Abstract:
Techniques and circuitry that support switching operations required to exchange data between memory arrays and external data pads are provided. In a write path, such switching operations may include latching in and assembling a number of bits sequentially received over a single data pad, reordering those bits based on a type of access mode (e.g., interleaved or sequential), and performing scrambling operations based on chip organization (e.g., x4, x8, or x16) a bank location being accessed. Similar operations may be performed (in reverse order) in a read path, to assemble data to be read out of a device.
Abstract:
Techniques and circuitry that support switching operations required to exchange data between memory arrays and external data pads are provided. In a write path, such switching operations may include latching in and assembling a number of bits sequentially received over a single data pad, reordering those bits based on a type of access mode (e.g., interleaved or sequential), and performing scrambling operations based on chip organization (e.g., x4, x8, or x16) a bank location being accessed. Similar operations may be performed (in reverse order) in a read path, to assemble data to be read out of a device.
Abstract:
An operating method of a clock signal generating circuit includes the following operations: transmitting a clock signal to a clock tree circuit by a voltage detector; and adjusting a frequency of the clock signal according to a voltage of the clock tree circuit so as to maintain the voltage within a voltage range.
Abstract:
A memory apparatus and a voltage control method of the memory apparatus are provided. The memory apparatus of the invention includes a synchronous circuit (102), a clock tree (104) and a memory controller (106). The synchronous circuit (102) receives a reference clock (CLKIN) and generating a clock signal (CLK). The clock tree (104) is coupled to an output end of the multiplexer (204) and assigns the clock signal (CLK) to a plurality of signal paths (108). The memory controller (106) is coupled to the synchronous circuit (102) and controls the synchronous circuit (102) to adjust a frequency of the clock signal (CLK) according to an operating mode of the memory apparatus.
Abstract:
A method for forming a semiconductor memory device with buried contacts. A substrate (100) is provided, wherein the substrate has recessed gates (118) and deep trench capacitor devices (102) therein. Protrusions (120) of the recessed gates and upper portions (104) of the deep trench capacitor devices are revealed. Spacers (124) are formed on sidewalls of the upper portions and the protrusions. Buried portions of conductive material (130) are formed in spaces between the spacers. The substrate, the spacers and the buried portions to form parallel shallow trenches are patterned to form parallel shallow trenches (132) for defining active regions. A layer of dielectric material is formed in the shallow trenches, wherein some of the buried portions serve as buried contacts.
Abstract:
An operating method of a memory device includes the following operations: detecting a first temperature of the memory device; determining a first refresh rate according to the first temperature; and refreshing the memory device by the first refresh rate. The first refresh rate is lower than a refresh rate upper threshold.
Abstract:
A method for forming a semiconductor device. A substrate (100) is provided, wherein the substrate has recessed gates (118) and deep trench capacitor devices (102) therein. Protrusions (120) of the recessed gates and upper portions of the deep trench capacitor devices are revealed. Spacers (124) are formed on sidewalls of the upper portions (104) and the protrusions. Buried portions of conductive material (134a,b) are formed in spaces between the spacers. The substrate, the spacers and the buried portions are patterned to form parallel shallow trenches (132) for defining active regions. A layer of dielectric material is formed in the shallow trenches, wherein some of the buried portions (134a) serve as buried bit line contacts. Word lines (140) are formed across the recessed gates (120), wherein at least one of the word lines comprises portions overlapping the recessed gates. At least one of the overlapped portions has a narrower width than at least one of the recessed gates.
Abstract:
The present disclosure provides a semiconductor device. The semiconductor device includes a difference-expanding device and a receiver. The difference-expanding device receives an input signal having voltage levels representing logical states, and converts the input signal to a processed signal by changing, based on the voltage levels, degrees in conduction of the difference-expanding device. The receiver receives the processed signal from the difference-expanding device, and determines the logical states of the input signal based on the processed signal.
Abstract:
The present disclosure provides a frequency-adjusting circuit comprising a temperature-sensing module, a computing module and a storage module. The temperature-sensing module is configured to measure temperatures of a plurality of DRAM chips. The storage module is coupled between the temperature-sensing module and the computing module, and is configured to store the temperatures of the plurality of DRAM chips. The computing module is coupled to the temperature-sensing module and is configured to compare the temperatures of the plurality of DRAM chips measured by the temperature-sensing module to determine a first temperature, to compare previous temperatures of the plurality of DRAM chips read from the storage module to determine a second temperature, and to compare the first temperature with the second temperature to determine a refresh frequency for the plurality of DRAM chips.