公开(公告)号：US09291583B2

公开(公告)日：2016-03-22

申请号：US13957803

申请日：2013-08-02

Applicant: THE COMMONWEALTH OF AUSTRALIA COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION

Inventor： Yves Leon Van Haarlem ,  James Tickner

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: An X-ray fluorescence analyzer is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyzer is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element. Furthermore, the field of view for an optical element is defined as the area in the source plane of the respective crystal component over which X-rays are able to be emitted and still efficiently be reflected by said optical element.

Abstract translation: 提供了一种X射线荧光分析仪，其包括：（1）选择产生强烈X射线束的X射线源，（2）将由X射线源产生的X射线束聚焦的第一光学元件 并选择所需能量的X射线，（3）能量分辨检测器，和（4）第二光学元件，其接收从样品中的元素发射的荧光X射线，并聚焦所述荧光物质的选定能量范围 X射线到所述能量分辨检测器上。 第一和第二光学元件中的每一个包括晶体分量。 所述X射线荧光分析装置的特征在于：（i）所述X射线源的光斑尺寸被设计为使得其大体上位于所述第一光学元件的视野内，以及（ii）所述第一光学元件将所述 由X射线源发射的X射线束对应于与第二光学元件的视野相对应的样品区域。 此外，光学元件的视野被定义为能够发射X射线并且仍然有效地被所述光学元件反射的各个晶体分量的源平面中的面积。