公开(公告)号：KR101035370B1

公开(公告)日：2011-05-20

申请号：KR1020100011975

申请日：2010-02-09

Applicant: (주)멕스코리아아이엔씨

Inventor： 공재연 ,  김한얼

IPC: H01J9/42 ,  H01J9/48

Abstract: PURPOSE: An electrode inspection apparatus for a cold cathode fluorescent lamp is provided to perform badness test of badness tests by automatically transferring electrodes for a fluorescent lamp. CONSTITUTION: A feeder(12) supplies outer lead line of am electrode in one direction. A rotary jig(18) successively receives electrodes by a vacuum sucker. A conveyor jig(16) connects to a circular rotary jig portion and successively receives the electrode. A compressing unit is mounted in a part of the jig portion. A microscope(20) is mounted in the upper portion of the compressing unit.

Abstract translation: 目的：提供一种用于冷阴极荧光灯的电极检查装置，用于通过自动转移用于荧光灯的电极来进行不良性测试的不良性测试。 构成：馈线（12）在一个方向上提供am电极的外引线。 旋转夹具（18）通过真空吸盘连续地接收电极。 输送机夹具（16）连接到圆形旋转夹具部分，并连续地接收电极。 压缩单元安装在夹具部分的一部分中。 显微镜（20）安装在压缩单元的上部。