광물질에서의 복굴절 측정 시스템 및 방법
    1.
    发明公开
    광물질에서의 복굴절 측정 시스템 및 방법 无效
    用于测量光学材料中的光纤的系统和方法

    公开(公告)号:KR1020060105048A

    公开(公告)日:2006-10-09

    申请号:KR1020067013872

    申请日:2004-11-29

    CPC classification number: G01N21/958 G01J4/04 G01N21/23

    Abstract: A system and method are described herein for determining the quality of an optical material by measuring and analyzing birefringence (e.g., stress-induced birefringence, inherent birefringence) in the optical material (e.g., glass sheet). The method is a scanning technique in which a birefringence sensor is set to a first optical state and then moved in a direction at a constant velocity over a glass sheet while first power transmission measurements are made at a high data rate. At the end of this move, the birefringence sensor is set to a second optical state and then moved at the same velocity back over the glass sheet, while second power transmission measurements are made. This procedure is repeated the same number of times as there are optical states in the birefringence sensor. A computer then calculates birefringence values using profiles of the power transmission measurements so as to determine the quality of the glass sheet.

    Abstract translation: 本文描述了通过测量和分析光学材料(例如玻璃板)中的双折射(例如,应力引起的双折射,固有双折射)来确定光学材料的质量的系统和方法。 该方法是一种扫描技术,其中双折射传感器被设置为第一光学状态,然后在以高数据速率进行第一功率传输测量的同时在玻璃板上以恒定速度的方向移动。 在该移动结束时,将双折射传感器设置为第二光学状态,然后以相同的速度返回到玻璃板上,同时进行第二次功率传输测量。 该过程重复与双折射传感器中的光学状态相同的次数。 然后,计算机使用动力传递测量的轮廓来计算双折射值,以便确定玻璃板的质量。

Patent Agency Ranking