Abstract:
A probe for measuring sheet resistance having minimized contact resistance is provided to reduce contact resistance by using one body probe instead of a general probe. A probe for measuring sheet resistance having minimized contact resistance comprises a contact part(20), a fixing part(40), a fixing tube(70), a probe fixing rod(13), a stop rod(50), a protective cover(10), and a measuring part(2). The probe(30) is inserted in the contact part. The fixing part surrounds and fixes the contact part. The fixing tube is coupled in the other side of the fixing part, and surrounds an outer circumference of the other side of the probe. In the probe fixing rod, a spring is mounted between protrusions formed in a center of the probe. The stop rod has a groove(12), and is coupled in the other side of the probe fixing rod. The protective cover is coupled in an outer circumference of the probe fixing rod, and is contacted in one side of the stop rod. The measuring part is connected to an external measuring device using a cable.
Abstract:
본 발명은 소켓과 플러그로 구성된 커넥터의 불량 여부를 파악하기 위한 것으로, 더욱 상세하게는 커넥터의 구성품인 소켓과 플러그가 연결되었을 때, 피씨비 기판 및 멀티미터를 이용하여 상기 소켓과 플러그의 접촉부분에 발생하는 접촉저항을 측정함으로써, 전기 및 전자기기를 작동하기 전에 상기 커넥터의 불량 여부를 판단하는 것이 가능한 커넥터의 접촉저항 측정용 피씨비 기판 및 이를 이용한 접촉저항 측정방법에 관한 것이다. 이를 위해, 본 발명은 일측면이 플러그 형상으로 돌출되도록 형성되어 기판이 소켓에 끼워지도록 하는 접촉부와, 릴레이를 사용해 상기 접촉부에 전기적으로 연결되며, 기판의 전면에 구비되는 릴레이제어반과, 외부로부터 전류를 인가받고,외부로 출력신호를 전달시키기 위해 타측면에 구비되는 입출력부와, 상기 접촉부,릴레이제어반 및 입출력부의 연계되는 접촉부분을 전기적으로 연결되도록 하기 위해 전도성 물질로 형성된 레이어;를 포함하여 구성된다. 커넥터, 소켓, 플러그, 접촉저항, 불량판단
Abstract:
A resonance frequency tuning apparatus of an inverter transformer is provided to maximize energy conversion from a primary part to a secondary part of the inverter transformer by varying a resonance frequency stably between a load and the inverter transformer. An inverter transformer includes a resonance condenser(Cr), a ballast capacitor(Cp) and a transformer having a primary coil(L1) and a secondary coil(L2). An external static magnetic field generation apparatus(10) performs variable control of a resonance frequency of the transformer(TRANS) by forming an external static magnetic field. A manual driving apparatus(20) makes the external static magnetic field generation apparatus approach the transformer of the inverter transformer or be separated from the transformer by being operated manually.
Abstract:
PURPOSE: A cross capacitor electrode test tube, a device and a method for measuring a dielectric constant of liquid are provided to repeatedly measure the dielectric constant of measured liquid without a measuring error by a chemical reaction between an electrode and the measured liquid and to minimize a generation of error according to a washing of the measurer. CONSTITUTION: A dielectric constant measurer(21) of a liquid dielectric comprises devices as follows. A chamber(22) has a first hole(26) on an upper plate(24). A metal cylinder(28) is inserted in the first hole(26). An electrode test tube is inserted in the metal cylinder(28) to conform a central shaft. A measuring terminal(30) is connected between electrodes to measure capacities between a first electrode(12) and a center electrode(14b) and between a third electrode and a center electrode(18b) by an external capacity measurer.
Abstract:
본 발명은 측정 대상물의 미소변위를 전기용량의 값으로 변환시키는 원리를 이용한 비접촉식 전기용량 센서로서, 종래 센서가 지니고 있는 문제점을 개선하기 위하여 4-전극형으로 구성되었다. 센서의 감지부는 중심으로부터 측정전극(L), 가드(G), 대향전극(H), 가드(G)의 4-전극이 하나의 사파이어 원판위에 형성되어 L과 H사이의 자체 전기용량을 측정함으로서 측정대상물체의 종류, 표면의 거칠기 및 경도 등의 조건에 관계없이 정확한 변위 측정이 가능하다.
Abstract:
A portable four point probe for measuring sheet resistance using dual configuration method is provided to perform accurate measurement regardless of size, shape, and measurement position of a sample. A portable four point probe is contacted on a surface of a sample. After a current is supplied to outside two pins, a voltage is measured by inside two pins. A first resistance is calculated. After a current is supplied to a first pin and a third pin of the portable four point probe, a voltage is measured in a second pin and a fourth pin. A second resistance is calculated. A sheet resistance is calculated by the first resistance and the second resistance.
Abstract:
An apparatus for measuring the thickness of a semiconductor wafer is provided to improve the exactness of a thickness measuring process by using a height controlling unit and a measurer transfer unit. An apparatus for measuring the thickness of a semiconductor wafer includes a height controlling unit, a thickness measuring unit and a measurer transfer unit. The height controlling unit(10) includes a wafer supporting part(16) for supporting stably a wafer without damage. The thickness measuring unit(30) is composed of a fixing part(35) for fixing the wafer and a digital micrometer(31) for measuring the thickness of the wafer. The measurer transfer unit includes a pulling handle(41) and a guide. The measurer transfer unit is used for moving the thickness measuring unit to and fro.
Abstract:
PURPOSE: A gas dielectric stand capacitor is provided to maintain a constant capacitance regardless of the surroundings such as a temperature, a humidity, a vibration, and an impact. CONSTITUTION: A cylindrical outer electrode structure(13) has a predetermined diameter, and a conductive material is coated on the inner periphery of the outer electrode structure(13) to form an outer electrode(14). A conductive material is coated on the outer periphery of an inner electrode structure(11) to form an inner electrode(12). The inner electrode structure(11) is installed in the outer electrode structure(13) such that it is bonded to both ends of the outer electrode structure(13). The inner electrode structure(11) is integrally bonded to the outer electrode structure(13). The capacitance is determined by the distance between the inner electrode(12) and the outer electrode(14).