision broadening in analyzers. The apparatus includes an analyzer for analyzing a fluid. The analyzer is capable of producing an output signal corresponding to the fluid in the analyzer. The apparatus also includes a device for detecting molecular collision broadening in the fluid. The detecting device produces an output signal proportional to the molecular collision broadening. There is also a device for correcting inaccuracies in the analyzer output signal caused by molecular collision broadening. The correcting device is disposed to receive the analyzer output signal and the detecting device output signal, and is capable of producing an output signal corresponding thereto. Preferably, the detecting device includes a thermal conductivity cell and the correcting device is either a voltage control gain operational amplifier or a computer.
Abstract:
Method and apparatus for improved detection of sulfur dioxide by fluorescence are disclosed wherein the effects of interferent hydrocarbons in the test sample are eliminated. In apparatus detecting sulfur dioxide by detecting the fluorescence of sulfur dioxide from narrow band ultraviolet radiation by photomultiplier means, the test sample being fed to the fluorescence chamber is first passed through a reactor to oxidize the hydrocarbons from the sample. The effect of this oxidization is to convert interfering hydrocarbon components in the sample gas into non-interfering materials. In one embodiment employing ozone, moisture removal apparatus is added prior to the oxidization reaction to prevent the error producing formation of H.sub.2 SO.sub.4.
Abstract translation:公开了通过荧光检测二氧化硫的方法和装置,其中消除了测试样品中干扰物烃的影响。 在通过光电倍增法从窄带紫外线辐射中检测二氧化硫的荧光的装置中检测二氧化硫的装置中,首先将进入荧光室的试样通过反应器从样品中氧化烃。 这种氧化的作用是将样品气体中的干扰性烃成分转化为非干扰材料。 在使用臭氧的一个实施方案中,在氧化反应之前加入除湿装置以防止产生形成H 2 SO 4的错误。
Abstract:
A dual path analyzer and a single path analyzer are disclosed, each for determining the concentration of one or more gaseous components in a mixture of gases. The preferred analyzer is a single path instrument which includes a source of infrared energy, a detector for the energy, a sample cell for the gas mixture positioned between the source and detector, and a filter wheel having a plurality of filters and a source blocking device positioned between the sample cell and detector for sequentially interposing the filters and the source blocking device between the source and the detector. Means are provided for amplifying the output signal of the detector and for processing the signal to provide a direct readout display which indicates the concentration of the gaseous components being analyzed. The processing electronics preferably include provision for calibrating the analyzer with clean ambient air, for compensating for background levels of radiation, and for correcting the displayed output signal for the effects of absorption band interferences between two or more gases in the gas mixture. The structure of the dual path analyzer includes a source of infrared energy, a detector for the energy, a sample cell for the gas mixture, a cell for a reference gas, and optical path means between the source and detector for sequentially directing the source energy through the sample cell, the reference cell, and through neither cell. Processing electronics similar to the single path instrument can be incorporated to compensate for background radiation and absorption band interferences.
Abstract:
A method for determining the composition and/or the concentration of gas in a sample using a spectrometer comprises: a step of measuring the adsorption signals of gas as a wavelength function; a step of converting the adsorption signals to one or more first induction signals; a step of inducing gas concentration measuring parameters from the first induction signals; and a step of determining the composition and/or the concentration of the gas from a calibration function which can compensate influences caused by the gas concentration measuring parameters, the parameters of device properties of the spectrometer, and the parameters of gas stages. In the step of measuring the adsorption signals of the gas, wavelengths continuously pass within a wavelength range, and are overlapped by harmonic wavelength modulation. Also, the influences of the wavelength modulation about the adsorption signals through light source modulation properties and the detection properties of the spectrometer follow the device properties of the spectrometer. The calibration function includes a parent calibration function and a device calibration function. Herein, one or more gas concentration measuring parameters induced from the induction signals and the parameters of the gas states are applied to the parent calibration function and are selected to compensate the light source modulation properties of the spectrometer. Also, the device calibration function considers the detection properties of the spectrometer. [Reference numerals] (13) Device properties; (14) Light source modulation properties; (15) Number of particles (N); (16) Detection properties; (17') Section y'f signal {F(y'f)}; (21) Concentration; (23) Ratio {V=F(xf)/F(yf)}; (25) Width xf signal {B(zf)}; (27) Parent calibration function {K_M(p, T, X, F, V, B)}; (29) Device calibration function (K_G); (AA) Pressure (p); (BB) Temperature (t); (CC) Carrier gas (X); (DD) Section xf signal {F(xf)}; (EE) Section yf signal {f(yf)}