A METHOD AND PROCESS FOR DESIGN OF INTEGRATED CIRCUITS USING REGULAR GEOMETRY PATTERNS TO OBTAIN GEOMETRICALLY CONSISTENT COMPONENT FEATURES
    1.
    发明申请
    A METHOD AND PROCESS FOR DESIGN OF INTEGRATED CIRCUITS USING REGULAR GEOMETRY PATTERNS TO OBTAIN GEOMETRICALLY CONSISTENT COMPONENT FEATURES 审中-公开
    使用常规几何图案设计集成电路以获得几何一致的组件特征的方法和过程

    公开(公告)号:WO2006052738A3

    公开(公告)日:2007-10-11

    申请号:PCT/US2005039980

    申请日:2005-11-04

    CPC classification number: G06F17/5068

    Abstract: The invention provides a method and process for designing an integrated circuit based on using the results from both 1) a specific set of silicon test structure characterizations and 2) the decomposition of logic into combinations of simple logic primitives, from which a set of logic bricks are derived that can be assembled for a manufacturable-by-construction design. This implementation of logic is compatible with the lithography settings that are used for implementation of the memory blocks and other components on the integrated circuit, particularly by implementing geometrically consistent component features. The invention provides the ability to recompile a design comprised of logic and memory blocks onto a new geometry fabric to implement a set of technology-specific design changes, without requiring a complete redesign of the entire integrated circuit.

    Abstract translation: 本发明提供了一种基于使用以下结果的设计集成电路的方法和过程:1)特定的硅测试结构特征集合,以及2)将逻辑分解成简单逻辑基元的组合,从该逻辑块 是可以组装成可制造的按构造设计的。 逻辑的这种实现与用于实现集成电路上的存储器块和其他部件的光刻设置兼容,特别是通过实现几何一致的组件特征。 本发明提供了将由逻辑和存储块组成的设计重新编译到新的几何结构上以实现一组技术特定设计变化的能力,而不需要整个集成电路的完全重新设计。

    A METHOD AND PROCESS FOR DESIGN OF INTEGRATED CIRCUITS USING REGULAR GEOMETRY PATTERNS TO OBTAIN GEOMETRICALLY CONSISTENT COMPONENT FEATURES
    2.
    发明申请
    A METHOD AND PROCESS FOR DESIGN OF INTEGRATED CIRCUITS USING REGULAR GEOMETRY PATTERNS TO OBTAIN GEOMETRICALLY CONSISTENT COMPONENT FEATURES 审中-公开
    使用常规几何图案设计集成电路以获得几何一致的组件特征的方法和过程

    公开(公告)号:WO2006052738A2

    公开(公告)日:2006-05-18

    申请号:PCT/US2005/039980

    申请日:2005-11-04

    CPC classification number: G06F17/5068

    Abstract: The invention provides a method and process for designing an integrated circuit based on using the results from both 1) a specific set of silicon test structure characterizations and 2) the decomposition of logic into combinations of simple logic primitives, from which a set of logic bricks are derived that can be assembled for a manufacturable-by-construction design. This implementation of logic is compatible with the lithography settings that are used for implementation of the memory blocks and other components on the integrated circuit, particularly by implementing geometrically consistent component features. The invention provides the ability to recompile a design comprised of logic and memory blocks onto a new geometry fabric to implement a set of technology-specific design changes, without requiring a complete redesign of the entire integrated circuit.

    Abstract translation: 本发明提供了一种基于使用以下结果的设计集成电路的方法和过程:1)特定的硅测试结构特征集合,以及2)将逻辑分解成简单逻辑基元的组合,从该逻辑块 是可以组装成可制造的按构造设计的。 逻辑的这种实现与用于实现集成电路上的存储器块和其它组件的光刻设置兼容,特别是通过实现几何一致的组件特征。 本发明提供了将包括逻辑和存储器块的设计重新编译到新的几何结构上以实现一组技术特定设计变化的能力,而不需要整个集成电路的完全重新设计。

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