公开(公告)号：KR1020040040698A

公开(公告)日：2004-05-13

申请号：KR1020020068897

申请日：2002-11-07

Applicant: 한국항공우주연구원

Inventor： 최준민 ,  김대승 ,  현범석

IPC: G01K7/02

Abstract: PURPOSE: A method for measuring the operational temperature of a heater circuit is provided to simply and easily measure the operational temperature of a heater circuit equipped with a low-temperature thermostat. CONSTITUTION: An ambient temperature of a low-temperature thermostat is lowered by using evaporation heat of a dry ice(6). Thus, power is supplied to a heater(2) so that the temperature of the heater(2) is increased. If the temperature of the heater(2) exceeds the temperature of the thermostat(3), power applied to the heater(2) is shielded so that the heater(2) is again cooled. In order to lower the temperature of a test sample, the dry ice(6) is positioned adjacent to the test sample by gripping the dry ice(6) using a gripper(7) made from plastic.

Abstract translation: 目的：提供一种用于测量加热器电路的工作温度的方法，以简单且容易地测量配备有低温恒温器的加热器电路的工作温度。 构成：使用干冰的蒸发热（6）降低低温恒温器的环境温度。 因此，向加热器（2）供电，使得加热器（2）的温度升高。 如果加热器（2）的温度超过恒温器（3）的温度，则屏蔽加热器（2）的功率，从而再次冷却加热器（2）。 为了降低测试样品的温度，使用由塑料制成的夹具（7）夹住干冰（6）将干冰（6）定位在测试样品附近。

公开(公告)号：KR1020030050315A

公开(公告)日：2003-06-25

申请号：KR1020010080728

申请日：2001-12-18

Applicant: 한국항공우주연구원

Inventor： 최준민 ,  현범석 ,  김대승

IPC: B64G7/00

Abstract: PURPOSE: A sample support of a thermal vacuum chamber is provided to reduce a testing time by quickly adjusting the temperature of a base plate of a satellite component. CONSTITUTION: An upper plate(1) of a sample support is located inside a thermal vacuum chamber. A satellite structure putting a satellite component and a thermal filler are combined through a fixing bolt by forming many fixing holes(2) in the upper plate. A sample support(20) is formed in the lower part of the upper plate. The sample support comprises a thermal exchanging pipe(9) having an inlet(3) and an outlet. Thereby, the reliable environment test is possible by realizing the same value as an actual contact heat transfer.

Abstract translation: 目的：提供热真空室的样品支架，通过快速调节卫星部件底板的温度来减少测试时间。 构成：样品支架的上板（1）位于热真空室内。 通过在上板中形成许多固定孔（2），通过固定螺栓将放置卫星部件和热填料的卫星结构组合在一起。 样品支撑件（20）形成在上板的下部。 样品支架包括具有入口（3）和出口的热交换管（9）。 因此，通过实现与实际接触热传递相同的值，可靠的环境测试是可能的。