RESONANT CAVITY BIOSENSOR
    8.
    发明申请
    RESONANT CAVITY BIOSENSOR 审中-公开
    谐振腔生物传感器

    公开(公告)号:WO2004083820A2

    公开(公告)日:2004-09-30

    申请号:PCT/US2004/008558

    申请日:2004-03-19

    IPC: G01N

    CPC classification number: G01N21/7746 B01L3/5027 G01N21/0303 G01N21/253

    Abstract: An assay system having a channel bounded by first and second reflective surfaces adapted to accommodate a fluid material therebetween and defining a plurality of regions in an array between those surfaces with each region defining a resonant cavity and adapted to receive a capturing material on a surface thereof whereby a source of radiation illuminates each region to provide a standing wave of radiation of within the cavity indicative of binding of said capturing agent to material under investigation, a binding thereof being detected in response to radiation from each cavity indicative of a change in the standing wave pattern.

    Abstract translation: 一种测定系统,其具有由第一和第二反射表面限定的通道,其适于在其间容纳流体材料并且在这些表面之间限定阵列中的多个区域,每个区域限定谐振腔并且适于在其表面上接收捕获材料 由此辐射源照射每个区域以提供在空腔内的辐射驻波,指示所述捕获剂与所研究的材料的结合,响应于来自每个空腔的辐射而被检测到的结合,其指示站立的变化 波纹。

    SPECTRAL IMAGING FOR VERTICAL SECTIONING
    9.
    发明申请
    SPECTRAL IMAGING FOR VERTICAL SECTIONING 审中-公开
    用于垂直分割的光谱成像

    公开(公告)号:WO02070984A8

    公开(公告)日:2003-04-24

    申请号:PCT/US0149391

    申请日:2001-12-19

    Abstract: A method and apparatus for performing optical microscopy in one to three dimensions employs a spectral self-interference fluorescent microscopy technique that includes providing at least one fluorescent microscopy sample (220a, 220b), at least one objective lens (201), and a reflecting surface (204). The fluorescent sample is disposed between the objective lens and the reflecting surface, the distance (d1, d2) from the sample to the reflecting surface is several to several tens times an excitation wavelength. Excitation light (216) causes the fluorescent sample to emit light (214), at least a portion (214b) of which is reflected by the reflecting surface. The objective lens collects both the reflected light and the light emitted directly by the fluorescent sample (214a). The direct and reflected light interferences causing spectral oscillations in the emission spectrum. The periodicity and the peak wavelengths of the emission spectrum are then spectroscopically analyzed to determine the optical path length between the fluorescent sample and the reflecting surface.

    Abstract translation: 用于在一到三维中执行光学显微镜的方法和装置采用光谱自干涉荧光显微镜技术,其包括提供至少一个荧光显微镜样品(220a,220b),至少一个物镜(201)和反射表面 (204)。 荧光试样配置在物镜与反射面之间,从样品到反射面的距离(d1,d2)为激发波长的数倍〜数十倍。 激发光(216)使得荧光样品发射光(214),其中至少一部分(214b)被反射表面反射。 物镜收集反射光和由荧光样品(214a)直接发射的光。 直接和反射的光干扰导致发射光谱中的光谱振荡。 然后对发射光谱的周期和峰值波长进行光谱分析,以确定荧光样品和反射表面之间的光程长度。

    SPECIAL IMAGING FOR VERTICAL SECTIONING
    10.
    发明申请
    SPECIAL IMAGING FOR VERTICAL SECTIONING 审中-公开
    垂直分割的特殊成像

    公开(公告)号:WO2002070984A1

    公开(公告)日:2002-09-12

    申请号:PCT/US2001/049391

    申请日:2001-12-19

    Abstract: A method and apparatus for performing optical microscopy in one to three dimensions employs a spectral self-interference fluorescent microscopy technique that includes providing at least one fluorescent microscopy sample (220a, 220b), at least one objective lens (201), and a reflecting surface (204). The fluorescent sample is disposed between the objective lens and the reflecting surface, the distance (d1, d2) from the sample to the reflecting surface is several to several tens times an excitation wavelength. Excitation light (216) causes the fluorescent sample to emit light (214), at least a portion (214b) of which is reflected by the reflecting surface. The objective lens collects both the reflected light and the light emitted directly by the fluorescent sample (214a). The direct and reflected light interferences causing spectral oscillations in the emission spectrum. The periodicity and the peak wavelengths of the emission spectrum are then spectroscopically analyzed to determine the optical path length between the fluorescent sample and the reflecting surface.

    Abstract translation: 用于在一到三维中执行光学显微镜的方法和装置采用光谱自干涉荧光显微镜技术,其包括提供至少一个荧光显微镜样品(220a,220b),至少一个物镜(201)和反射表面 (204)。 荧光试样配置在物镜与反射面之间,从样品到反射面的距离(d1,d2)为激发波长的数倍〜数十倍。 激发光(216)使得荧光样品发射光(214),其中至少一部分(214b)被反射表面反射。 物镜收集反射光和由荧光样品(214a)直接发射的光。 直接和反射的光干扰导致发射光谱中的光谱振荡。 然后对发射光谱的周期和峰值波长进行光谱分析,以确定荧光样品和反射表面之间的光程长度。

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