公开(公告)号：US10161865B2

公开(公告)日：2018-12-25

申请号：US15430916

申请日：2017-02-13

Applicant: DeeDiim Sensors Inc.

Inventor： Jang-Il Ser

IPC: G01N21/47

Abstract: An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.

公开(公告)号：US11026313B1

公开(公告)日：2021-06-01

申请号：US16995277

申请日：2020-08-17

Applicant: DeeDiim Sensors Inc.

Inventor： Jang-Il Ser

IPC: H05B47/105 ,  F21V23/00 ,  G01N21/01 ,  F21Y115/10

Abstract: An illumination system includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The light-providing part includes light sources arranged in a dome shape, which irradiate incident lights to a measurement target on the measurement stage. The light-receiving part acquires reflection lights. The processing part controls the light sources to be turned on/off according to a dome-shaped sine wave pattern. The processing part controls the light sources to be sequentially turned on/off by shifting N times according to the dome-shaped sine wave pattern for a specific measurement position of the measurement target, and calculates a phase at the specific measurement position, an average of intensities of N reflection lights, and a visibility of N reflection lights, from intensities of N reflection lights. Thus, material of the measurement target may be easily determined.

公开(公告)号：DE112017003529T5

公开(公告)日：2019-04-04

申请号：DE112017003529

申请日：2017-02-10

Applicant: DEEDIIM SENSORS INC

Inventor： SER JANG-IL

IPC: G01N21/47 ,  F21W131/40 ,  G01N21/17 ,  G01N21/55

Abstract: Ein Beleuchtungssystem zum Erkennen von Material umfasst einen Messtisch, einen Licht liefernden Teil, einen Licht empfangenden Teil und einen Verarbeitungsteil. Der Messtisch ist nach oben offen und das Messobjekt ist auf dem Messtisch angeordnet. Der Licht liefernde Teil umfasst eine Vielzahl von Beleuchtungsabschnitten, die einfallende Lichter auf das Messobjekt leiten, und leitet multidirektionale einfallende Lichter aus einer Vielzahl von oberen Richtungen, in denen der Messtisch offen ist, auf das Messobjekt. Der Licht empfangende Teil empfängt unidirektionale Reflexionslichter, die von dem Messobjekt reflektiert werden, entsprechend den multidirektionalen einfallenden Lichtern, die von dem Licht liefernden Teil geliefert werden. Der Verarbeitungsteil erfasst eine multidirektionale Intensitätsverteilung multidirektionaler Reflexionslichter, die von dem Messobjekt reflektiert werden, entsprechend einem unidirektionalen einfallenden Licht von den unidirektionalen Reflexionslichtern, die von dem Messobjekt reflektiert werden, entsprechend den multidirektionalen einfallenden Lichtern, und bestimmt das Material des Messobjekts aus der multidirektionalen Intensitätsverteilung der Reflexionslichter. Dadurch kann das Material eines Objekts einfach, genau und zu geringen Kosten erkannt werden.

公开(公告)号：US10451547B2

公开(公告)日：2019-10-22

申请号：US16229356

申请日：2018-12-21

Applicant: DeeDiim Sensors Inc.

Inventor： Jang-Il Ser

IPC: G01N21/47 ,  G01N21/55

Abstract: An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.

公开(公告)号：US20190120759A1

公开(公告)日：2019-04-25

申请号：US16229356

申请日：2018-12-21

Applicant: DeeDiim Sensors Inc.

Inventor： Jang-Il SER

IPC: G01N21/47 ,  G01N21/55

CPC classification number: G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N2021/4716 ,  G01N2021/4733 ,  G01N2021/556 ,  G01N2201/0626 ,  G01N2201/0634 ,  G01N2201/0638 ,  G01N2201/0655

Abstract: An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.