-
公开(公告)号:US12000752B2
公开(公告)日:2024-06-04
申请号:US17605051
申请日:2020-04-24
Applicant: LAMBDA-X OPHTHALMICS
Inventor: Philippe Antoine , Didier Beghuin , Luc Joannes
CPC classification number: G01M11/0228 , G01M11/0207 , G01N21/455 , G02B27/149 , G02B27/54 , G02F1/136277 , G01N2021/1765 , G01N2021/456 , G02F2203/50
Abstract: A system for measuring (200) a sample (2) by deflectometry comprising:
a source (10) for generating a light beam in a source plane (105);
an illumination module (19) for forming an illumination beam (9) comprising:
a first converging optical element (18);
a first selection optical element (16) with a first aperture (160);
reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30);
a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2);
imaging (40) and detecting means (50) for detecting an image of said sample (2).-
公开(公告)号:ES2993427T3
公开(公告)日:2024-12-30
申请号:ES21794874
申请日:2021-11-05
Applicant: LAMBDA X OPHTHALMICS
Inventor: BOUSSEMAERE LUC , ANTOINE PHILIPPE , BOUWENS ARNO , JOANNES LUC
Abstract: Método para la conversión de una medida de una lente (1) que comprende los siguientes pasos: recibir una medida experimental de lente (EXP) de la lente (1) a partir de una medida de luz de la lente (1); determinar a partir de la medida experimental de lente (EPX) un modelo digital de lente que representa la lente (1) (S1); determinar, a partir del modelo digital de lente, una medida digital de lente convertida (SIM2) que representa una medida convertida de lente de la lente (1) (S2); determinar, a partir de la medida experimental de lente (EXP1) y de la medida digital de lente convertida (SIM2), un resultado de medida (CON) para la lente (1) (S3). (Traducción automática con Google Translate, sin valor legal)
-