1.
    发明专利
    未知

    公开(公告)号:ES2038222T3

    公开(公告)日:1993-07-16

    申请号:ES88102688

    申请日:1988-02-24

    Abstract: The vacuum pump (10) includes two pairs of piston and cylinder assemblies (21, 22, 23, 24) mounted on opposite sides of a crankshaft (13) in a common plane with the gas inlets for the first and second cylinders of a first pair of piston and cylinder assemblies (21, 22) being connected to the device to be evacuated and the gas outlets thereof being connected to a common outlet (17) having a spring biased one-way valve controlling the outlet and to a passage connected to the inlet of a third cylinder in said second pair of piston and cylinder assemblies (23, 24). The gas outlet of the third cylinder (23) is connected to the inlet of the fourth cylinder (24) and the gas outlet of the fourth cylinder is connected to the common outlet through spring biased one-way valves. Each cylinder is provided with a cylinder head having a pair of one-way valves controlling inlet and outlet ports wherein the one-way valve controlling the gas inlet port acts as a torque reduction valve to reduce the amount of torque necessary to move the piston away from the cylinder head on the initial stroke of the piston. Each cylinder is provided with a liner in the form of a sleeve having an hard wear resistant oxide coating thereon and each piston is provided with a coating of filled polytetrafluorethylene for the purpose of reducing friction.

    INTERFERENCE MICROSCOPE
    5.
    发明公开
    INTERFERENCE MICROSCOPE 失效
    干扰显微镜

    公开(公告)号:EP0546071A4

    公开(公告)日:1993-08-04

    申请号:EP91916427

    申请日:1991-08-30

    CPC classification number: G01B9/0207 G01B9/02063 G01B9/02068 G01B2290/60

    Abstract: Methods and microscopes for measuring the difference(s) between at least two energy path lengths are disclosed. According to one embodiment a confocal interference microscope (100) may be employed to build up an interferogram of surface (123) of object (124) as follows. A portion of the light beam from coherent laser diode (101) is coherently guided to exit (115) and focussed into a diffraction limited spot (125) intersecting surface (123) by high quality lens (122). A portion of the scattered signal light resulting from spot (125) is collected by lens (122) and confocally injected back into exit (115) to be guided back to coupler (108). A second portion of the light beam from diode (101) is coherently guided to end (121) from whence it emerges collimated. This collimated beam termed the reference beam is partially reflected by mirror (126) through end (121) and is guided back to coupler (102) where it interferes with the signal beam. The result of the interference is detected by detector (127) and fed to computer (128). A portion of the signal light injected into fibre exit (115) is guided to detector (145) which detects the intensity level. This intensity level is fed to computer (128) and used to control scanner (130) so as to maintain the focus of spot (125) on surface (123). A portion of the reference beam reflected by mirror (126) is injected into single mode fibre (135) and guided coherently to coupler (138) where it interferes with illuminating light guided coherently from laser diode (101) and hence detected by detector (142). The resulting signal is fed to computer (128). While scanner (130) is moving the exits computer (128) keeps track of their position by monitoring the interference signal from detector (142).

    CONFOCAL MICROSCOPE
    8.
    发明公开
    CONFOCAL MICROSCOPE 失效
    CONFOCAL显微镜

    公开(公告)号:EP0427755A4

    公开(公告)日:1991-07-31

    申请号:EP89908678

    申请日:1989-08-01

    CPC classification number: G02B21/02 G02B21/0032 G02B21/0068 G02B21/18

    Abstract: A diffraction limited confocal microscope (30) includes an energy source (31) to provide focussable illuminating energy and a single mode energy guide (34) comprising a core, an energy receiver (33) and an energy exit (35). The energy guide is operatively associated with the energy source so that illuminating energy from the energy source is received by the energy receiver and coupled into the core and guided to the energy exit so as to emerge from the core at the energy exit. A first focusser (39) is operatively associated with the energy exit to focus at least a portion of the illuminating energy emerging from the core into a diffraction limited spot pattern volume having a central portion which in use intersects an objet (40). A second focusser (39) is operatively associated with the first focusser to collect outgoing energy from the volume resulting from interaction between the illuminating energy in the volume and the objet and/or resulting from transmission or reflection of illuminating energy from the volume. The microscope includes a detector (45) having an aperture and a detecting element wherein the detector is operatively associated with the second focusser whereby the second focusser images the aperture onto the central portion wherein the numerical aperture, NA, of the outgoing energy originating from the central portion focussed onto the aperture, the wavelength of the outgoing energy, μ, and the average diameter, d, of the aperture are related by the equation: NA « 0.6 x μ/d whereby the detector detects the outgoing energy.

    Abstract translation: 衍射极限共焦显微镜(30)包括提供可聚焦照明能量的能量源(31)和包括核心,能量接收器(33)和能量出口(35)的单模能量引导器(34)。 能量引导件与能量源可操作地相关联,使得来自能量源的照明能量被能量接收器接收并且耦合到核心并且被引导到能量出口从而在能量出口处从核心出现。 第一聚焦器(39)与能量出口可操作地关联,以将从核心出射的照明能量的至少一部分聚焦到具有中心部分的衍射极限点图案体积中,所述中心部分在使用中与物镜(40)相交。 第二聚焦器(39)与第一聚焦器可操作地相关联,以收集来自体积中的照明能量和物体之间的相互作用和/或来自体积的照射能量的透射或反射所导致的体积的输出能量。 该显微镜包括具有孔径和检测元件的检测器(45),其中检测器可操作地与第二聚焦器相关联,由此第二聚焦器将孔径成像到中心部分上,其中来自第二聚焦器的输出能量的数值孔径NA 中心部分聚焦到孔径上,孔径的输出能量的波长μ和平均直径d通过以下等式相关:其中检测器检测输出能量。

    ELECTROSLAG SURFACING
    9.
    发明公开
    ELECTROSLAG SURFACING 失效
    电极表面

    公开(公告)号:EP0396574A4

    公开(公告)日:1991-01-16

    申请号:EP89900008

    申请日:1988-12-02

    CPC classification number: C23C26/02 B23K25/005

    Abstract: A method and apparatus for electroslag surfacing of metal plate which utilizes a plate feeder assembly to which the plate is presented and which includes an elongate, horizontally disposed feeder table having an approach-end section and a runout-end section. The plate, with a major surface uppermost, is conveyed along the feeder table in a feeding direction from said approach-end section to said runout-end section, and is subjected to an electroslag operation at a surfacing installation located intermediate those sections to provide a cladding metal layer on that surface. At the surfacing installation, there is a flux mould arrangement under an electrode holder and feeder assembly having depending electrodes vertically in line with the interior of the mould arrangement. The plate is passed under the mould arrangement and the electrode holder and feeder assembly is vertically adjusted to bring a lower end of the electrode means into contact with the upper surface and to establish current flow. On establishing current flow, the electrodes then are raised to establishing an arc between the electrodes and the uppermost surface, with charging of flux to mould arrangement establishing a molten slag pool which overlies that surface to submerge and extinguish the arc. Alloy powder material to said mould arrangement at the interface between the slag pool and the uppermost surface and melted in said mould arrangement to clad the uppermost surface as the metal plate is conveyed under the mould arrangement.

Patent Agency Ranking