公开(公告)号：KR1020070066199A

公开(公告)日：2007-06-27

申请号：KR1020050127076

申请日：2005-12-21

Applicant: 삼성전자주식회사

Inventor： 정수임 ,  오원식 ,  서연주

IPC: G01N21/71

Abstract: A material inspection device is provided to inspect an abnormality of a material by inspecting the change in the component of the material according to the temperature of the material in real time. A material inspection device includes a material fixing section(300), a temperature changing section(400), a light generating section(500), and a material analyzing section(600). A material is fixed to the material fixing section. The temperature changing section receives the material fixing section to continuously change the temperature of the material. The light generating section generates an inspection light for inspecting the material. The material analyzing section analyzes the inspection light passing through the material to continuously inspect the change in the component of the material.

Abstract translation: 提供材料检查装置，通过根据材料的温度实时检查材料的成分变化来检查材料的异常。 材料检查装置包括材料固定部分（300），温度变化部分（400），发光部分（500）和材料分析部分（600）。 材料固定在材料固定部分上。 温度变化部接收材料固定部，以连续地改变材料的温度。 光产生部分产生用于检查材料的检查光。 材料分析部分分析通过材料的检查光，以连续检查材料成分的变化。