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1.发明授权Electrical testing arrangement including probe having pivotable probe contact elements 失效电气测试安排，包括具有可移动探头接触元件的探头
公开(公告)号：US3559056A
公开(公告)日：1971-01-26
申请号：US3559056D
申请日：1968-01-09
Applicant: VIMM RESEARCH DEV CORP
Inventor： EASI MICHAEL D
CPC classification number: G01R1/07314 , Y10S439/912
Abstract: AN ELECTRICAL TESTING ARRANGEMENT IS PROVIDED WHICH INCLUDES A TESTING PROBE WHEREIN THE SPHERICAL BASE PORTIONS OF A SERIES OF PIVOTABLE CONTACT ELEMENTS ARE EACH RECEIVED IN A METALLIC MOUNTING CYLINDER CONTAINER A COIL SPRING PROVIDING RESILIENT SUPPORT. THE CYLINDERS THEMSELVES ARE EACH SUPPORTED WITHIN A CYLINDRICAL SPACE BY A FURTHER COIL SPRING. LEAF SPRINGS LOCATED IN THIS SPACE PROVIDE FOR LATERAL MOVEMENT OF THE CYLINDERS. A NUMBER OF PROBE GUIDES FOR SETTING OR FIXING THE POSITIONS OF THE CONTACT ELEMENTS ARE DESCRIBED.
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公开(公告)号：US3537000A
公开(公告)日：1970-10-27
申请号：US3537000D
申请日：1967-09-20
Applicant: VIMM RESEARCH DEV CORP
Inventor： EASI MICHAEL D
CPC classification number: G01R1/07357 , G01R1/073 , G01R1/07392
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