公开(公告)号：WO2010106533A4

公开(公告)日：2011-12-01

申请号：PCT/IL2010000174

申请日：2010-03-03

Applicant: BRIGHTVIEW SYSTEMS LTD ,  FINAROV MOSHE

Inventor： FINAROV MOSHE

IPC: H01L21/31

CPC classification number: G01B11/0625 ,  G01B11/303 ,  G01N21/55 ,  G01N21/8422

Abstract: A method for accurate determination of optical parameters of a stack of thin films with at least one of the films being an opaque film. The method includes measurement of the reflected or transmitted through the stack illumination and mutual correlation of the determined thin film parameters.

Abstract translation: 一种用于精确确定薄膜堆叠的光学参数的方法，其中至少一个膜是不透明膜。 该方法包括通过堆叠照射的​​反射或透射的测量以及所确定的薄膜参数的相互关系。

公开(公告)号：WO2010106534A1

公开(公告)日：2010-09-23

申请号：PCT/IL2010/000175

申请日：2010-03-03

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  SCHEINER, David ,  PERSKY, Nathan ,  SHOHAM, Benjamin

Inventor： SCHEINER, David ,  PERSKY, Nathan ,  SHOHAM, Benjamin

IPC: G01N21/00

CPC classification number: G01N21/8422 ,  G01N21/211 ,  G01N21/31 ,  G01N2021/213 ,  G01N2021/3155 ,  G01N2021/3568 ,  H01L31/0322 ,  Y02E10/541 ,  Y02P70/521

Abstract: A method for measuring characteristics of a stack of thin films including at least one thin film being an absorbing film. The measurement takes place in determined measurement locations utilizing existing and specially introduced photovoltaic panel features.

Abstract translation: 一种用于测量包括至少一个作为吸收膜的薄膜的薄膜堆叠的特性的方法。 使用现有的和特别引入的光伏面板特征，在确定的测量位置进行测量。

公开(公告)号：WO2011024170A1

公开(公告)日：2011-03-03

申请号：PCT/IL2010/000698

申请日：2010-08-26

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  ASPIR, Doron ,  SHOHAM, Benjamin ,  SCHEINER, David

Inventor： ASPIR, Doron ,  SHOHAM, Benjamin ,  SCHEINER, David

IPC: G06F19/00

CPC classification number: G05B19/41875 ,  G01N21/9501 ,  G05B2219/32179 ,  G05B2219/32182 ,  G05B2219/32183 ,  H02S50/00

Abstract: Presented is a system for thin film photovoltaic panel quality control in a batch manufacturing process. The system includes a panel illuminating unit, a detector unit, a robotic mechanism handling the panel and providing a relative displacement between the panel and the panel illuminating unit and illumination detector unit. A control unit is operative to coordinate the quality control process with movements of at least the robotic mechanism, process at least one detected illumination thin film interaction product and derive at least one thin film parameter.

Abstract translation: 提出了一种用于批量生产过程中的薄膜光伏面板质量控制的系统。 该系统包括面板照明单元，检测器单元，处理面板并提供面板与面板照明单元和照明检测器单元之间的相对位移的机器人机构。 控制单元可操作以协调质量控制过程与至少机器人机构的运动，处理至少一个检测到的照明薄膜相互作用产物并导出至少一个薄膜参数。

公开(公告)号：WO2010106533A2

公开(公告)日：2010-09-23

申请号：PCT/IL2010/000174

申请日：2010-03-03

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  FINAROV, Moshe

Inventor： FINAROV, Moshe

IPC: G01B9/08

CPC classification number: G01B11/0625 ,  G01B11/303 ,  G01N21/55 ,  G01N21/8422

Abstract: A method for accurate determination of optical parameters of a stack of thin films with at least one of the films being an opaque film. The method includes measurement of the reflected or transmitted through the stack illumination and mutual correlation of the determined thin film parameters.

Abstract translation: 用于精确确定薄膜堆叠的光学参数的方法，其中至少一个薄膜是不透明薄膜。 该方法包括测量通过堆叠照明的反射或透射以及所确定的薄膜参数的相互关联。

公开(公告)号：WO2010079474A1

公开(公告)日：2010-07-15

申请号：PCT/IL2009/001211

申请日：2009-12-23

Applicant: BRIGHTVIEW SYSTEMS LTD ,  NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

Inventor： NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

IPC: G01N21/84

CPC classification number: G01N21/8422 ,  H02S50/15

Abstract: A method of a photovoltaic panel (104) quality control, said method comprising: enabling a relative movement in at least one direction (112) between the photovoltaic panel (104) and a low-resolution scanning imaging unit (132) and capturing successive two-dimensional frames of the scanned area; analyzing the aquired image frames for presence of thin film production defects (144) and communicating to a high resolution image scanning unit (136) locations of said production defects; enabling a relative movement (148) between the photovoltaic panel and the high resolution scanning unit said, movement following the low-resolution unit movement and at least one additional direction parallel to the photovoltaic panel movement direction to aquire and classify the thin film production defects communicated by the low resolution scanning unit; and wherein the low and high resolution scanning units move simultaneously with the same speed (124) across the photovoltaic panel and the speed of the high resolution scanning unit moving in the direction parallel to the thin film movement direction is different from the speed at which the photovoltaic panel moves.

Abstract translation: 一种光伏面板（104）质量控制的方法，所述方法包括：实现光伏面板（104）和低分辨率扫描成像单元（132）之间的至少一个方向（112）的相对运动，并捕获连续的两个 扫描区域的三维帧; 分析所述彩色图像帧以存在薄膜生产缺陷（144）并与所述生产缺陷的位置的高分辨率图像扫描单元（136）通信; 使得能够在光伏面板和高分辨率扫描单元之间进行相对运动（148），所述运动遵循低分辨率单元运动和平行于光伏面板运动方向的至少一个附加方向，以产生并分类所传播的薄膜生产缺陷 由低分辨率扫描单元; 并且其中所述低分辨率和高分辨率扫描单元以相同的速度（124）同时移动穿过所述光伏面板，并且所述高分辨率扫描单元在与所述薄膜移动方向平行的方向上移动的速度不同于 光伏面板移动。

公开(公告)号：WO2009122393A2

公开(公告)日：2009-10-08

申请号：PCT/IL2009/000299

申请日：2009-03-16

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  NOY, Noam

Inventor： NOY, Noam

IPC: G01N21/88 ,  G06F19/00

CPC classification number: G01N21/95 ,  G01N2021/8825 ,  G01N2021/8861

Abstract: A system and a method for photovoltaic thin film quality control. The system illuminates an area of photovoltaic film, acquires the illuminated area and compares it with a predetermined image. The difference between the images indicates on presence of photovoltaic thin film defects.

Abstract translation: 一种用于光伏薄膜质量控制的系统和方法。 系统照亮光伏膜的区域，获取照明区域并将其与预定图像进行比较。 图像之间的差异表明存在光电薄膜缺陷。

公开(公告)号：WO2009122393A3

公开(公告)日：2010-03-11

申请号：PCT/IL2009000299

申请日：2009-03-16

Applicant: BRIGHTVIEW SYSTEMS LTD ,  NOY NOAM

Inventor： NOY NOAM

IPC: H01L31/00

CPC classification number: G01N21/95 ,  G01N2021/8825 ,  G01N2021/8861

Abstract: A system and a method for photo voltaic thin film quality control The system illuminates an area of photo voltaic film, acquires the illuminated area and compares it with a predetermined image The difference between the images indicates on presence of photo voltaic thin film defects.

Abstract translation: 光伏薄膜质量控制的系统和方法系统照亮光伏薄膜的区域，获取照明区域并将其与预定图像进行比较图像之间的差异表明存在光伏薄膜缺陷。

公开(公告)号：WO2010007617A3

公开(公告)日：2010-01-21

申请号：PCT/IL2009/000684

申请日：2009-07-09

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  FINAROV, Moshe

Inventor： FINAROV, Moshe

IPC: G01N21/95 ,  G01N21/31

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

公开(公告)号：WO2010007617A2

公开(公告)日：2010-01-21

申请号：PCT/IL2009000684

申请日：2009-07-09

Applicant: BRIGHTVIEW SYSTEMS LTD ,  FINAROV MOSHE

Inventor： FINAROV MOSHE

IPC: G01N21/95 ,  G01N21/31

CPC classification number: G01N21/8422 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

Abstract translation: 获得光电薄膜质量控制，其中薄膜由支撑体支撑并且膜的一部分被多色照明源照射。 源在薄膜上形成连续的照明线。 位于照明线上的离散采样点成像到二维光学开关上。 产生薄膜上面的采样点的坐标与二维光开关上的坐标之间的一致性查找表。 确定由采样点反射的照明的光谱组成，并且适用于质量控制的光电薄膜参数是从光电薄膜照射反射或透射的光谱组成得出的。

公开(公告)号：WO2011024170A4

公开(公告)日：2011-05-05

申请号：PCT/IL2010000698

申请日：2010-08-26

Applicant: BRIGHTVIEW SYSTEMS LTD ,  ASPIR DORON ,  SHOHAM BENJAMIN ,  SCHEINER DAVID

Inventor： ASPIR DORON ,  SHOHAM BENJAMIN ,  SCHEINER DAVID

IPC: G06F19/00

CPC classification number: G05B19/41875 ,  G01N21/9501 ,  G05B2219/32179 ,  G05B2219/32182 ,  G05B2219/32183 ,  H02S50/00

Abstract: Presented is a system for thin film photovoltaic panel quality control in a batch manufacturing process. The system includes a panel illuminating unit, a detector unit, a robotic mechanism handling the panel and providing a relative displacement between the panel and the panel illuminating unit and illumination detector unit. A control unit is operative to coordinate the quality control process with movements of at least the robotic mechanism, process at least one detected illumination thin film interaction product and derive at least one thin film parameter.

Abstract translation: 提出了一种批量生产过程中的薄膜光伏面板质量控制系统。 该系统包括面板照明单元，检测器单元，处理面板并在面板和面板照明单元和照明检测器单元之间提供相对位移的机器人机构。 控制单元可操作以通过至少机器人机构的移动来协调质量控制过程，处理至少一个检测到的照明薄膜相互作用产物并且导出至少一个薄膜参数。