Maskless lithographic apparatus and methods of compensation for rotational alignment error using the same
    1.
    发明申请
    Maskless lithographic apparatus and methods of compensation for rotational alignment error using the same 审中-公开
    无掩模光刻设备和使用其的旋转对准误差的补偿方法

    公开(公告)号:US20100060874A1

    公开(公告)日:2010-03-11

    申请号:US12461798

    申请日:2009-08-25

    CPC classification number: G03F7/7085 G03F7/70291 G03F7/70508 G03F7/70558

    Abstract: A maskless lithographic apparatus may include a light source providing an exposure beam, a light modulator modulating the exposure beam according to an exposure pattern, an exposure optical system delivering the modulated exposure beam provided by the light modulator onto a substrate in a form of a beam spot array, and a control unit switching off some rows in the beam spot array in order to make exposure energy distribution uniform across the beam spot array. A method for compensating for an alignment error using a maskless lithographic apparatus may include providing an exposure beam, modulating the exposure beam according to an exposure pattern, delivering the modulated exposure beam provided by a light modulator onto a substrate in a form of a beam spot array, and switching off some rows in the beam spot array in order to make exposure energy distribution uniform across the beam spot array.

    Abstract translation: 无掩模光刻设备可以包括提供曝光光束的光源,根据曝光图案调制曝光光束的光调制器;曝光光学系统,将由光调制器提供的调制曝光光束以束的形式传送到基板上 点阵列,以及控制单元,关闭束斑阵列中的一些行,以使束光点阵列上的曝光能量分布均匀。 使用无掩模光刻设备来补偿对准误差的方法可包括提供曝光光束,根据曝光图案调制曝光光束,以光束调制器的形式将由光调制器提供的调制曝光光束传送到衬底上 阵列,并关闭光束阵列中的一些行,以使曝光能量分布在束斑阵列上均匀。

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