가변어퍼쳐 및 그것이 구비된 현미경
    1.
    发明授权
    가변어퍼쳐 및 그것이 구비된 현미경 有权
    可变孔和使用它的显微镜

    公开(公告)号:KR101467222B1

    公开(公告)日:2014-12-02

    申请号:KR1020120081215

    申请日:2012-07-25

    Abstract: 본발명은현미경의가변어퍼쳐및 그것이구비된현미경에관한것이다. 본발명의가변어퍼쳐는, 동력에의해구동되는제1모터를가지며, 어느한쪽은조리개와연결되어있고다른한쪽은제1모터와연결되어있으며회전운동을직선운동으로바꾸어제1모터의구동시조리개를수평방향으로전, 후진시키는동력전달기구를가지며, 소정의지점에위치된힌지를중심으로회전가능하도록되어있는직선운동수단; 및동력에의해구동되는제2모터를가지며, 외주면이직선운동수단과접촉되어있고제2모터와연결되어회전되며, 회전중심에서외주면까지의두께가원주방향을따라부분적으로달라, 회전시접촉되어있는직선운동수단이두께가다른외주면에의해밀리게되어, 상기힌지를중심으로직선운동수단이회전되도록하는캠을갖는회전운동수단;을포함하여구성된다. 본발명의가변어퍼쳐는조리개에형성된특정홀이소정의위치에놓이도록하는작업이동력에의해이루어져작업이용이하고, 작업이신속하게이루어지면서도부피를적게차지하는특징이있다.

    전기장 형성방식의 렌즈를 갖는 전자현미경
    2.
    发明公开

    公开(公告)号:KR1020140015834A

    公开(公告)日:2014-02-07

    申请号:KR1020120081216

    申请日:2012-07-25

    Abstract: The present invention relates to an electron microscope having lens with electric field method. The electron microscope of the present invention has a structure comprising a lens body with an electric beam passing hole that enables an electric beam to penetrate through, condenser lens and objective lens which collect the electric beam centrally and has a ground processing unit located symmetrically to the hole. The electron microscope of the present invention is equipped with the condenser lens and objective lens that authorizes high voltage in order to collect the electric beam, and it is performed by the electric field forming type rather than by the magnetic field forming type, so the size of the condenser lens and objective lens are minimized which further allows the size of the electron microscope smaller.

    Abstract translation: 本发明涉及具有电场法透镜的电子显微镜。 本发明的电子显微镜具有如下结构,该结构包括透镜体,该透镜体具有能够使电子束穿透的电子束通过孔,聚光透镜和物镜,其聚集电束在中心并具有地面处理单元,该地面处理单元对称地位于 孔。 本发明的电子显微镜配备了聚光透镜和物镜,其授权高电压以收集电束,并且其通过电场形成型而不是通过磁场形成型进行,因此尺寸 的聚光透镜和物镜被最小化,这进一步允许电子显微镜的尺寸更小。

    가변어퍼쳐 및 그것이 구비된 현미경
    3.
    发明公开

    公开(公告)号:KR1020140015833A

    公开(公告)日:2014-02-07

    申请号:KR1020120081215

    申请日:2012-07-25

    Abstract: The present invention relates to a variable aperture of a microscope and a microscope thereof. The variable aperture according to the present invention comprises a first motor operated by electric power, a power transmission device in which that one end of it is connected to an aperture and the other to the first motor, so that it may convert a rotational movement to a rectilinear movement which also makes the aperture to move both forward and backward once the first motor is being operated, a rectilinear movement measure which makes it rotate around a hinge located at a certain spot, a second motor driven by electric power, and a rotational movement measure quipped with a camera in which the outer surface of it is connected to the rectilinear movement measure and is rotated with the second motor so that various distances from the center of the rotational movement to the outer surface make the rectilinear movement measure to be pushed when rotating centrally to the hinge. The variable aperture according to the present invention makes the overall operation easy and it can be achieved quickly so as to occupy less volume at the same time by having the aperture to locate a certain hole so that the whole operation can be driven by electric power.

    Abstract translation: 本发明涉及一种显微镜的可变孔径及其显微镜。 根据本发明的可变孔径包括由电力操作的第一电动机,动力传递装置,其一端连接到孔口,另一端连接到第一电动机,使得其可以将旋转运动转换为 一直线运动,一旦第一马达运转,孔径一直向前和向后移动,直线运动测量使其围绕位于某一点的铰链旋转,由电力驱动的第二马达和旋转 运动测量用摄像机拍摄,其中其外表面连接到直线运动测量并且与第二电动机一起旋转,使得从旋转运动的中心到外表面的各种距离使得直线运动测量被推动 当中心转动铰链时。 根据本发明的可变孔径使得整体操作变得容易,并且可以快速实现,以便通过使孔定位某个孔同时占据较少的体积,使得整个操作可以由电力驱动。

    미세 광축조정장치
    4.
    发明公开
    미세 광축조정장치 无效
    省略

    公开(公告)号:KR1020140015832A

    公开(公告)日:2014-02-07

    申请号:KR1020120081214

    申请日:2012-07-25

    Abstract: The present invention relates to a fine optical axis adjustment device and a thermal emission module device including the same. The fine optical axis adjustment device according to the present invention comprises a left and right directional shifting means that can move thermal field emission tips, which have an electric bean emitting hole of which generated electrons pass through to be emitted as an electric beam, to the left and right directions corresponding to the x-axis on a plane; and a longitudinal direction shifting means that can move the thermal field emission tips in the front and back directions corresponding to the Y-axis. The fine optical axis adjustment device according to the present invention makes the operation of integrally matching the optical axis easier and quicker and the volume of the device is small compared with others since only the thermal field emission tips including the electric beam emitting hole is moved on the X and Y axis instead of moving the whole electric beam emitting unit. The present invention has a characteristic of being more simple and compact by implementing the left and right directional shifting means or the longitudinal direction shifting means, if the structure is composed of a bellows, an adjusting bolt, and an elastic body.

    Abstract translation: 本发明涉及一种精细的光轴调节装置和包括其的热发射模块装置。 根据本发明的精细光轴调节装置包括左右方向移动装置,其可以移动具有产生的电子通过的电子发射尖端作为电子束发射的热场发射尖端到 对应于平面上的x轴的左右方向; 以及纵向方向移动装置,其能够相对于Y轴在前后方向上移动热场发射尖端。 根据本发明的精细光轴调节装置使得与其他装置相比,使光轴更一体地匹配的操作更容易和更小,因为只有包括电子束发射孔的热场发射尖端被移动 X轴和Y轴,而不是移动整个电子束发射单元。 如果结构由波纹管,调节螺栓和弹性体构成,则本发明具有通过实施左右方向移动装置或纵向移动装置而变得更简单和紧凑的特征。

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