公开(公告)号：WO2013097215A1

公开(公告)日：2013-07-04

申请号：PCT/CN2011/085131

申请日：2011-12-31

Applicant: SAINT-GOBAIN GLASS FRANCE ,  GUO, Xiaofeng ,  LI, Huifen ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

Inventor： GUO, Xiaofeng ,  LI, Huifen ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

IPC: G01N21/958 ,  G01N21/896

CPC classification number: G01N21/8806 ,  F21K9/27 ,  F21Y2103/10 ,  F21Y2115/10 ,  G01N21/896 ,  G01N21/958 ,  G01N2021/8816 ,  G01N2201/0633 ,  G01N2201/105

Abstract: This invention relates to illumination device for providing near isotropic illumination, and particularly to an illumination system for detecting the defect in a transparent substrate and a detection system comprising the same. According to an embodiment of the invention, an illumination system is provided, which comprises: an illumination system for detecting the defect in a transparent substrate, comprising light source receptacle in bar shape; a plurality of first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and a plurality of second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle, wherein the first line of spot light sources and the second line of spot light sources are substantially arranged in a line, the first line of spot light sources and the second line of spot light sources locate in difference half of the receptacle in the longitudinal direction, the first light and the second light converge to a scan line, and the projections of the first and the second lights, which are converged at each point on the scan line, in a plane P passing the scan line and perpendicular to the transparent substrate are located at different sides of a line in the plane P, which passes the point and is perpendicular to the scan line.

Abstract translation: 本发明涉及用于提供近似各向同性照明的照明装置，特别涉及用于检测透明基板中的缺陷的照明系统和包括该照明系统的检测系统。 根据本发明的实施例，提供了一种照明系统，其包括：用于检测透明基板中的缺陷的照明系统，包括条形光源插座; 多个第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且所述第一光点光源沿着所述插座的纵向布置到第一线光源; 以及多个第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源， 其特征在于，所述第一线点光源和所述第二线点光源基本上配置成一行，所述点光源的第一线和所述第二线点光源位于所述插座的长度方向的不同的一半上， 第一光和第二光会聚到扫描线，并且在通过扫描线并垂直于透明基板的平面P中会聚在扫描线上的每一点的第一和第二光的突起是 位于平面P中的线的不同侧，该平面P通过点并且垂直于扫描线。

公开(公告)号：WO2013075331A1

公开(公告)日：2013-05-30

申请号：PCT/CN2011/082946

申请日：2011-11-25

Applicant: SAINT-GOBAIN GLASS FRANCE ,  SCHWEITZER, Jean-Philippe ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

Inventor： SCHWEITZER, Jean-Philippe ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

IPC: G01N21/896 ,  G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/896 ,  G01N21/958

Abstract: An optical inspection system comprises an image capturing unit (130), wherein a light is irradiated to an inspecting zone of a substrate (160) by a light source (110) and a first part of the light is directly deflected from the inspecting zone to the image capturing unit (130), and the image capturing unit (130) is adapt to receive the first part of the light for forming a first image in accordance with the received first part of the light; and a processing unit adapted to detect and categorize a defect located in the inspecting zone of the substrate in accordance with the formed first image, wherein the image capturing unit comprises: a lens defining a lens plane; and an imaging unit defining an image plane on which the first image is formed, wherein the lens plane is substantially unparallel with the image plane. The optical inspection system can take well-focused images for the object having complex topography and being not in a plane.

Abstract translation: 光学检查系统包括图像捕获单元（130），其中光通过光源（110）照射到基板（160）的检查区域，并且第一部分光从检查区域直接偏转到 图像拍摄单元（130）和图像拍摄单元（130）适于接收根据所接收的第一部分光的用于形成第一图像的光的第一部分; 以及处理单元，其适于根据所形成的第一图像检测和分类位于所述基板的检查区域中的缺陷，其中所述图像捕获单元包括：限定透镜平面的透镜; 以及限定其上形成有第一图像的图像平面的成像单元，其中透镜平面与图像平面基本上不平行。 光学检查系统可以对具有复杂形貌并且不在平面中的物体采取良好聚焦的图像。

公开(公告)号：WO2010097055A1

公开(公告)日：2010-09-02

申请号：PCT/CN2010/070790

申请日：2010-02-26

Applicant: SAINT-GOBAIN GLASS FRANCE ,  SCHWEITZER, Jean-Philippe ,  LI, Huifen ,  LIN, Xiaofeng ,  GUO, Feng ,  GUO, Xiaofeng

Inventor： SCHWEITZER, Jean-Philippe ,  LI, Huifen ,  LIN, Xiaofeng ,  GUO, Feng ,  GUO, Xiaofeng

IPC: G01N21/896

CPC classification number: G01N21/896 ,  G01N21/898 ,  G01N2021/8854 ,  G01N2021/8874 ,  H02S50/15

Abstract: A system and a method for detecting defects of a substrate are provided. The system comprises: a first illuminating component (140), disposed at one side of the substrate (120) and adapted to emit diffused light to the substrate (120); a first imaging component (160), disposed at the other side of the substrate (120) and adapted to scan the substrate (120) by sensing light emitted by the first illuminating component (140) and transmitted through the substrate (120), the first illuminating component (140) and the first imaging component (160) constructing a first detection channel; and a transport module (130), adapted to produce relative motion between the substrate (120), and the first illuminating component (140) and the first imaging component (160).

Abstract translation: 提供了一种用于检测基板缺陷的系统和方法。 该系统包括：第一照明部件（140），设置在基板（120）的一侧并且适于向基板（120）发射漫射光; 第一成像部件（160），设置在所述基板（120）的另一侧，并且适于通过感测由所述第一照明部件（140）发射并透过所述基板（120）的光来扫描所述基板（120），所述第一成像部件 第一照明部件（140）和构成第一检测通道的第一成像部件（160） 以及适于在所述基板（120）与所述第一照明部件（140）和所述第一成像部件（160）之间产生相对运动的运输模块（130）。

公开(公告)号：WO2015158260A8

公开(公告)日：2015-10-22

申请号：PCT/CN2015/076631

申请日：2015-04-15

Applicant: SAINT-GOBAIN GLASS FRANCE ,  ZHANG, Shuai ,  LIN, Xiaofeng ,  LI, Ping ,  SUN, Xiaowei ,  ZHAO, Xiaoyu

Inventor： ZHANG, Shuai ,  LIN, Xiaofeng ,  LI, Ping ,  SUN, Xiaowei ,  ZHAO, Xiaoyu

IPC: B29C45/14 ,  B29C45/17 ,  B29C45/76

Abstract: An injection molding apparatus for forming a gasket around an edge of a glass is provided. The injection molding apparatus includes: an injection mold die (101, 201, 301, 401, 501)； a fixing component (102), disposed inside the injection mold die and adapted for fixing the glass (105, 305, 505) inside the injection mold die (101, 201, 301, 401, 501); a detection unit (103), mounted to the injection molding apparatus and adapted for detecting an image or vibration of the glass (105, 305, 505); a determination unit (104, 204, 306, 507), coupled with the detection unit (103) and adapted for determining whether the glass breaks based on a detection result of the detection unit (103). The apparatus can determine whether the glass breaks, such that the risk of scratching the injection mold die (101, 201, 301, 401, 501) by glass breaking may be reduced. Therefore, the injection molding yield can be improved, the time for repairing the injection mold die may be reduced and a service life of the injection mold die may be prolonged.

公开(公告)号：WO2015158260A1

公开(公告)日：2015-10-22

申请号：PCT/CN2015076631

申请日：2015-04-15

Applicant: SAINT GOBAIN ,  ZHANG SHUAI ,  LIN XIAOFENG ,  LI PING ,  SUN XIAOWEI ,  ZHAO XIAOYU

Inventor： ZHANG SHUAI ,  LIN XIAOFENG ,  LI PING ,  SUN XIAOWEI ,  ZHAO XIAOYU

IPC: B29C45/14 ,  B29C45/17 ,  B29C45/76

CPC classification number: B29C45/842 ,  B29C45/14778 ,  B29C45/768 ,  B29C2945/76163 ,  B29C2945/76461 ,  B29C2945/76464 ,  B29C2945/76471 ,  B29K2709/08 ,  B29L2031/26 ,  B29L2031/265 ,  B29L2031/3052

Abstract: An injection molding apparatus for forming a gasket around an edge of a glass is provided. The injection molding apparatus includes: an injection mold die (101, 201, 301, 401, 501); a fixing component (102), disposed inside the injection mold die and adapted for fixing the glass (105, 305, 505) inside the injection mold die (101, 201, 301, 401, 501); a detection unit (103), mounted to the injection molding apparatus and adapted for detecting an image or vibration of the glass (105, 305, 505); a determination unit (104, 204, 306, 507), coupled with the detection unit (103) and adapted for determining whether the glass breaks based on a detection result of the detection unit (103). The apparatus can determine whether the glass breaks, such that the risk of scratching the injection mold die (101, 201, 301, 401, 501) by glass breaking may be reduced. Therefore, the injection molding yield can be improved, the time for repairing the injection mold die may be reduced and a service life of the injection mold die may be prolonged.

Abstract translation: 提供一种用于在玻璃的边缘周围形成垫圈的注射成型装置。 注射成型装置包括：注射模具模具（101,201,301,401,501）; 固定部件（102），其设置在所述注塑模具内部并且适于将所述玻璃（105,305,505）固定在所述注塑模具（101,201,301,401,501）内部; 检测单元（103），安装到注射成型设备并适于检测玻璃（105,305,505）的图像或振动; 确定单元（104,204,306,507），其与所述检测单元（103）耦合并且适于基于所述检测单元（103）的检测结果来确定所述玻璃是否破裂。 该装置可以确定玻璃是否断裂，从而可能减少通过玻璃破碎而刮伤注塑模具（101,201,301,401,501）的风险。 因此，可以提高注塑成品率，可以减少注塑模具的修理时间，延长注塑模具的使用寿命。

公开(公告)号：WO2013091218A1

公开(公告)日：2013-06-27

申请号：PCT/CN2011/084449

申请日：2011-12-22

Applicant: SSIG MEDICAL DEVICE CO., LTD ,  Lin, Xiaofeng

Inventor： Lin, Xiaofeng

IPC: F04B27/00 ,  F04B35/04

CPC classification number: F04B1/02 ,  F04B1/0404 ,  F04B9/045 ,  F04B17/03 ,  F04B23/06 ,  F04B27/0404 ,  F04B35/04 ,  F04B41/06

Abstract: A pump (10) includes a drive assembly (14) having a drive shaft rotatable about a drive axis (98), and an eccentric (106) coupled to the drive shaft for rotation therewith. The eccentric (106) includes a shaft portion (118) defining an eccentric axis (122) that is offset from the drive axis (98). The shaft portion (118) includes a shaft end defining a first alignment feature (124). A piston (166) is rotatably coupled to the shaft portion (118) and defines a second alignment feature (190). A cylinder (30) reciprocatingly receives the piston (166). Positioning the first alignment feature (124) in a predetermined orientation with respect to the second alignment feature (190) locates the piston in one of a top-dead-center position and a bottom-dead-center position with respect to the cylinder (30). A method for orienting a first piston (166) and a second piston (166) in a dual piston pump (10) is also provided.

Abstract translation: 泵（10）包括具有可围绕驱动轴线（98）旋转的驱动轴的驱动组件（14）和联接到驱动轴上以与其一起旋转的偏心轮（106）。 偏心轮（106）包括轴部（118），该轴部限定偏离驱动轴线（98）的偏心轴线（122）。 轴部分（118）包括限定第一对准特征（124）的轴端。 活塞（166）可旋转地联接到轴部分（118）并且限定第二对准特征（190）。 气缸（30）往复运动地容纳活塞（166）。 将第一对准特征（124）相对于第二对准特征（190）定位在预定取向中，将活塞相对于气缸（30）定位在上死点位置和下死点中心位置 ）。 还提供了一种用于将双活塞泵（10）中的第一活塞（166）和第二活塞（166）定向的方法。

公开(公告)号：WO2011011988A1

公开(公告)日：2011-02-03

申请号：PCT/CN2010/070791

申请日：2010-02-26

Applicant: SAINT-GOBAIN GLASS FRANCE ,  SCHWEITZER, Jean-Philippe ,  LI, Huifen ,  LIN, Xiaofeng ,  GUO, Xiaofeng ,  GUO, Feng ,  SUN, Xiaowei

Inventor： SCHWEITZER, Jean-Philippe ,  LI, Huifen ,  LIN, Xiaofeng ,  GUO, Xiaofeng ,  GUO, Feng ,  SUN, Xiaowei

IPC: G01N21/896

CPC classification number: G01N21/896 ,  G01N2021/8967

Abstract: A method and a system for detecting and classifying defects of a substrate are provided. The system includes: a first channel, including a first illuminating unit (210) adapted to irradiate light to a transparent or semi-transparent substrate (260) and a first imaging unit (220) adapted to take images by sensing light from the substrate (260) when the first illuminating unit (210) irradiates the light to the substrate (260); a second channel, including a second illuminating unit (210) adapted to irradiate light to the substrate (260) and a second imaging unit (230) adapted to take images by sensing light from the substrate (260) when the second illuminating unit (210) irradiates the light to the substrate (260); an image construction module (240), adapted to construct two images of the substrate (260) by using the image taken by the first imaging unit (220) and the image taken by the second imaging unit (230) respectively; and an image processing module (250), adapted to detect, when the substrate (260) has a defect, whether the defect is on the substrate (260) or in the substrate (260), based on the relationship of positions where the defect of the substrate (260) appears in the two images of the substrate (260). By using the method and the system, whether the transparent or semi-transparent substrate (260) has a defect can be detected and classified.

Abstract translation: 提供了用于检测和分类衬底的缺陷的方法和系统。 该系统包括：第一通道，包括适于将光照射到透明或半透明基板（260）的第一照明单元（210）和适于通过感测来自基板的光来拍摄图像的第一成像单元（220） 260）当所述第一照明单元（210）将光照射到所述基板（260）时; 第二通道，包括适于将光照射到衬底（260）的第二照明单元（210）和适于通过在第二照明单元（210）处感测来自衬底（260）的光来拍摄图像的第二成像单元（230） ）将光照射到基板（260）上; 图像构造模块（240），其适于通过使用由第一成像单元（220）拍摄的图像和由第二成像单元（230）拍摄的图像来构造基底（260）的两个图像; 以及图像处理模块（250），其适于基于所述缺陷的位置关系来检测所述基板（260）是否存在缺陷，所述缺陷是否在所述基板（260）上或所述基板（260）中 的衬底（260）的两个图像中出现。 通过使用该方法和系统，可以检测和分类透明或半透明基板（260）是否具有缺陷。

公开(公告)号：WO2010130226A1

公开(公告)日：2010-11-18

申请号：PCT/CN2010/072782

申请日：2010-05-14

Applicant: SAINT-GOBAIN GLASS FRANCE ,  ZHENG, Yuan ,  SCHWEITZER, Jean-Philippe ,  LIN, Xiaofeng ,  CHEN, Dazhi

Inventor： ZHENG, Yuan ,  SCHWEITZER, Jean-Philippe ,  LIN, Xiaofeng ,  CHEN, Dazhi

IPC: G01N21/896 ,  G01N21/958

CPC classification number: G01N21/896 ,  G01N21/88 ,  G01N2021/8825 ,  G06K9/00 ,  H04N7/18

Abstract: A method and system for detecting defects of a transparent substrate (120) is disclosed. The system comprises: a plurality of detection channels, each of which includes an illumination component (142, 144) for providing illumination to the substrate (120) and an imaging component (162, 164) for scanning the substrate (120) to provide image of the substrate (120); a transport module (130), for producing relative motion between the substrate (120), and the illumination components (142, 144) and the imaging components (162, 164) included in the plurality of detection channels; and a controlling module (190), which is used for controlling the illumination components (142, 144) and the imaging components (162, 164) included in the plurality of detection channels, so that at least two illumination components of the illumination components (142, 144) included in the plurality of detection channels provide illumination to the substrate (120) alternately and the imaging component (142, 144) included in any of the plurality of detection channels scans the substrate (120) when the illumination component (142, 144) included in that detection channel illuminates the substrate (120), wherein the imaging components (162, 164) included in at least two detection channels of the plurality of detection channels are the same imaging component. The method and system described by the present invention is capable of discriminating real defects from fake defects, which enables the substrate to be inspected without cleaning.

Abstract translation: 公开了一种用于检测透明基板（120）的缺陷的方法和系统。 该系统包括：多个检测通道，每个检测通道包括用于向基板（120）提供照明的照明部件（142,144）和用于扫描基板（120）以提供图像的成像部件（162,164） 的基板（120）; 传输模块（130），用于在所述多个检测通道中包括的所述基板（120）和所述照明部件（142,144）和所述成像部件（162,164）之间产生相对运动; 以及控制模块（190），其用于控制​​包括在所述多个检测通道中的所述照明部件（142,144）和所述成像部件（162,164），使得所述照明部件的至少两个照明部件 包括在多个检测通道中的多个检测通道交替地提供照明到衬底（120），并且当照明部件（142）在多个检测通道中包括的成像部件（142,144）扫描衬底（120）时， ，144），其中包括在所述多个检测通道的至少两个检测通道中的成像部件（162,164）是相同的成像部件（120），所述检测通道包括在所述检测通道中。 本发明描述的方法和系统能够区分真假缺陷和假缺陷，从而能够在不进行清洁的情况下检查基板。