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公开(公告)号：KR1020140115595A
公开(公告)日：2014-10-01
申请号：KR1020130030306
申请日：2013-03-21
Applicant: 삼성전자주식회사
CPC classification number: G01B11/2513 , G01B11/254
Abstract: One aspect of the present invention provides a three-dimensional shape measuring device including a lens unit forming images of slit beams on a plurality of subjects to be measured; a light source unit emitting the slit beams at different angles on the lens unit; an image acquisition unit acquiring the images of the slit beams formed on the subjects; and an execution processing unit generating the three-dimensional shape information of the measurement targets from the images obtained by the image acquisition unit. According to an embodiment of the present invention, a three-dimensional shape measuring device with improved efficiency of measurement and improved reliability of a measurement result can be obtained.
Abstract translation: 本发明的一个方面提供了一种三维形状测量装置，包括：透镜单元，在多个测量对象上形成狭缝光束的图像; 在所述透镜单元上以不同的角度发射所述狭缝光束的光源单元; 图像获取单元获取形成在被摄体上的狭缝光束的图像; 以及执行处理单元，从由图像获取单元获得的图像生成测量对象的三维形状信息。 根据本发明的实施例，可以获得具有提高的测量效率和提高测量结果的可靠性的三维形状测量装置。
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公开(公告)号：KR1020140111082A
公开(公告)日：2014-09-18
申请号：KR1020130023812
申请日：2013-03-06
Applicant: 삼성전자주식회사
CPC classification number: H01L24/97 , H01L2224/48091 , H01L2924/181 , H01L2924/00014 , H01L2924/00
Abstract: The present invention comprises the steps of applying a wavelength converting material layer to cover a light emitting element which is mounted on at least one package body; detecting excitation light emitted from the wavelength converting material layer and measuring color characteristics of the excitation light by irradiating the light emitted when power is applied to the light emitting element and the light of the same color characteristics on the wavelength converting material layer; determining the amount of additional wavelength conversion material layers which are necessary for the color correction of the wavelength conversion material layer based on the measured values of the color characteristics of the excitation light and the variation of the target color characteristics; and applying the additional wavelength converting material layer for the individual light emitting element on the basis of the amount of the determined wavelength converting material layer.
Abstract translation: 本发明包括以下步骤：应用波长转换材料层以覆盖安装在至少一个封装体上的发光元件; 检测从所述波长转换材料层发出的激发光，并且通过将对所述发光元件施加电力时发射的光和所述波长转换材料层上具有相同颜色特性的光照射来测量所述激发光的颜色特性; 基于激发光的颜色特性的测量值和目标色彩特性的变化来确定波长转换材料层的颜色校正所需的附加波长转换材料层的量; 并根据确定的波长转换材料层的量，对各个发光元件施加附加的波长转换材料层。
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公开(公告)号：KR1020150141221A
公开(公告)日：2015-12-18
申请号：KR1020140069234
申请日：2014-06-09
Applicant: 삼성전자주식회사
CPC classification number: G01M11/0278 , G01J1/42 , G01J2001/4252 , G01M11/0257
Abstract: 본발명의일 실시형태에따른광원모듈의불량검사방법은, 발광소자가실장되고, 상기발광소자를덮는렌즈가장착된기판을마련하는단계; 상기발광소자에전류를인가하여상기발광소자를점등하는단계; 상기발광소자가점등된상태에서상기렌즈를촬영하여이미지를획득하는단계; 상기획득한이미지로부터상기렌즈의중심으로부터의발광분포의대칭성(symmetry)을나타내는중심대칭성을연산하는단계; 및상기연산된중심대칭성을기준값과비교하여상기발광분포의불량여부를판단하는단계를포함할수 있다.
Abstract translation: 根据本发明的实施例，一种用于检查光源模块的缺陷的方法包括准备安装有发光装置和覆盖发光装置的透镜的板。 将电流施加到发光器件以接通发光器件，并且透镜在发光器件导通时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称性，将计算出的中心对称性与参考值进行比较，以确定是否发生不对称发光分布。
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Patent Agency Ranking
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公开(公告)号：KR1020170033933A
公开(公告)日：2017-03-28
申请号：KR1020150131440
申请日：2015-09-17
Applicant: 삼성전자주식회사
CPC classification number: H01L22/26 , H01L25/0753 , H01L33/486 , H01L2933/0033 , H04N3/1587 , H04N5/2253 , H04N5/2256
Abstract: 본발명의일 실시형태에따른광원모듈의제조방법은, 복수의기판을캐리어상면에놓는단계; 각기판상에복수의발광소자및 상기복수의발광소자를덮는복수의광학소자를장착하는단계; 및상기캐리어상에배치되어상기상면을따라서이동하는촬영수단을통해서상기복수의발광소자와광학소자를촬영하여상기복수의발광소자와광학소자를검사하는단계;를포함할수 있다. 상기복수의기판은각각제1방향으로연장되고, 상기제1방향에수직한제2방향을따라서간격을두고평행하게배열될수 있다. 그리고, 상기촬영수단은상기제1방향또는제2방향중 어느일방향을선택하여해당방향을따라서이동하도록선택적으로회전할수 있다.
Abstract translation: 根据本发明实施例的制造光源模块的方法包括：将多个基板放置在载体的上表面上; 在所述板上安装多个发光元件和覆盖所述多个发光元件的多个光学元件; 并且通过设置在载体上并沿着上表面移动的拍摄装置拍摄多个发光装置和光学装置，检查多个发光装置和光学装置。 多个基板中的每一个可以在第一方向上延伸并且可以沿着垂直于第一方向的第二方向平行于间隔地布置。 拍摄装置可以选择性地旋转第一方向或第二方向中的任一个以便沿着相应的方向移动。
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公开(公告)号：KR1020160056167A
公开(公告)日：2016-05-19
申请号：KR1020140156246
申请日：2014-11-11
Applicant: 삼성전자주식회사
CPC classification number: H01L22/12 , H01L33/54 , H01L33/58 , H01L2224/14 , H01L2224/16225 , H01L2933/0033 , H01L2933/0058
Abstract: 본발명은발광장치의제조방법, 발광모듈검사장비및 발광모듈의양불판단방법에관한것으로서, 기판을지지대위에배치하는단계; 발광소자를갖는발광패키지를상기기판상의목표위치에위치시키기위하여상기발광패키지를상기기판위에배치하는단계; 상기발광소자로부터광이방출되도록하기위하여상기발광패키지에에너지를인가하는단계; 및인가된상기에너지에반응하여상기발광소자로부터방출되는광을분석함으로써상기발광패키지가실제로배치된위치를결정하는단계를포함하는발광장치의제조방법이제공된다. 본발명의발광장치의제조방법, 발광모듈검사장비및 발광모듈의양불판단방법을이용하면얼룩이더 적게발생하고밝기가더 균일한발광장치를보다저렴하면서도용이하게제조할수 있는효과가있다.
Abstract translation: 本发明涉及一种制造发光器件的方法，一种用于检测发光模块的装置，以及一种确定发光模块是否满足质量要求的方法。 本发明的方法包括：将基材放置在支撑体上的步骤; 将具有发光器件的发光封装放置在所述衬底上以将所述发光封装放置在所述衬底上的目标位置的步骤; 将能量施加到发光封装以从发光器件发光的步骤; 以及通过对所施加的能量进行反应并确定实际放置发光封装的位置来分析从发光器件发射的光的步骤。 如果使用发光装置的制造方法，发光模块的检查装置以及判定发光模块是否符合本发明的质量要求的方法，则容易制造光 发光装置具有较少的污渍和更均匀的亮度，成本更低。
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公开(公告)号：KR1020130104279A
公开(公告)日：2013-09-25
申请号：KR1020120025653
申请日：2012-03-13
Applicant: 삼성전자주식회사
CPC classification number: H01L2224/45139 , H01L2224/48091 , H01L2224/48247 , H01L2224/48257 , H01L2224/48465 , H01L2924/00014 , H01L2924/00011 , H01L2924/00
Abstract: PURPOSE: A method and system for inspecting a wire of a light emitting device package are provided to accurately determine a defective wire by a distance between a reference line and a wire image which is extracted from a front image of the light emitting device package. CONSTITUTION: A photographing unit (310) photographs the front of a light emitting device package. The photographing unit outputs information about the photographed image to a control unit (330). The control unit extracts a wire image from a front image about the front of the light emitting device package. The control unit determines a defective wire by a distance between a reference line and the wire image. An output unit (350) displays the defects and the warpage of a wire as a text or an image. [Reference numerals] (310) Photographing unit; (330) Control unit; (350) Output unit
Abstract translation: 目的：提供一种用于检查发光器件封装的导线的方法和系统，用于通过基准线与从发光器件封装的正面图像提取的有线图像之间的距离精确地确定有缺陷的线。 构成：拍摄单元（310）照射发光装置包装的前部。 拍摄单元将关于拍摄图像的信息输出到控制单元（330）。 控制单元从关于发光器件封装的前部的前方图像提取有线图像。 控制单元通过参考线和线图像之间的距离来确定有缺陷的线。 输出单元（350）显示作为文本或图像的线的缺陷和翘曲。 （附图标记）（310）拍摄单元; （330）控制单元; （350）输出单元
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公开(公告)号：KR101182822B1
公开(公告)日：2012-09-13
申请号：KR1020110028209
申请日：2011-03-29
Applicant: 삼성전자주식회사
CPC classification number: G01R31/2635 , G01R31/024 , G01R31/302
Abstract: PURPOSE: A light emitting diode inspection device and method are provided to inspect electric characteristics, optical characteristics and the defect of appearance state of a light emitting diode. CONSTITUTION: A probing unit(400) comprises a table in which a light emitting diode is loaded and a probe which supplies a current to the light emitting diode. An image acquiring unit(200) obtains an image of the light emitting diode. A determining unit(300) detects whether a light emitting cell emits light or not from luminance information of the image. The determining unit determines the open/short failure of the light emitting diode. A measuring unit(100) comprises an integrating sphere(120) and a detector(110). The integrating sphere collects light emitted from the light emitting diode by being placed on the upper side of the table. The detector detects optical characteristic of the light emitting diode from the integration sphere.
Abstract translation: 目的：提供一种发光二极管检查装置和方法来检测发光二极管的电特性，光学特性和出现状态的缺陷。 构成：探测单元（400）包括其中装载有发光二极管的表和向该发光二极管提供电流的探针。 图像获取单元（200）获得发光二极管的图像。 确定单元（300）根据图像的亮度信息检测发光单元是否发光。 确定单元确定发光二极管的开/短故障。 测量单元（100）包括积分球（120）和检测器（110）。 积分球通过放置在桌子的上侧来收集从发光二极管发射的光。 检测器从积分球检测发光二极管的光学特性。
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