집적회로 테스트 소켓용 변성 폴리페닐렌옥사이드 조성물
    1.
    发明公开
    집적회로 테스트 소켓용 변성 폴리페닐렌옥사이드 조성물 有权
    用于IC测试插座的改性聚苯乙烯氧化物组合物

    公开(公告)号:KR1020120022500A

    公开(公告)日:2012-03-12

    申请号:KR1020100114518

    申请日:2010-11-17

    Abstract: PURPOSE: A modified polyphenylene oxide composition for integrated circuit test socket is provided to enhance electrical characteristic, molding processability, and profitability, thereby being used for manufacturing integrated circuit(IC) test socket. CONSTITUTION: A modified polyphenylene oxide composition for integrated circuit test socket comprises a modified polyphenylene oxide which is obtained by adding polystyrene or a polymerization derivative thereof to the polyphenylene oxide, carbon nanotubes, and acrylonitrile butadiene styrene based resin. The composition additionally includes 0.1-5 weight% of polycarbonate based on the total weight of the composition. The modified polyphenylene oxide is obtained by adding 20-60 parts by weight of polystyrene or a polymerization derivative thereof to the 100.0 parts by weight of polyphenylene oxide.

    Abstract translation: 目的:提供用于集成电路测试插座的改性聚苯醚组合物,以提高电气特性,成型加工性能和盈利能力,从而用于制造集成电路(IC)测试插座。 构成:用于集成电路测试插座的改性聚苯醚组合物包括通过将聚苯乙烯或其聚合衍生物加入到聚苯醚,碳纳米管和丙烯腈丁二烯苯乙烯基树脂中而获得的改性聚苯醚。 组合物另外包含基于组合物总重量的0.1-5重量%的聚碳酸酯。 通过在100.0重量份的聚苯醚中加入20-60重量份的聚苯乙烯或其聚合衍生物,可以得到改性聚苯醚。

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