Abstract:
A circuit and a method for generating a control signal for a memory cell array are provided to control enable time of a bit line equalize signal regardless of disable time of a word line driving signal. A block control circuit(1100) generates a block information precharge signal with variable pulse width. A main word line driving signal generation circuit generates a main word line driving signal in response to a pulse front edge of the block information precharge signal. An equalize signal generation circuit generates a bit line equalize signal in response to the pulse back edge of the block information precharge signal.
Abstract:
본 발명은 신호선의 길이 차이에 의한 신호의 위상차를 줄이기 위한 반도체 메모리 장치에 관한 것이다. 본 발명에 따른 반도체 메모리 장치는, 세로축을 중심으로 좌우 대칭 구조를 이루는 복수개의 메모리 블록들과; 상기 메모리 블록들을 구동하는 데코더들과; 상기 데코더들에 입력되는 신호들을 발생하는 신호 발생기와; 상기 신호 발생기의 출력 신호를 상기 데코더들에 전송하도록 배치된 신호선들과; 상기 세로축을 중심으로 멀리 위치한 메모리 블록들과 가까이 위치한 메모리 블록들 사이의 상기 신호선들의 길이 차이에 의한 신호의 위상차 줄이는 지연 회로를 포함하는 것을 특징으로 한다. 본 발명에 의하면, 신호선의 길이 차이에 의한 신호의 위상차 문제 및 신호선이 길어짐으로써 발생되는 고주파 특성의 저하 문제가 해결된다.
Abstract:
PURPOSE: A semiconductor device having a member for controlling uniformly parasitic components of a bonding wire is provided to control easily the parasitic ingredients of the bonding wire without increasing a size of a chip by forming an inductor, a resistor, and a capacitor at a lower portion of a bonding pad. CONSTITUTION: A bonding pad(311) is connected to a pin(34) of a package by a bonding wire(32). An internal circuit(334) is connected to the bonding pad. An inductor(312) is formed between the bonding pad and the substrate of a lower of the bonding pad. A resistor(313) and a capacitor(314) are formed between the bonding pad and the substrate. The resistor and the capacitor are serially connected to the inductor. The inductor is formed with a metal layer.
Abstract:
PURPOSE: A semiconductor memory device having a metal layer to realign a pad is provided to embody various layouts, and to improve transmit characteristic of signals by changing resistance and capacitance of the layouts. CONSTITUTION: A semiconductor memory device is disposed on a metal layer for interconnection. The metal layer for interconnection includes the first metal line, the second metal line. Capacitance between the first and second metal line is increased by realigning the first and second metal line.
Abstract:
PURPOSE: A current sense amplifier of a semiconductor memory device is provided to reduce of a current consumption by limiting the amount of a current supplied to a sensing line with a simple circuit configuration. CONSTITUTION: A cell current control circuit(30) comprises a PMOS transistor(P20) and NMOS transistors(N20,N21), and a current mirror(32) comprises PMOS transistors(P21,P22,P23) and an NMOS transistor(N25). And a current mirror(34) comprises a PMOS transistor(P23) and NMOS transistors(N23,N24). A reference current control circuit(36) comprises a PMOS transistor(P25) and NMOS transistors(N26,N27). The amplifier also comprises an NMOS transistor(N22) and inverters(I3,I4). A voltage(VPP) applied to a dummy floating gate memory cell is a word line voltage level higher than a power supply voltage(VCC). The cell current control circuit changes a conductance of the PMOS transistor(P23) and the NMOS transistor(N22). The PMOS transistor induces a voltage between the current mirror(34) and a sensing line(24), and changes the conductance properly to the current intensity of the current mirror(34).
Abstract:
PURPOSE: A precharge control circuit and a control method thereof are provided to normally execute an active operation and a precharge operation by stopping the operation of a bit line sensing amplifier using a pulse back edge of a sub word line precharge pulse signal. CONSTITUTION: A sub word line drive control circuit(210) precharges a voltage of bit line pair and answers to a signal directing a precharge operation. The sub word line drive control circuit generates a sub word line precharge pulse signal resetting the sub word line driving signal driving the sub word line. A delay circuit(220) delays the sub word line precharge pulse signal. The delay circuit generates a block selection precharge pulse signal resetting the block selection signal. A precharge/equalizing signal generating circuit responds to the sub word line precharge pulse signal, and a pulse back edge of the block selection precharge pulse signal. The precharge/equalizing signal generating circuit(500) generates the precharge/equalization signal and precharges a voltage of a bit line pair.
Abstract:
An input/output multiplexer of a memory device is provided to compensate the difference of resistance and parasitic capacitance according to the length difference of a global input/output line by using a parallel interconnection of a MOS transistor and a global input/output line length discrimination signal. A global input/output line length discrimination signal generation part(130) generates a global input/output line length discrimination signal capable of discriminating the length of a global input/output line. A first MOS transistor(101) is installed between the global input/output line and a data input/output line, and is turned on/off according to a line selection signal applied from the outside. A second MOS transistor(103) is connected in parallel with the first MOS transistor, and is turned on/off according to the global input/output line length discrimination signal.
Abstract:
본 발명은 반도체메모리장치에 관한 것이다. 본 발명은 리드용 데이터경로와 라이트용 데이터경로 분리함으로써 다수 개의 뱅크를 갖는 반도체메모리장치에서 어느 하나의 뱅크에 데이터를 라이트하면서 동시에 다른 어느 뱅크에 저장되어 있는 데이터를 리드할 수 있는 반도체메모리장치를 개시한다. 어드레스, 뱅크어드레스, 프리디코더, 뱅크, 라이트드라이버