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    Technique for analyzing scratch test
    1.
    发明专利
    Technique for analyzing scratch test 有权
    分析测试技术

    公开(公告)号：JP2009128368A

    公开(公告)日：2009-06-11

    申请号：JP2008300623

    申请日：2008-11-26

    Applicant: Csm Instruments Sa ,  セーエスエム アンストルモン ソスィエテ アノニムCSM Instruments SA

    Inventor： COUDERT PIERRE-JEAN ,  BELLATON BERTRAND

    IPC: G01N3/42

    CPC classification number: G01N3/42 ,  G01N2203/0098 ,  G01N2203/021 ,  G01N2203/0212

    Abstract: PROBLEM TO BE SOLVED: To carry out image analysis, at any moment relatively to the moment when the scratches are made.
    SOLUTION: The digital image-capturing device equipped with a high power field lens capable of photograph only a scratched part of scratch and an indentor applying force on the bulk are provided. The method comprises the steps of: determining the starting position of the scratch relative to the reference position; making the scratch to the bulk by means of the indentor; recording the applied force to make the scratch and at least one measured feature of scratch as a function of displacement of the indentor on the bulk relative to the reference position; acquiring and recording the whole of the significant portion of the scratch as one-set of a plurality of images; synchronizing the plurality of recorded images, the applied force and the measured features as a function of displacement of the indentor; displaying the curves of the applied force and the measured features as a function of the displacement the indentor; and displaying a panoramic image of the significant portion of the scratch reconstructed from the plurality of recorded images.
    COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题：为了进行图像分析，在任何时刻相对于制作划痕的时刻。 解决方案：提供了一种配备有能够仅拍摄刮伤部分的大功率场景透镜和在本体上施加压力的数字图像捕获装置。 该方法包括以下步骤：确定划痕相对于参考位置的起始位置; 借助于压头使大量零碎; 记录所施加的力以使刮痕和至少一个测量的刮擦特征作为压头相对于参考位置在体上的位移的函数; 获取和记录刮痕的整个重要部分作为多组图像的一组; 作为压头的位移的函数来同步多个记录图像，所施加的力和所测量的特征; 显示所施加的力的曲线和所测量的特征作为压头的位移的函数; 以及显示从所述多个记录图像重建的所述划痕的重要部分的全景图像。 版权所有（C）2009，JPO＆INPIT

    MULTIPLEXER
    2.
    发明专利
    MULTIPLEXER 失效

    公开(公告)号：JP2000028847A

    公开(公告)日：2000-01-28

    申请号：JP15729299

    申请日：1999-06-04

    Applicant: INSTRUMENTS SA

    Inventor： LAUDE JEAN-PIERRE

    IPC: G02B6/293 ,  G02B6/34

    Abstract: PROBLEM TO BE SOLVED: To obtain a small-sized multiplexer having better characteristics and lower crosstalks by providing an optical coupling means with a reflection means which enables a large Littrow angle and assures the turn back of an optical axis. SOLUTION: An incident fiber 2 and exit fiber 3 are arranged at their respective ends at the focus of a spherical mirror 4. Then, the luminous flux radiated by the incident fiber 2 is converted to parallel luminous fluxes by this mirror 4. These parallel luminous fluxes are reflected by a mirror 8 inclined at an angle a with a luminous flux incident-exit axis 10. The parallel beams are thus reflected as the parallel secondary beams having an axis 12 by the mirror 8. A diffraction grating 7 disposed at a grating supporting body 9 is applied to one of the plane flanks 13 of a branching filter and the normal of the grating plane is included in the plane formed by the incident-exit axis 10 and the normal of the mirror 8. The secondary beam 12 forms an angle β (Littrow angle) with the normal of the grating. The relatively large angle β is obtd. by turning back the parallel light beams.

    SELECTIVE OPTICAL DEVICE AND WAVELENGTH MULTIPLEXER/ DEMULTIPLEXER
    3.
    发明专利
    SELECTIVE OPTICAL DEVICE AND WAVELENGTH MULTIPLEXER/ DEMULTIPLEXER 失效

    公开(公告)号：JPH1172648A

    公开(公告)日：1999-03-16

    申请号：JP16408798

    申请日：1998-05-08

    Applicant: INSTRUMENTS SA

    Inventor： LAUDE JEAN-PIERRE

    IPC: G02B6/293 ,  G02B6/34 ,  H04J14/00 ,  H04J14/02

    Abstract: PROBLEM TO BE SOLVED: To obtain a wavelength selective optical device which includes a two-dimensional network and is expressed by a built-in function. SOLUTION: This device includes a means 11 for expanding an image spot to monochromatic light in the direction of spectral dispersion and for changing the intricate amplitude of the electromagnetic wave of a light wave according to a light filtration function. In addition, the device relating to an optical fiber wavelength multiplexer/demultiplexer including a mirror 9 and the network 6, includes the filter 11 which has the optical axis of the mirror passing through the plane of the network 6 in parallel with the line of the latter and existing near the mirror 9 in order to control the built-in function of the multiplexer/ demultiplexer.

    ELLIPTIC POLARIZATION MEASURING METHOD, ELLIPTIC POLARIMETERAND DEVICE FOR CONTROLLING FORMATION OF LAYER USING METHOD AND DEVICE THEREOF
    4.
    发明专利
    ELLIPTIC POLARIZATION MEASURING METHOD, ELLIPTIC POLARIMETERAND DEVICE FOR CONTROLLING FORMATION OF LAYER USING METHOD AND DEVICE THEREOF 失效

    公开(公告)号：JPH0915140A

    公开(公告)日：1997-01-17

    申请号：JP8041796

    申请日：1996-02-27

    Applicant: INSTRUMENTS SA

    Inventor： BERUNAARU DOREBUIRON ,  MORUTAN KIRUDEEMO ,  RANDAANU BANFUERAATO

    IPC: G01J4/00 ,  G01J4/04 ,  G01N21/21 ,  H01L21/66

    Abstract: PROBLEM TO BE SOLVED: To realize a phase modulated elliptical polarization method in which the accuracy is enhanced in measurement by solving the problem of periodic oscillation. SOLUTION: Measurements Iom , Ism and Icm are derived from a signal 50 indicative of measured intensity I(t) . At the first step 51, Fourier components S0 , S1 , S2 are calculated for a continuous and modulated pulses ω, 2ω and at the second step 52, measurements Iom , Ism and Icm are determined from the components S0 , S1 , S2 . Method of iteration 53 is applied to the measurements and initial theoretical values Is1 /Io1 and Ie1 /Io1 are derived from an input variable 55. The theoretical values obtained at Step 57 are compared with the Ism /Iom and Icm /Iom determined at Step 52. The comparison 58 requires quantization of the difference between theoretical value and measured value. When the difference is smaller than a limit value, the measurements are approximated sufficiently and a numeral 54 is provided as a physical variable for calculating the measurement. After ending the comparison 58, an estimated value 59 following to the physical variable is specified.

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