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    TERBIUM BASED DETECTOR SCINTILLATOR
    5.
    发明申请
    TERBIUM BASED DETECTOR SCINTILLATOR 审中-公开
    基于TERBIUM的检测器扫描仪

    公开(公告)号：WO2013014557A1

    公开(公告)日：2013-01-31

    申请号：PCT/IB2012/053372

    申请日：2012-07-03

    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH ,  RONDA, Cornelis Reinder ,  CONRADS, Norbert ,  OHLAND, Henning ,  SCHREINEMACHER, Herbert

    Inventor： RONDA, Cornelis Reinder ,  CONRADS, Norbert ,  OHLAND, Henning ,  SCHREINEMACHER, Herbert

    IPC: G01T1/202 ,  C09K11/77 ,  G21K4/00

    CPC classification number: G01T1/2006 ,  C09K11/7771 ,  G01N23/046 ,  G01T1/2023 ,  G21K4/00

    Abstract: An imaging system (100) includes a radiation source (110) and a radiation sensitive detector array (116), which includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd 2 O 2 S:Pr,Tb,Ce. A method includes detecting radiation with a radiation sensitive detector array (116) of an imaging system (100), wherein the radiation sensitive detector array includes a Gd 2 O 2 S:Pr,Tb,Ce based scintillator array (118). A radiation sensitive detector array (116) includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd 2 O 2 S:Pr,Tb,Ce, and an amount of Tb 3+ in the Gd 2 O 2 S :Pr,Tb,Ce is equal to or less than two hundred mole parts per million.

    Abstract translation: 成像系统（100）包括辐射源（110）和辐射敏感检测器阵列（116），其包括闪烁体阵列（118）和光学耦合到闪烁体阵列的光电传感器阵列（120），其中所述闪烁体阵列包括 Gd2O2S：镨，铽，CE。 一种方法包括用成像系统（100）的辐射敏感检测器阵列（116）检测辐射，其中所述辐射敏感检测器阵列包括Gd 2 O 2 S：Pr，Tb，Ce基闪烁体阵列（118）。 辐射敏感检测器阵列（116）包括闪烁体阵列（118）和光学耦合到闪烁体阵列的光电传感器阵列（120），其中闪烁体阵列包括Gd 2 O 2 S：Pr，Tb，Ce和Gd 2 O 2 S中的Tb 3+ ：Pr，Tb，Ce等于或小于百万分之二百摩尔。

    X-RAY EXAMINATION APPARATUS WITH X-RAY IMAGE SENSOR MATRIX AND CORRECTION UNIT
    7.
    发明申请
    X-RAY EXAMINATION APPARATUS WITH X-RAY IMAGE SENSOR MATRIX AND CORRECTION UNIT 审中-公开
    X射线图像传感器矩阵和校正单元的X射线检查装置

    公开(公告)号：WO9828911A2

    公开(公告)日：1998-07-02

    申请号：PCT/IB9701595

    申请日：1997-12-23

    Applicant: PHILIPS ELECTRONICS NV ,  PHILIPS NORDEN AB ,  CONRADS NORBERT ,  WEIBRECHT MARTIN ,  SCHIEBEL ULRICH ,  WIECZOREK HERFRIED KARL

    Inventor： CONRADS NORBERT ,  WEIBRECHT MARTIN ,  SCHIEBEL ULRICH ,  WIECZOREK HERFRIED KARL

    IPC: H04N5/32 ,  A61B6/00 ,  H04N5/325 ,  H04N5/359

    CPC classification number: H04N5/325 ,  H04N5/3597

    Abstract: An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).

    Abstract translation: X射线检查装置包括用于从X射线图像导出初始图像信号的x射线图像传感器矩阵（1）。 X射线传感器矩阵的传感器元件将入射的X射线转换成电荷。 这些电荷被读出并转换成初始图像信号。 此外，提供校正单元（2），用于校正已经保留在传感器元件中一段时间​​的初始图像信号，特别是用于由于延迟传送的电荷引起的干扰。 校正单元（2）设置有存储校正值的存储器。 此外，还提供了用于从存储器（3）中选择适当的校正值的选择单元（5）。

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