VACUUM QUALITY MEASUREMENT SYSTEM
    1.
    发明申请
    VACUUM QUALITY MEASUREMENT SYSTEM 审中-公开
    真空质量测量系统

    公开(公告)号:WO2011057201A3

    公开(公告)日:2011-08-18

    申请号:PCT/US2010055852

    申请日:2010-11-08

    CPC classification number: G01M3/226 G01M3/205 G01M3/229 G01M3/34

    Abstract: A gas analyzer for a vacuum chamber includes processing electronics configured to receive mass spectral data, receive input of total pressure in the vacuum chamber, receive external input from at least one sensor, and employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.

    Abstract translation: 用于真空腔室的气体分析器包括处理电子器件,其被配置为接收质谱数据,接收真空腔室中的总压力的输入,接收来自至少一个传感器的外部输入,并且使用质谱数据,真空腔室中的总压力 以及来自所述至少一个传感器的外部输入,以基于至少一个质量标准来计算真空质量指数。

    VACUUM QUALITY MEASUREMENT SYSTEM
    2.
    发明申请
    VACUUM QUALITY MEASUREMENT SYSTEM 审中-公开
    真空质量测量系统

    公开(公告)号:WO2011057201A2

    公开(公告)日:2011-05-12

    申请号:PCT/US2010/055852

    申请日:2010-11-08

    CPC classification number: G01M3/226 G01M3/205 G01M3/229 G01M3/34

    Abstract: A gas analyzer for a vacuum chamber includes processing electronics configured to receive mass spectral data, receive input of total pressure in the vacuum chamber, receive external input from at least one sensor, and employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.

    Abstract translation: 用于真空室的气体分析器包括处理电子器件,其被配置为接收质谱数据,接收真空室中的总压力的输入,从至少一个传感器接收外部输入,并使用质谱数据,真空室中的总压力 以及来自至少一个传感器的外部输入,以基于至少一个质量标准来计算真空质量指数。

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